Qin X.,State Key Laboratory of Technologies of Particle Detection and Electronics |
Qin X.,Anhui University of Science and Technology |
Liu S.-B.,State Key Laboratory of Technologies of Particle Detection and Electronics |
Liu S.-B.,Anhui University of Science and Technology |
And 2 more authors.
Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology | Year: 2012
The test result of the NINO chip which is based on the time over threshold(TOT) technique is described. The test is carried out to evaluate the possibility of applying the chip in the upgrade of BES III TOF and in the position measurement of Neutrino Position Sensitive Proportional Detector. The NINO chip is 8 channel integrated and of low noise(5.1 ps front edge jitter) which can serve high precision time measurement satisfactorily.