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Auburn Hills, MI, United States

Trademark
Rigaku Innovative Technologies Inc. | Date: 2011-02-22

x-ray optical devices, namely, x-ray reflectors, x-ray lenses, x-ray diffractors, x-ray multilayer reflection and defraction surfaces, x-ray crystal reflection and defraction surfaces, x-ray diffractometers, x-ray analysers, and x-ray spectroscopy equipment comprised of an x-ray source, a sample stage, optics, and an x-ray detector, x-ray sources comprised of an x-ray source tube, optics, and collection optics, and kirkpatrick-baez lens system comprised of two or more multilayer reflecting lens elements not for medical use.


Trademark
Rigaku Innovative Technologies Inc. | Date: 2010-08-31

X-ray optical devices, namely, x-ray reflectors, x-ray lenses, x-ray diffractors, x-ray multilayer reflection and defraction surfaces, x-ray crystal reflection and defraction surfaces, and x-ray analysers, x-ray sources comprised of an x-ray source tube, optics, and collection optics, and kirkpatrick-baez lens system comprised of two or more multilayer reflecting lens elements not for medical use.


Patent
Rigaku Innovative Technologies Inc. | Date: 2010-06-25

An x-ray optical system includes a multiple corner optic assembly including an adjustable aperture assembly located in close proximity to the optic assembly. The adjustable aperture assembly enables a user to easily and effectively adjust the convergence of an incident beam of x-rays or the optic focal spot size. The adjustable aperture assembly may further enable a user to condition x-rays of one wavelength and block x-rays of another wavelength and thereby reduce the amount of background radiation exhibited from x-rays of more than one wavelength.


Patent
Rigaku Innovative Technologies Inc. | Date: 2010-02-03

A multi-beam x-ray system includes an x-ray source which emits x-rays and a housing with a first part and a second part. The second part is moveable relative to the first part and includes a plurality of optics of different performance characteristics. Each optic, through the movement of the second part relative to the first part, is positioned to a working position so that the optic receives the x-rays from the x-ray source and directs the x-rays with the desired performance attributes to a desired location.


Patent
Rigaku Innovative Technologies Inc. | Date: 2013-06-07

A system for analyzing a sample is provided. The system includes a beam selection device for selecting between a one-dimensional operation mode for providing a one-dimensional x-ray beam to the sample and a two-dimensional operation mode for providing a two-dimensional x-ray beam to the sample.

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