Tektronix, Inc. is an American company best known for manufacturing test and measurement devices such as oscilloscopes, logic analyzers, and video and mobile test protocol equipment. In November 2007, Danaher Corporation acquired Tektronix as a subsidiary. The company received a 2007 Technology & Engineering Emmy Awards for compliance standards monitoring systems for Advanced Television Systems Committee standard and Digital Video Broadcasting transport streams. Several charities are or were associated with Tektronix, including the Tektronix Foundation and the M.J. Murdock Charitable Trust in Vancouver, Washington. Wikipedia.
Tektronix Inc. | Date: 2015-01-06
A method and system for providing information related to a social rank of a subscriber in a telecommunication network in which information is collected related to one or more subscribers from the telecommunication network. A direct relationship is determined between a subscriber and a first plurality of subscribers in the telecommunication network and an indirect relationship is determined between the subscriber and a second plurality of subscribers in the telecommunication network, wherein the subscriber and the second plurality of subscribers are members of the same social network. A social rank indicator is then generated corresponding to the subscriber based on the direct relationship between the subscriber and the first plurality of subscribers and based on the indirect relationship between the subscriber and the second plurality of subscribers.
Tektronix Inc. | Date: 2015-08-18
A signal acquisition probe stores compressed or compressed and filtered time domain data samples representing at least one of an impulse response or step response characterizing the signal acquisition probe. The compressed or compressed and filtered time domain data samples of the impulse response or the step response are provided to a signal measurement instrument for compensating the signal measurement instrument for the impulse or step response of the signal measurement instrument.
Tektronix Inc. | Date: 2015-12-18
A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21 (db), S11 (db), and distance-to-fault type measurements.
Tektronix Inc. | Date: 2015-04-29
A method for determining a correlated waveform, including acquiring a generalized waveform record with a repeating pattern, determining a possibly corrected recovered clock signal for the generalized waveform record, selecting a new sample rate that is higher than the clock rate by N time, where N is an integer greater than 1, resampling the generalized waveform so that the new samples fall precisely on two clocks instants of the recovered clock signal that define each unit interval, and on N1 additional instants equally spaced between the two clock instants of each unit interval to create a resampled waveform, and forming the correlated waveform by taking the mean values of all samples from the resampled waveform having the same offset into a pattern repeat in unit intervals or fractions thereof.
Tektronix Inc. | Date: 2015-03-30
A method for determining scattering parameters of a device under test using a real-time oscilloscope. The method includes calculating a reflection coefficient of each port of a device under test with N ports, wherein N is greater than one, based on a first voltage measured by the real-time oscilloscope when a signal is generated from a signal generator. The method also includes determining an insertion loss coefficient of each port of the device under test, including calculating the insertion loss coefficient of the port of the device under test to be measured based on a second voltage measured by the real-time oscilloscope when a signal is generated from a signal generator.