Beaverton, OR, United States
Beaverton, OR, United States

Tektronix, Inc. is an American company best known for manufacturing test and measurement devices such as oscilloscopes, logic analyzers, and video and mobile test protocol equipment. In November 2007, Danaher Corporation acquired Tektronix as a subsidiary. The company received a 2007 Technology & Engineering Emmy Awards for compliance standards monitoring systems for Advanced Television Systems Committee standard and Digital Video Broadcasting transport streams. Several charities are or were associated with Tektronix, including the Tektronix Foundation and the M.J. Murdock Charitable Trust in Vancouver, Washington. Wikipedia.


Time filter

Source Type

A method of detecting image quality in a wavelet transform-encoded image includes receiving wavelet transform-encoded image data partitioned into tiles, each tile partitioned into a number of subbands, evaluating a number of wavelets in fewer than the number of subbands, assigning a measure to each of the subbands evaluated for each tile, using the measures to determine a perceptual visual quality score for the image, and adjusting operation of the decoder based upon the perceptual visual quality score. A decoding system includes a memory to receive wavelet-transformed compressed image data having a predetermined number of subbands, and a decoder to determine a number of wavelet coefficients in a subset of the predetermined number of subbands, measure an amount of blur in the image data based upon the number of wavelet coefficients, and adjust a decoding process based upon the amount of blur.


A network monitoring system is provided that includes a processor and a memory coupled to the processor. A plurality of services provided by a network operator is identified. A plurality of Key Performance Indicators (KPIs) associated with the identified plurality of services is calculated on a per service basis. Individual services provided by the network operator are characterized based on the calculated plurality of KPIs. A root cause of service level failures for one or more of the plurality of services is identified, in response to determining that at least one of the characterized service levels does not meet predefined service level objectives for the one or more of the plurality of services.


Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.


A test and measurement system includes a signal creation tool to generate a complex-valued stimulus signal, at least one waveform generator to receive the stimulus signal and produce at least one pair of baseband signals, a test instrument to capture the at least one pair of baseband signals and produce captured baseband signals, a pre-compensation coefficients estimation block to receive the captured baseband signals, characterize the captured baseband signals and to generate pre-compensation coefficients, and a pre-compensation block to apply the pre-compensation coefficients to the complex-valued stimulus signal when there is a device under test. A method of characterizing a test system includes generating a multi-tone stimulus signal, producing at least one pair of baseband signals form the multi-tone stimulus signal, capturing the at least one pair of baseband signals with a test instrument, characterizing the at least one pair of baseband signals to generate pre-compensation coefficients, and applying the pre-compensation coefficients to signals applied to a device under test.


A test and measurement system includes a signal creation tool to generate a complex-valued stimulus signal, at least one waveform generator to receive the stimulus signal and produce at least one pair of baseband signals, a test instrument to capture the at least one pair of baseband signals and produce captured baseband signals, a pre-compensation coefficients estimation block to receive the captured baseband signals, characterize the captured baseband signals and to generate pre-compensation coefficients, and a pre-compensation block to apply the pre-compensation coefficients to the complex-valued stimulus signal when there is a device under test. A method of characterizing a test system includes generating a multi-tone stimulus signal, producing at least one pair of baseband signals form the multi-tone stimulus signal, capturing the at least one pair of baseband signals with a test instrument, characterizing the at least one pair of baseband signals to generate pre-compensation coefficients, and applying the pre-compensation coefficients to signals applied to a device under test.


A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.


Patent
Tektronix Inc. | Date: 2016-04-29

Embodiments of the present invention provide techniques and methods for improving signal-to-noise ratio (SNR) when averaging two or more data signals by finding a group delay between the signals and using it to calculate an averaged result. In one embodiment, a direct average of the signals is computed and phases are found for the direct average and each of the data signals. Phase differences are found between each signal and the direct average. The phase differences are then used to compensate the signals. Averaging the compensated signals provides a more accurate result than conventional averaging techniques. The disclosed techniques can be used for improving instrument accuracy while minimizing effects such as higher-frequency attenuation. For example, in one embodiment, the disclosed techniques may enable a real-time oscilloscope to take more accurate S parameter measurements.


Patent
Tektronix Inc. | Date: 2017-06-14

Embodiments of the present invention provide techniques and methods for improving signal-to-noise ratio (SNR) when averaging two or more data signals by finding a group delay between the signals and using it to calculate an averaged result. In one embodiment, a direct average of the signals is computed (305) and phases are found for the direct average and each of the data signals 310 and 315). Phase differences are found between each signal and the direct average (320). The phase differences are then used to compensate the signals (335).


Patent
Tektronix Inc. | Date: 2016-01-13

Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.


Patent
Tektronix Inc. | Date: 2017-07-19

Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.

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