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Terre Haute, IN, United States

Rose–Hulman Institute of Technology , formerly Rose Polytechnic Institute, is a small private college specializing in teaching engineering, mathematics and science. Its 295-acre campus is located in Terre Haute, Indiana. Wikipedia.


Bassiri-Gharb N.,Georgia Institute of Technology | Bastani Y.,Georgia Institute of Technology | Bernal A.,Rose - Hulman Institute of Technology
Chemical Society Reviews | Year: 2014

Chemical solution deposition (CSD) provides a low-cost, versatile approach for processing of thin and ultrathin ferroelectric films, as well as short and high aspect ratio ferroelectric nanostructures. This review discusses the state of the art in the processing of ferroelectric oxide thin films and nanostructures by CSD, with special emphasis on nucleation and growth phenomena. The effects of choice of precursor solution, substrate and bottom electrode stack, and thermal treatment conditions on the nucleation and growth are examined. Furthermore, methods to control ferroelectric thin film's microstructure, including phase content, texture, grain size and chemical homogeneity, are reviewed. Lastly, current CSD-based methods for processing of ferroelectric oxide nanostructures are presented with special consideration of the structural development, as well as advantages and shortcomings associated with each method. Lead zirconate-titanate, Pb(ZrxTi 1-x)O3 (PZT), and barium titanate, BaTiO3 (BT), are used throughout the discussion, as specific examples for CSD processing of perovskite ferroelectrics. This journal is © the Partner Organisations 2014. Source


Simoni M.,Rose - Hulman Institute of Technology
IEEE Transactions on Education | Year: 2011

This paper describes an initial study of using tablet PCs and interactive course software in integrated circuit (IC) design courses. A rapidly growing community is demonstrating how this technology can improve learning and retention of material by facilitating interaction between faculty and students via cognitive exercises during lectures. While numerous examples of using this technology exist, there is not much literature regarding its application to electrical engineering and IC design in particular. This paper presents examples from three different IC design courses to describe the types of cognitive activities that can be facilitated with this technology. While these examples are specific to IC design, the basic techniques are valid for any application. This study does show some initial success, which, it is hoped, will spark interest at other universities and lead to a better examination of its effectiveness through larger sample sizes. © 2011 IEEE. Source


Hewner M.,Rose - Hulman Institute of Technology
ICER 2013 - Proceedings of the 2013 ACM Conference on International Computing Education Research | Year: 2013

Students come to CS from a variety of backgrounds and with a variety of preconceptions. Some initially select CS with a very vague idea of the field they are majoring in. In this paper, I describe CS undergraduates' view of the field of Computer Science. The approach was qualitative and cognitive: I studied what students think CS is and how students reasoned about their courses and curriculum. Through the use of grounded theory in 37 qualitative interviews with students and student advisors, I extracted three different conceptions about CS found in undergraduate CS majors using Grounded Theory. Overall, students had reasonable views of CS at a high level but lacked specifics. Students had difficulty describing subfields of CS or anticipating the content of courses they selected. Copyright © 2013 ACM. Source


Prosser J.H.,University of Pennsylvania | Brugarolas T.,University of Pennsylvania | Lee S.,University of Pennsylvania | Nolte A.J.,Rose - Hulman Institute of Technology | Lee D.,University of Pennsylvania
Nano Letters | Year: 2012

A new method utilizing subsequent depositions of thin crack-free nanoparticle layers is demonstrated to avoid the formation of cracks within silica nanoparticle films. Using this method, films can be assembled with thicknesses exceeding the critical cracking values. Explanation of this observed phenomenon is hypothesized to mainly arise from chemical bond formation between neighboring silica nanoparticles. Application of this method for fabricating crack-free functional structures is demonstrated by producing crack-free Bragg reflectors that exhibit structural color. © 2012 American Chemical Society. Source


Chung J.Y.,U.S. National Institute of Standards and Technology | Nolte A.J.,U.S. National Institute of Standards and Technology | Nolte A.J.,Rose - Hulman Institute of Technology | Stafford C.M.,U.S. National Institute of Standards and Technology
Advanced Materials | Year: 2011

Surface instabilities in soft matter have been the subject of increasingly innovative research aimed at better understanding the physics of their formation and their utility in patterning, organizing, and measuring materials properties on the micro and nanoscale. The focus of this Review is on a type of instability pattern known as surface wrinkling, covering the general concepts of this phenomenon and several recent applications involving the measurement of thin-film properties. The ability of surface wrinkling to yield new insights into particularly challenging materials systems such as ultrathin films, polymer brushes, polyelectrolyte multilayer assemblies, ultrasoft materials, and nanoscale structured materials is highlighted. A perspective on the future directions of this maturing field, including the prospects for advanced thin-film metrology methods, facile surface patterning, and the control of topology-sensitive phenomena, such as wetting and adhesion, is also presented. Wrinkling instabilities have enabled new thin-film measurement strategies and are energizing research efforts to pattern and control surfaces in unique and powerful ways. Recent work in the field is reviewed, focusing on how instability-based techniques can meet future metrological challenges and provide low-cost and straightforward approaches to active and on-demand management of material properties. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Source

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