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Fushimi ku, Japan

Patent
SCREEN Holdings Co. | Date: 2015-09-15

A maximum height, that corresponds to a width of a pattern formed on a front surface of a substrate to be processed, is searched among a plurality of maximum heights each being a maximum value of a height of a pattern having a particular width when pattern collapse does not occur. Thereafter, it is determined that whether or not a height of the pattern is greater than the maximum height. In a case where the height of the pattern is greater than the maximum height, a hydrophobizing agent is supplied to the substrate such that a hydrophobized region is formed on a whole tip-side region in a lateral surface of the pattern, and a non-hydrophobized region remains on at least a portion of a root-side region in the lateral surface of the pattern. Thereafter the substrate is dried.


An upper treatment solution nozzle discharges a treatment solution at a treatment position above a substrate. A reference image and a test image are cut out from an image captured after the upper treatment solution nozzle receives an instruction to start discharging the treatment solution. The test image is an image including an area of a surface of a substrate, in which a liquid flow of the treatment solution from the upper treatment solution nozzle is to be formed. The reference image is an image of an area of the surface of the substrate except for the area in which the liquid flow of the treatment solution from the upper treatment solution nozzle is to be formed. Through the comparison between the reference image and the test image, a discharge of the treatment solution from the upper treatment solution nozzle is determined.


Patent
SCREEN Holdings Co. | Date: 2015-09-10

A substrate processing method includes the steps of cleaning a substrate in a processing tank, forming an organic solvent vapor atmosphere in a chamber, elevating the substrate to replace a rinse on a surface of the substrate with an organic solvent, draining the rinse from the processing tank, moving the substrate into the processing tank, making the surface of the substrate water-repellent, elevating the substrate and supplying an organic solvent vapor to the substrate to remove water repellent from the surface of the substrate, and drying the substrate with inert gas. The water repellent is removed above the processing tank, and thus the substrate can be dried while contamination of the substrate with particles that can be generated in the processing tank in this step is suppressed.


Patent
SCREEN Holdings Co. | Date: 2015-09-29

In a substrate processing apparatus, chemical-solution processing is performed by supplying a chemical solution to the upper surface of a substrate in a state where a top plate is located at a first relative position. Also, cleaning processing is performed by supplying a cleaning liquid to the upper surface of the substrate in a state where the top plate is located at a second relative position closer to the substrate than the first relative position is. Moreover, dry processing is performed on the substrate by rotating the substrate in a state where the top plate is located at a third relative position closer to the substrate than the second relative position is. This allows a chemical atmosphere above the substrate to be efficiently removed during the cleaning processing. Consequently, the occurrence of particles due to the chemical atmosphere above the substrate can be suppressed during the dry processing.


Patent
SCREEN Holdings Co. | Date: 2015-09-08

Provided is an inkjet printing apparatus discharging ink droplets onto a print medium to be transported successively for forming an image. The apparatus includes a print unit discharging the ink droplets onto the print medium to form the image, a heating roller disposed downstream of the print unit and winding the print medium for drying, and a downstream skew correcting device disposed downstream of the print unit and upstream of the heating roller, and correcting skew of the print medium.

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