Wuhan Xinxin Semiconductor Manufacturing Corporation

Wuhan, China

Wuhan Xinxin Semiconductor Manufacturing Corporation

Wuhan, China
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Long X.M.,Huazhong University of Science and Technology | Miao X.S.,Huazhong University of Science and Technology | Miao X.S.,Wuhan Nation Laboratory Optoelectronics | Sun J.J.,Huazhong University of Science and Technology | And 7 more authors.
Solid-State Electronics | Year: 2012

In this paper, the volume-minimized model of phase change memory (PCM) cell with Ge2Sb2Te5 (GST) material has been established to study the dynamic switching (set-to-reset) characteristic dependence on the sidewall angle. Joule heating volume, threshold current, dynamic resistance and phase transition rate of PCM cells by current pulse are all calculated. The results show that the threshold current increases with decreasing the sidewall angle and is significantly impacted by the feature size and aspect ratio. The PCM cell of 90° sidewall angle exhibits the smallest Joule heating volume, the highest RESET resistance and the fastest phase transition property. © 2011 Elsevier Ltd. All rights reserved.

Qu L.W.,Huazhong University of Science and Technology | Miao X.S.,Huazhong University of Science and Technology | Sheng J.J.,Huazhong University of Science and Technology | Li Z.,Huazhong University of Science and Technology | And 5 more authors.
Solid-State Electronics | Year: 2011

The thermal properties of a phase-change random access memory (PCRAM) cell are dominated by the phase-change recording material. The SET/RESET resistances, the minimum width of the SET/RESET pulse, the threshold voltage and the maximum temperature of PCRAM cells are impacted by the thickness of the phase-change layer. In this paper, a PCRAM cell with different Ge-Sb-Te phase-change layer thickness are fabricated, and the electrical properties of the PCRAM cells are tested. The SET/RESET properties dependence of PCRAM cells on the thickness of the phase-change layer is investigated and compared for the low-power consumption of PCRAM. © 2010 Elsevier Ltd. All rights reserved.

Luo W.,Lam Research Corp. | Ma B.S.,Lam Research Corp. | Shen F.,Lam Research Corp. | Hao Z.,Lam Research Corp. | And 6 more authors.
China Semiconductor Technology International Conference 2016, CSTIC 2016 | Year: 2016

The etching characteristics of Ta/TaN bilayer barrier films are investigated using a commercial capacitively coupled plasma (CCP) etch system. The challenge of the barrier layer etch is that the by-product is very difficult to remove even with lengthy CF4/O2 strip and ST250 (alkali solvent) wet strip. Two typical chemistry bases for barrier layer etch are studied in this paper. With the first chemistry base (C4F8 and C4F6), the dielectric layer sidewall has no etch by-product residue, but the copper surface underneath the barrier layer has barrier residue and worse pinhole. With the other chemistry base (CF4 with high flow and low pressure), the following can be achieved with CO addition: no etch by-product adhesion to the sidewall, no pinhole and barrier layer residue on copper surface underneath the barrier layer. © 2016 IEEE.

Liao Y.,Nanjing University | Ji X.,Nanjing University | Guo Q.,Wuhan Xinxin Semiconductor Manufacturing Company | Yan F.,Nanjing University
Advances in Condensed Matter Physics | Year: 2015

We examine the impact of negative bias temperature (NBT) stress on the fuctuations in ID and IG for deeply scaled pMOSFETs and fnd that the relative high NBT stress triggers IG-RTN and ID-step. Trough the analysis of the field dependence of emission constant and the carrier separation measurement, it is found that under the relative high NBT stress some traps keep charged state for very long time, as observing step-like behaviors in ID, while other traps emit charged holes to the gate side through TAT process, which originate both ID-step and ID-RTN. Copyright © 2015 Yiming Liao et al.

Zhou J.,Huazhong University of Science and Technology | Ji H.,Huazhong University of Science and Technology | Lan T.,Huazhong University of Science and Technology | Yan J.,Wuhan XinXin Semiconductor Manufacturing Corporation | And 2 more authors.
Journal of Electronic Materials | Year: 2014

Phase change random access memory (PCRAM) affords many advantages over conventional solid-state memories due to its nonvolatility, high speed, and scalability. However, high programming current to amorphize the crystalline phase through the melt-quench process of PCRAM, known as the RESET current, poses a critical challenge and has become the most significant obstacle for its widespread commercialization. In this work, an excellent negative tone resist for high resolution electron beam lithography, hydrogen silsesquioxane (HSQ), has been investigated as the insulating material which locally blocks the contact between the bottom electrode and the phase change material in PCRAM devices. Fabrications of the highly scaled HSQ nanopore arrays (as small as 16 nm) are presented. The insulating properties of the HSQ material are studied, especially under e-beam exposure plus thermal curing. Some other critical issues about the thickness adjustment of HSQ films and the influence of the PCRAM electrode on electron scattering in e-beam lithography are discussed. In addition, the HSQ material was successfully integrated into the PCRAM devices, achieving ultra-low RESET current (sub-100 μA), outstanding on/off ratios (~50), and improved endurance at tens of nanometers. © 2014, The Minerals, Metals & Materials Society.

Zhou J.,Huazhong University of Science and Technology | Chen Y.,Huazhong University of Science and Technology | Zhou W.,Huazhong University of Science and Technology | Miao X.,Huazhong University of Science and Technology | And 6 more authors.
Applied Surface Science | Year: 2013

Phase change material with superlattice-like structure (SLL) is one of the most emerging materials for phase change memory device. A rough etching profile, isotropic, and serious surface damage limit the application of the conventional lift-off process. A well controlled etching process to achieve high etch rate, smooth surface, vertical and nanometer-sized pattern for SLL is required for the mass production of the phase change memory devices. In this study, the etch rates, surface roughness and sidewall angles of SLL GeTe/Sb2Te 3 films were investigated by the inductively coupled plasma etching process with various etch parameters including gas ratio, chamber pressure, bias power and coil radio frequency (RF) power. The etch selectivity of SLL to SiO2 and to photo-resist were characterized. The X-ray photoelectron spectroscopy (XPS) of etched surfaces confirmed the etch mechanism of the SLL films in Cl2/Ar chemistry. 86 nm-sized patterns of SLL were fabricated using optimized etching parameters. In addition, an etched SLL film was integrated into a "T" type PCRAM cell, with a 50 nm feature size. This cell operated successfully and a RESET current of only 145 μA was obtained. ©2013 Elsevier B.V. All rights reserved.

Tan C.,Applied Materials | Xiong S.,Wuhan Xinxin Semiconductor Manufacturing Corporation | Zhao R.,Applied Materials | Xu Y.,Applied Materials | And 3 more authors.
ECS Transactions | Year: 2010

In this paper, a silicon CMP process has been developed inside semiconductor fabrication to reclaim bare silicon wafers for cost and time reductions. Firstly, the high level defect after CMP was encountered and mainly particle; after related polishing and cleaning processes were optimized, the defect count was much reduced but still higher than the specification; finally, the defect count was dramatically decreased and met the specification by adding a surfactant (TMAH) in polishing. The effect of surfactant on defect reduction is also discussed in this paper. ©The Electrochemical Society.

Li Y.,Wuhan University | Guo K.,Wuhan Xinxin Semiconductor Manufacturing Corporation | Du R.,Wuhan University | Li H.,Wuhan University | Yang Y.,Wuhan University
Advanced Materials Research | Year: 2011

The paper gives energy consumption indexes of government organization office buildings at the current stage, and then analyses energy-saving potential of office buildings. Further, it discusses building consumption has a correlation between the heating form of air conditioning and personnel density. Finally, the paper presents the energy consumption quota and the formulating method of using energy quota of state organ office buildings at the current stage. © (2011) Trans Tech Publications.

Ma L.-J.,Nanjing University | Ji X.-L.,Nanjing University | Chen Y.-C.,Nanjing University | Xia H.-G.,Nanjing University | And 3 more authors.
Chinese Physics Letters | Year: 2014

The recently developed four Rsdextraction methods from a single device, involving the constant-mobility method, the direct Id- Vgsmethod, the conductance method and the Y-function method, are evaluated on 32 nm n-channel metal-oxide-semiconductor field-effect transistors (nMOSFETs). It is found that Rsdachieved from the constant-mobility method exhibits the channel length independent characteristics. The L-dependent Rsdextracted from the other three methods is proven to be associated with the gate-voltage-induced mobility degradation in the extraction procedures. Based on L-dependent behaviors of Rsd, a new method is proposed for accurate series resistance extraction on deeply scaled MOSFETs. © 2014 Chinese Physical Society and IOP Publishing Ltd.

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