EAST GREENBUSH, NY, United States
EAST GREENBUSH, NY, United States

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Patent
X-Ray Optical Systems, Inc | Date: 2015-06-01

An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.


An x-ray analysis system having an x-ray engine with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; a sample chamber for presenting a sample stream to the x-ray analysis focal area, the analysis focal area disposed within a sample analysis area defined within the chamber; an x-ray detection path for collecting secondary x-rays and directing the x-rays toward a detector; an x-ray transparent barrier on a wall of the chamber through which the x-rays pass; and a blocking structure partially blocking the sample analysis area, for creating sample stream turbulence in the sample analysis area and over the barrier. The blocking structure may be disposed asymmetrically about a central axis of the x-ray analysis focal area and/or the sample analysis area; and may be a rounded pin. A heating element may be used to heat the sample stream for improving flow.


Patent
X-Ray Optical Systems, Inc | Date: 2013-12-04

The invention relates to a wavelength dispersive apparatus (210) for analyzing a fluid using x-rays, comprising: means for exposing the fluid to focused x-rays to cause at least one component of the fluid to x-ray fluoresce, including: a first focusing optic for focusing the x-rays on the fluid, and at least one x-ray exposure chamber, having an exposure aperture less than about 10 mm in diameter; means for analyzing x-ray fluorescence to determine at least one characteristic of the fluid, including: at least one x-ray detector having an active area operating at a temperature greater than about 0 degrees centigrade and substantially uncooled; and a second focusing optic to collect x-ray fluorescence from the fluid, and focus said x-ray fluorescence on the detector; wherein at least one of the first or second focusing optics is a monochromating optic providing wavelength dispersion for the focused x-rays and/or the x-ray fluorescence from the sample.


Patent
X-Ray Optical Systems, Inc | Date: 2016-05-09

A mobile transport and shielding apparatus, which holds an x-ray analyzer for transport between operating sites, and also serves as a shielded, operational station for holding the x-ray analyzer during operation thereof. The x-ray analyzer is removably insertable into the apparatus and is operable either within the mobile transport and shielding apparatus, or outside of the apparatus. The apparatus may provide means to control, power, cool, and/or charge the x-ray analyzer during operation of the analyzer; and also means to transport the analyzer (e.g., a handle).


Patent
X-Ray Optical Systems, Inc | Date: 2013-10-11

An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.


An x-ray tube includes a target on which electrons impinge to form a diverging x-ray beam. The target has a surface formed from first and second target materials, each tailored to emit a respective x-ray energy profile. A first x-ray optic may be provided for directing the beam toward the sample spot, the first x-ray optic monochromating the diverging x-ray beam to a first energy from the energy emitted by the first target material; and a second x-ray optic may be provided, for directing the beam toward the sample spot, the second x-ray optic monochromating the diverging x-ray beam to a second energy from the energy emitted by the second target material. Fluorescence from the sample spot induced by the first and second monochromated energies is used to measure the concentration of at least one element in the sample, or separately measure elements in a coating and underlying substrate.


Patent
X-Ray Optical Systems, Inc | Date: 2014-11-11

A sample scanning apparatus/technique/method for a material analyzer, including moving a sample cell containing a sample over a measurement focal area of the analyzer according to a scan pattern, thereby scanning the sample over the measurement focal area in the scan pattern, and exposing multiple areas of the sample to the focal area. A sample cell rotator for rotating a sample cell is provided; along with a linear motion stage. The combined rotation and linear movement results in scanning the sample over the focal area in a scan pattern, thereby exposing multiple areas of the sample to the focal area. The sample scanning apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.


Patent
X-Ray Optical Systems, Inc | Date: 2016-05-16

An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.


Patent
X-Ray Optical Systems, Inc | Date: 2014-03-13

A sample handling apparatus/technique/method are provided for a material analyzer, including: a sample cell insert for carrying sample to and from a sample focal area of the analyzer; a removable sample carrying device for providing sample to the cell insert; and an actuator to flow sample from the carrying device to the sample cell insert. The removable sample carrying device may be a syringe, and the actuator pushes a plunger of the syringe to expel the sample to the sample cell insert. The sample cell insert may be mounted onto a sample cell, the sample cell being insertable into the analyzer for sample analysis. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.


Apparatus for detecting substantially monochromatic fluorescent x-rays in a wavelength dispersive system (110) in which substantially divergent x-rays produced by an x-ray source (112) are focused toward a sample using a focusing x-ray optic (114), comprising a semiconductor-type x-ray detector (120) having an uncooled detector active area, said active area for directly detecting said fluorescent x-rays; and means for focusing at least some of the x-ray fluorescence on the semiconductor-type x-ray detector.

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