Schenectady, NY, United States
Schenectady, NY, United States

Time filter

Source Type

This report studies Alpha Magnetic Spectrometer in Global market, especially in North America, Europe, China, Japan, Korea and Taiwan, focuses on top manufacturers in global market, with production, price, revenue and market share for each manufacturer, covering  Bruker Corporation  Deutsche Nanoschicht GmbH  Grid Logic  Japan Superconductor Technology, Inc  Nexans SA  SH Copper Products Co. Ltd.  SuNam Co., Ltd.  SuperPower Inc.  Western Superconducting Technologies Co., Ltd  American Superconductor Corporation Market Segment by Regions, this report splits Global into several key Regions, with production, consumption, revenue, market share and growth rate of Alpha Magnetic Spectrometer in these regions, from 2011 to 2021 (forecast), like  North America  Europe  China  Japan  Korea  Taiwan Split by product type, with production, revenue, price, market share and growth rate of each type, can be divided into  Type I  Type II  Type III Split by application, this report focuses on consumption, market share and growth rate of Alpha Magnetic Spectrometer in each application, can be divided into  Application 1  Application 2  Application 3 1 Alpha Magnetic Spectrometer Market Overview  1.1 Product Overview and Scope of Alpha Magnetic Spectrometer  1.2 Alpha Magnetic Spectrometer Segment by Type  1.2.1 Global Production Market Share of Alpha Magnetic Spectrometer by Type in 2015  1.2.2 Type I  1.2.3 Type II  1.2.4 Type III  1.3 Alpha Magnetic Spectrometer Segment by Application  1.3.1 Alpha Magnetic Spectrometer Consumption Market Share by Application in 2015  1.3.2 Application 1  1.3.3 Application 2  1.3.4 Application 3  1.4 Alpha Magnetic Spectrometer Market by Region  1.4.1 North America Status and Prospect (2011-2021)  1.4.2 Europe Status and Prospect (2011-2021)  1.4.3 China Status and Prospect (2011-2021)  1.4.4 Japan Status and Prospect (2011-2021)  1.4.5 Korea Status and Prospect (2011-2021)  1.4.6 Taiwan Status and Prospect (2011-2021)  1.5 Global Market Size (Value) of Alpha Magnetic Spectrometer (2011-2021) 2 Global Alpha Magnetic Spectrometer Market Competition by Manufacturers  2.1 Global Alpha Magnetic Spectrometer Production and Share by Manufacturers (2015 and 2016)  2.2 Global Alpha Magnetic Spectrometer Revenue and Share by Manufacturers (2015 and 2016)  2.3 Global Alpha Magnetic Spectrometer Average Price by Manufacturers (2015 and 2016)  2.4 Manufacturers Alpha Magnetic Spectrometer Manufacturing Base Distribution, Sales Area and Product Type  2.5 Alpha Magnetic Spectrometer Market Competitive Situation and Trends  2.5.1 Alpha Magnetic Spectrometer Market Concentration Rate  2.5.2 Alpha Magnetic Spectrometer Market Share of Top 3 and Top 5 Manufacturers  2.5.3 Mergers & Acquisitions, Expansion 3 Global Alpha Magnetic Spectrometer Production, Revenue (Value) by Region (2011-2016)  3.1 Global Alpha Magnetic Spectrometer Production by Region (2011-2016)  3.2 Global Alpha Magnetic Spectrometer Production Market Share by Region (2011-2016)  3.3 Global Alpha Magnetic Spectrometer Revenue (Value) and Market Share by Region (2011-2016)  3.4 Global Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2011-2016)  3.5 North America Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2011-2016)  3.6 Europe Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2011-2016)  3.7 China Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2011-2016)  3.8 Japan Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2011-2016)  3.9 Korea Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2011-2016)  3.10 Taiwan Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2011-2016) 4 Global Alpha Magnetic Spectrometer Supply (Production), Consumption, Export, Import by Regions (2011-2016)  4.1 Global Alpha Magnetic Spectrometer Consumption by Regions (2011-2016)  4.2 North America Alpha Magnetic Spectrometer Production, Consumption, Export, Import by Regions (2011-2016)  4.3 Europe Alpha Magnetic Spectrometer Production, Consumption, Export, Import by Regions (2011-2016)  4.4 China Alpha Magnetic Spectrometer Production, Consumption, Export, Import by Regions (2011-2016)  4.5 Japan Alpha Magnetic Spectrometer Production, Consumption, Export, Import by Regions (2011-2016)  4.6 Korea Alpha Magnetic Spectrometer Production, Consumption, Export, Import by Regions (2011-2016)  4.7 Taiwan Alpha Magnetic Spectrometer Production, Consumption, Export, Import by Regions (2011-2016) 7 Global Alpha Magnetic Spectrometer Manufacturers Profiles/Analysis  7.1 Bruker Corporation  7.1.1 Company Basic Information, Manufacturing Base and Its Competitors  7.1.2 Alpha Magnetic Spectrometer Product Type, Application and Specification  7.1.2.1 Type I  7.1.2.2 Type II  7.1.3 Bruker Corporation Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2015 and 2016)  7.1.4 Main Business/Business Overview  7.2 Deutsche Nanoschicht GmbH  7.2.1 Company Basic Information, Manufacturing Base and Its Competitors  7.2.2 Alpha Magnetic Spectrometer Product Type, Application and Specification  7.2.2.1 Type I  7.2.2.2 Type II  7.2.3 Deutsche Nanoschicht GmbH Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2015 and 2016)  7.2.4 Main Business/Business Overview  7.3 Grid Logic  7.3.1 Company Basic Information, Manufacturing Base and Its Competitors  7.3.2 Alpha Magnetic Spectrometer Product Type, Application and Specification  7.3.2.1 Type I  7.3.2.2 Type II  7.3.3 Grid Logic Alpha Magnetic Spectrometer Production, Revenue, Price and Gross Margin (2015 and 2016)  7.3.4 Main Business/Business Overview  7.4 Japan Superconductor Technology, Inc  7.4.1 Company Basic Information, Manufacturing Base and Its Competitors  7.4.2 Alpha Magnetic Spectrometer Product Type, Application and Specification  7.4.2.1 Type I  7.4.2.2 Type II


Patent
SuperPower Inc. and University of Houston | Date: 2013-06-12

A method and composition for doped HTS tapes having directional flux pinning and critical current.


Patent
Superpower Inc. and University of Houston | Date: 2011-06-22

A high temperature superconductor structure including: a substrate on which at least one buffer layer is deposited, a superconductor layer on the buffer layer, the superconducting layer composed of superconductor material that forms at least two substantially parallel superconductor filaments that continuously extend along the length of the substrate wherein at least two superconductor filaments are separated from each other by at least one insulating strip wherein the insulating strip continuously extends along the length of the substrate and is composed of insulating material with a resistivity greater than about 1 mcm. Also disclosed are methods of producing high temperature superconductors.


Song H.,SuperPower Inc. | Hunte F.,North Carolina State University | Schwartz J.,North Carolina State University
Acta Materialia | Year: 2012

YBa 2Cu 3O 7-x (YBCO) coated conductors are emerging as an important option for magnets for energy systems and experimental science. One of the remaining challenges for YBCO superconducting magnets is quench protection, i.e. ensuring that the YBCO is not damaged due to a fault condition. One key issue is understanding the underlying causes of degradation during a quench. Here, the microstructure of a quenched, degraded sampled is compared to that of an unquenched control sample. To facilitate microstructural analysis of the YBCO surface, the Cu stabilizer and Ag cap layer were removed by etching. Reactions between the Cu etchant and YBCO proved to be a signature of Ag/YBCO delamination. Two types of pre-existing defects were identified as initiation points of degradation. Defects on the conductor edge resulting in delaminated Ag lead to dendritic flux avalanches and high local heating, which cause further Ag delamination. This self-propagating effect results in dendritic Ag delamination, which is seen through etchant-YBCO reactions. Defects within the YBCO layer result in breaches in the protective Ag layer such that Cu etchant penetrates and reacts with the YBCO. Energy-dispersive X-ray spectroscopy analysis showed similar reactions as in the edge degradation but also showed pure Ag particles, which indicates that the local temperature was sufficient to cause localized Ag melting. © 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.


An MOCVD apparatus and process for producing multi-layer HTS-coated tapes with increased current capacity which includes multiple liquid precursor sources, each having an associated pump and vaporizer, the outlets of which feed a multiple compartment showerhead apparatus within an MOCVD reactor. The multiple compartment showerhead apparatus is located in close proximity to an associated substrate heater which together define multiple deposition sectors in a deposition zone.


Patent
Superpower Inc. | Date: 2010-09-15

A superconducting article includes first and second stacked conductor segments. The first stacked conductor segment includes first and second superconductive segments and has a nominal thickness t_(n1). The second stacked conductor segment includes third and forth superconductive segments and has a nominal thickness t_(n2). The superconducting article further includes a joint region comprising a first splice connecting the first and third superconductive segments together and a second splice connecting the second and forth superconductive segments together. The first splice is adjacent to and bridged portions of the first and third superconductive segments along at least a portion of the joint region, and the second splice is adjacent to and bridged portions of the second and forth superconductive segments along at least a portion of the joint region. The joint region has a thickness t_(jr), wherein t_(jr )is not greater than at least one of 1.8 t_(n1 )and 1.8 t_(n2).


A fault current limiting (FCL) article comprising a superconducting tape segment comprising a substrate, a buffer layer overlying the substrate, a high temperature superconducting (HTS) layer overlying the buffer layer, and a heat sink overlying the HTS layer, where the heat sink is comprised of a non-metal material, a thermal conductivity of not less than about 0.1 W/m-K at 20 C., an electrical resistivity of not less than about 1E-5 -m at 20 C., and a shunting circuit electrically connected to the superconducting tape segment.


A method for forming a superconductive article is disclosed. According to one method, a substrate is provided, the substrate having an aspect ratio of not less than about 110^(3), forming a buffer layer overlying the substrate, forming a superconductor layer overlying the buffer layer, and characterizing at least one of the substrate, the buffer layer and the superconductor layer by x-ray diffraction. In this regard, x-ray diffraction is carried out such that data are taken at multiple phi angles. Data acquisition at multiple phi angles permits robust characterization of the film or layer subject to characterization, and such data may be utilized for process control and/or quality control. Additional methods for forming superconductive articles, and for characterizing same with XRD are also disclosed.


A superconducting fault current-limiter is provided, including a superconducting element configured to resistively or inductively limit a fault current, and one or more variable-impedance shunts electrically coupled in parallel with the superconducting element. The variable-impedance shunt(s) is configured to present a first impedance during a superconducting state of the superconducting element and a second impedance during a normal resistive state of the superconducting element. The superconducting element transitions from the superconducting state to the normal resistive state responsive to the fault current, and responsive thereto, the variable-impedance shunt(s) transitions from the first to the second impedance. The second impedance of the variable-impedance shunt(s) is a lower impedance than the first impedance, which facilitates current flow through the variable-impedance shunt(s) during a recovery transition of the superconducting element from the normal resistive state to the superconducting state, and thus, facilitates recovery of the superconducting element under load.


The present invention is a high-throughput ion beam assisted deposition (IBAD) system and method of utilizing such a system that enables continuous deposition of thin films such as the buffer layers of HTS tapes. The present invention includes a spool-to-spool feed system that translates a metal substrate tape through the IBAD system as the desired buffer layers are deposited atop the translating substrate tape using an e-beam evaporator assisted by an ion beam. The system further includes a control and monitor system to monitor and regulate all necessary system parameters. The present invention facilitates deposition of a high-quality film over a large area of translating substrate.

Loading SuperPower Inc. collaborators
Loading SuperPower Inc. collaborators