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Syracuse, NY, United States

Rautio J.C.,Sonnet Software
IEEE Microwave Magazine | Year: 2015

Presents information on the MTT-S logo. © 2000-2012 IEEE. Source

Rautio B.,Sonnet Software | Okhmatovski V.I.,University of Manitoba | Lee J.K.,Syracuse University
Progress in Electromagnetics Research | Year: 2015

While considerable progress has been made in the realm of speed-enhanced electromagnetic (EM) solvers, these fast solvers generally achieve their results through methods that introduce additional error components by way of geometric type approximations, sparse-matrix type approximations, multilevel type decomposition of interactions, and assumptions regarding the stochastic nature of EM problems. This work introduces the O(N logN) Unified-FFT grid totalizing (UFFT-GT) method, a derivative of method of moments (MoM), which achieves fast analysis with minimal to zero reduction in accuracy relative to direct MoM solution. The method uniquely combines FFT-enhanced Matrix Fill Operations (MFO) that are calculated to machine precision with FFT-enhanced Matrix Solve Operations (MSO) that are also calculated to machine precision, for an expedient solution that does not compromise accuracy. © 2015, Electromagnetics Academy. All rights reserved. Source

Horn III A.F.,Rogers Corporation | Reynolds J.W.,Rogers Corporation | Rautio J.C.,Sonnet Software
IEEE MTT-S International Microwave Symposium Digest | Year: 2010

We experimentally show that the increase in conductor loss due to roughness is larger than the factor of two predicted by the most widely used roughness factor models. This is consistent with a recent numerical study of the effect of random roughness on conductor loss. The data also show that, for thin substrates, increasing the conductor profile substantially slows the effective velocity of propagation and also increases dispersion, independent of the composition of the dielectric material. Measurements are compared with results from a new conductor model as used in a 3-D planar EM analysis that includes an excess inductance related to the conductor profile. It is shown that this accounts quantitatively for both the insertion loss and phase constant effects. © 2010 IEEE. Source

Rautio B.J.,Syracuse University | El Sabbagh M.,Syracuse University | Rautio J.C.,Sonnet Software
Proceedings - IEEE International Conference on Ultra-Wideband | Year: 2011

A broadband methodology for measurement of uniaxial dielectric anisotropy is described. Previous work is improved with reduced measurement error, enhanced automation, and additional material testing. Additionally, permittivity variation with temperature is explored. © 2011 IEEE. Source

Rautio B.J.,Sonnet Software | Okhmatovski V.I.,University of Manitoba | Lee J.K.,Syracuse University
IEEE Antennas and Propagation Society, AP-S International Symposium (Digest) | Year: 2015

A method for estimating the suitability of GPUs for computational algorithms is presented. The method is used to estimate performance for several matrix solutions for planar method of moments simulation. © 2015 IEEE. Source

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