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Obukhovets V.A.,Taganrog Institute of Technology | Orda-Zhigulina M.V.,Taganrog Institute of Technology
IEEE Antennas and Propagation Magazine | Year: 2011

The conference Radiation and Scattering of Electromagnetic waves (RSEMW'2011) took place in Taganrog and Divnomorskoe, Russia, June 27 to July 2, 2011. The RSEMW is an international conference that has been held since 2001. At the previous five RSEMW conferences, more than 500 papers were presented by specialists from 35 universities and companies, from 10 countries. © 2006 IEEE. Source


Syurik Y.V.,Taganrog Institute of Technology | Ghislandi M.G.,TU Eindhoven | Tkalya E.E.,TU Eindhoven | Paterson G.,University of Glasgow | And 3 more authors.
Macromolecular Chemistry and Physics | Year: 2012

A latex technique is used to prepare graphene/polystyrene and graphene/poly(propylene) composites with varying GR loadings. Their electrical properties and the corresponding volume organisation of GR networks are studied. Percolation thresholds for conduction are found to be about 0.9 and 0.4 wt% for GR/PS and GR/PP with maximum obtained conductivities of 12 and 0.4 S m -1 for GR loadings of 2 wt%, respectively. Investigations using SEM and electrical conductivity measurements show that for the preparation conditions used GR forms an isotropic 3D network in the PS matrix, but GR forms a 2D network in the PP matrix. The different GR network organisations are possibly forced by the different melt flow behaviour of the matrix polymers during processing and the subsequent crystallisation of PP. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Source


Alekseev A.,TU Eindhoven | Chen D.,TU Eindhoven | Tkalya E.E.,TU Eindhoven | Ghislandi M.G.,TU Eindhoven | And 4 more authors.
Advanced Functional Materials | Year: 2012

The local electrical properties of a conductive graphene/polystyrene (PS) composite sample are studied by scanning probe microscopy (SPM) applying various methods for electrical properties investigation. We show that the conductive graphene network can be separated from electrically isolated graphene sheets (GS) by analyzing the same area with electrostatic force microscopy (EFM) and conductive atomic force microscopy (C-AFM). EFM is able to detect the graphene sheets below the sample surface with the maximal depth of graphene detection up to ≈100 nm for a tip-sample potential difference of 3 V. To evaluate depth sensing capability of EFM, the novel technique based on a combination of SPM and microtomy is utilized. Such a technique provides 3D data of the GS distribution in the polymer matrix with z-resolution on the order of ≈10 nm. Finally, we introduce a new method for data correction for more precise 3D reconstruction, which takes into account the height variations. Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Source

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