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Danilevich S.B.,Novosibirsk State University | Kolesnikov S.S.,Novosibirsk State University | Palchun Yu.A.,Siberian Research Institute of Metrology
Measurement Techniques

A method of analysis and checking is proposed for conformity of multiparametric measurement procedures for monitoring objects with specified requirements, based on simulation modelling of a monitoring procedure. An example is provided of substantiation of requirements for the accuracy of measurements performed during monitoring (tests). © 2011 Springer Science+Business Media, Inc. Source

Brodnikov A.F.,Russian Academy of Sciences | Cherepanov V.Y.,Siberian Research Institute of Metrology
Measurement Techniques

A procedure is proposed and experimentally verified for determining the metrological characteristics of temperature calibrators using the fixed point of indium solidification in a miniature ampoule with the aid of a multi-junction differential thermocouple. The procedure allows calibrator-reproducible temperature-value errors to be determined, along with calibrator nonuniformity and instability. © 2016, Springer Science+Business Media New York. Source

Surdu M.N.,Precision Measurement Institute SE Ukrmetrteststandard | Lameko A.L.,Precision Measurement Institute SE Ukrmetrteststandard | Panich A.V.,Precision Measurement Institute SE Ukrmetrteststandard | Abrosimov E.A.,Siberian Research Institute of Metrology | Mamonov A.A.,Siberian Research Institute of Metrology
2014 12th International Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2014 - Proceedings

There is considered the variational error correction of the basic units of ratiometric impedance meter. It is given the structure of the meter, which implements this method, implementation algorithms are described, measurement error is estimated. The results of experimental researches and basic metrological characteristics of established at the base meter MHC-1200 are given. © 2014 IEEE. Source

Surdu M.N.,All Ukraine State Science And Prod Center For Standardization | Lameko A.L.,All Ukraine State Science And Prod Center For Standardization | Semenycheva L.N.,NASU Institute of Electrodynamics | Abrosimov E.A.,Siberian Research Institute of Metrology | Mamonov A.A.,Siberian Research Institute of Metrology
Measurement Techniques

A high-precision transformer bridge for the measurement of capacitance and loss-angle tangent over wide dynamic and frequency ranges is described. The bridge construction is based on the principle of variational calibration, which enables us to exclude the effect of the error sources on the measurement results. The principal measurement error of the capacitance does not exceed 10-6. © 2013 Springer Science+Business Media New York. Source

Sheglov D.V.,Novosibirsk State University | Kosolobov S.S.,Novosibirsk State University | Fedina L.I.,RAS Semiconductor Physics Institute | Rodyakina E.E.,RAS Semiconductor Physics Institute | And 9 more authors.
Nanotechnologies in Russia

Modern lithographical methods used to create linear measures for nanometer-range dimensions and the main factors which limit the applications of such gages have been analyzed in the paper. Prospects for developing high-precision measures based on an atomically structured crystalline surface (containing monoatomic steps) whose parameters are bound to the crystallographic parameters of the crystal (traceable to the length measure) are shown. A method which can be used to create such measures based on controlling the surface morphology of monocrystalline silicon at an atomic level due to the effects of self-organization arising at the atomically clean surface as a result of annealing in ultrahigh vacuum is proposed. A description of the set of high-precision gages of vertical dimensions STEPP-IFP-1 in a size range of 0.31-31 nm with an error in the whole interval of gages of less than 0.05 nm is presented. The set of high-precision gages after carrying out state testing is included into the state registry of measuring means as measuring type no. 48115-11 (Federal Agency on Technical Regulating and Metrology order no. 6290 of October 31, 2011). © 2013 Pleiades Publishing, Ltd. Source

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