Liu X.,TRUMPF Photonics |
Daykin L.,SPI Laser UK Ltd |
Li Y.,TRUMPF Photonics |
Boucke K.,TRUMPF Photonics
Proceedings - Annual Reliability and Maintainability Symposium | Year: 2017
This paper presents the model to estimate the reliability of high power diode laser system based on failure rate of each diode. The diodes' reliability is estimated from multi-cell life test with accelerated optical power and junction temperature. The system is then considered as a k-out-of-n:G load sharing system. The hypo-exponential distribution is applied to model the system level reliability. Two solutions to hypo-exponential model are introduced to compute the reliability at expected time and two examples are presented to illustrate the model. The numerical examples verify that the scaling and squaring method is more stable than exact algorithm considering numerical instability. Estimating with the hypo-exponential model, the single emitter diode laser system shows reliability higher than 0.999 at the lifetime required by customer. © 2017 IEEE.
Rauch S.,TRUMPF Laser GmbH |
Wenzel H.,Ferdinand - Braun - Institute |
Radziunas M.,Weierstrass Institute for Applied Analysis And Stochastics |
Haas M.,TRUMPF Laser GmbH |
And 2 more authors.
Applied Physics Letters | Year: 2017
Typical for broad-area laser (BAL) diodes operating in a continuous-wave mode is a narrowing of the near-field (NF) width at the output facet for high injection currents (output powers). This phenomenon increases the facet load of BALs, resulting in a reduction in the level of catastrophic optical mirror damage. In this letter, we demonstrate theoretically that thermally induced changes in the refractive index in both lateral and longitudinal directions not only cause the NF narrowing at the front facet but also a broadening of the NF at the back facet. In contrast, a sole lateral self-heating induced variation in the refractive index (commonly referred to as thermal lensing) does not result in a NF narrowing. Our theoretical findings are confirmed by measurements of the current-dependent profiles of the NF at the back and front facets of a BAL with a stripe width of 120 μm emitting at 960 nm. Furthermore, our quasi three-dimensional thermo-electro-optic simulations indicate that a longitudinally homogeneous device temperature can reduce the front-facet load while keeping the beam quality unchanged compared with the experimental results. © 2017 Author(s).
Roff R.,TRUMPF Photonics |
Negoita V.,TRUMPF Photonics |
An H.,TRUMPF Photonics |
Vethake T.,TRUMPF Photonics |
And 3 more authors.
Laser Focus World | Year: 2013
Laser diode systems with expansion- matched heat sinks provide reliability and a price-to-performance ratio that makes them suitable for pumping disk lasers and other pumping applications. Diode-pumped solid-state lasers (DPSSLs) are established tools in many industries based on their low cost of ownership, high efficiency, and high reliability. The latest advancements have enabled scaling to several tens of kilowatts continuous-wave (CW), which make a wide range of applications possible, ranging from material processing to airborne defense systems. High-power laser diode modules with power up to 12 kW CW are available for optical pumping of thin disk lasers. This family of pump modules is based on a novel platform that solves most the problems associated with traditional micro-channel cooler stacks.