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Kerobyan M.,Spectralus CJSC | Gyulasaryan A.,Spectralus CJSC | Soghomonyan S.,Spectralus CJSC | Gabrielyan G.,Spectralus CJSC | Essaian S.,Spectralus Corporation
Journal of Modern Optics | Year: 2013

A method for measuring parallelism of transparent optical components with small aperture size is described. It uses a Haidinger-type laser interferometer adapted for the measurement of optical components with millimeter and sub-millimeter aperture size. The method is based on the measurement of the optical thickness variation when the plate under test is translated across a focused laser beam. Measurement results for optical parts with 0.8 mm-10 mm aperture size are presented. © 2013 Taylor & Francis.


Kerobyan M.,Spectralus CJSC | Kerobyan M.,Armenian National Academy of Sciences | Gyulasaryan A.,Spectralus CJSC | Khachikyan A.,Spectralus CJSC | And 3 more authors.
Optics Communications | Year: 2013

We present a method for the measurement of a residual reflection at the interface between two optically contacted components of microchip laser. The method is based on the analysis of the reflection of a thermally scanned three-mirror Fabry-Perot interferometer (FPI). The microchip laser under test is illuminated with focused beam of a He-Ne laser, and is operated as a scanning interferometer by variation of its temperature. Imperfect optical contact leads to small reflection at the interface, which causes an amplitude modulation of the temperature response of the FPI reflection. The modulation depth is directly related to the reflection of the interface. The reflection coefficient of the interface is found from the measured modulation depth. Measurement results for microchips with sub-millimeter aperture size are presented. Residual reflection of 0.1-0.2% is determined. © 2013 Elsevier B.V.


Trademark
Spectralus Corporation | Date: 2009-03-10

Lasers not for medical use, namely, for use as components in consumer electronic devices, for use for sighting applications and in laser-based sensors, and for use as components in electronic instrumentation; optical crystals for use in lasers not for medical use.


Patent
Spectralus Corporation | Date: 2014-05-12

A laser light source includes a thermoelectric cooling device, a composite green laser made up of an infrared wavelength pumped laser diode and a solid-state laser cavity designed for efficient nonlinear intra-cavity frequency conversion into desired wavelengths using periodically poled nonlinear crystals thermally coupled with the cooling device and a red wavelength laser diode thermally coupled with said cooling device. In this manner, the cooling device maintains a common temperature of the infrared pumped laser diode and the red laser diode over an ambient temperature range.


Essaian S.,Spectralus Corporation | Khaydarov J.,Spectralus Corporation
Optical Review | Year: 2012

We report on progress in development of the low-cost, highly efficient miniature diode-pumped solid-state (DPSS) green laser sources for pico-projectors and other consumer electronics applications with wavelength 532 nm. As Spectralus laser has monolithic microchip structure there are other green lasers with various discrete designs. We are reviewing both approaches in this paper. © 2012 The Optical Society of Japan.

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