Time filter

Source Type

Dobrozhan O.,Sumy State Universityrymskogo Korsakova St 2 | Opanasyuk A.,Sumy State Universityrymskogo Korsakova St 2 | Kolesnyk M.,Sumy State Universityrymskogo Korsakova St 2 | Demydenko M.,Sumy State Universityrymskogo Korsakova St 2 | Cheong H.,Sogang University35 Baekbeom ro
Physica Status Solidi (A) Applications and Materials Science | Year: 2015

Nanocrystalline ZnO films were deposited onto glass substrates in the temperature range of 473-673K using pulsed spray pyrolysis. The structural, substructural, and optical properties of the films were investigated by means of X-ray diffraction analysis, Raman scattering, and Fourier transform infrared (FTIR) spectroscopy. The effect of the substrate temperature (Ts) on the coherent scattering domain (CSD) sizes L, microstrains ε{lunate}, and microstress σ grades, and the average density of dislocations ρ in the films were estimated through the broadening of X-ray lines using the Cauchy and Gauss approximations and the threefold function convolution method. The ZnO films grown at Ts=623-673K possessed the highest values of L, and the lowest of ε{lunate}, σ, and ρ, indicating high-crystalline quality. The Raman spectra showed peaks located at 95-98, 333-336, 415, 439-442, 572, and 578-584cm-1, which were interpreted as E2low(Zn), (E2high-E2low), E1(TO), E2high(O), A1(LO) and E1(LO) phonon modes of the ZnO wurtzite phase. The FTIR spectra showed relatively weak signals at 856, 1405, and 1560cm-1, corresponding to the C-H and C-O stretching modes, in addition to the main Zn-O mode at 475cm-1, indicating a low content of precursor residues. © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Source

Discover hidden collaborations