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Nishi-Tokyo-shi, Japan

Patent
TSUMURA & Co. | Date: 2014-06-10

Provided is a microorganism detection method which is highly versatile and applicable to both the test for the detection of specified microorganisms and the microbial enumeration test under the same test conditions for Kampo extract preparations and crude drugs containing a variety of antimicrobial substances, is able to effectively reduce the influence of antimicrobial substances in a test sample, and may detect target microorganisms with high precision. This method is a microorganism detection method in a test sample having antimicrobial activity, including a step of preparing a sample liquid containing a test sample having antimicrobial activity and a step of culturing a target microorganism in a culture medium, the method including allowing a (meth) acrylic acid ester-based synthetic adsorbent to act on the sample liquid and/or the culture medium.


Provided are a target FP preparing step, a target FP peak assigning step


Patent
Tsumura & Co. | Date: 2012-05-31

A peak assigning apparatus for assigning peaks of a FP configured by peaks and retention time points of the peaks detected from a chromatogram of a multicomponent material includes a peak pattern preparing part preparing a peak pattern for each peak of the target FP and a reference FP that comprises n+1 peaks including n peaks being present on at least one of sides located in front and in the rear of each peak in a time axis direction, and a peak assigning part specifying the peaks corresponding to each other by comparison of the peak patterns.


An evaluating apparatus includes a FP preparing part that prepares a target FP configured by peaks, retention time points and UV spectra thereof detected from a 3D chromatogram of a multicomponent drug that is an evaluation target at a specific wavelength.


An evaluating apparatus for a pattern includes a FP preparing part preparing a target FP at a specific detection wavelength from a 3D chromatogram of a multicomponent material being an evaluation target, a peak pattern preparing part preparing a peak pattern for each peak of the target reference FPs that comprises n+1 peaks including n peaks being present on at least one of sides located in front and in the rear of each peak in a time axis direction, a peak assigning part specifying the corresponding peaks by comparison of the peak patterns and UV spectra of the peaks, and an evaluating part evaluating the assigned peaks by comparison with peaks of a plurality of reference FPs.

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