Tokyo, Japan
Tokyo, Japan

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First and second multi-pair thermocouples (21, 22) are formed on the upper surface of a heat-sensitive member (10), and a thermally uniformizing member (30) is adhesively attached to a base portion (11) of the heat-sensitive member (10). The thermally uniformizing member (30) is formed of a heat-resistant and electrically insulating material having a higher thermal conductivity than the heat-sensitive member (10) and a linear expansion coefficient approximate to the linear expansion coefficient of the heat-sensitive member (10). For example, the heat-sensitive member (10) is formed of mullite, and the thermally uniformizing member (30) is formed of aluminum nitride, whereby damage caused by thermal expansion can be prevented and at the same time the base portion (11) of the heat-sensitive member (10) can be thermally uniformalized.


Provided is an operation guide system for an X-ray analysis, including: a sample information acquisition portion for acquiring sample information on a sample to be measured for a predetermined analysis purpose with an X-ray measuring unit; a measurement condition acquisition portion for acquiring a plurality of measurement conditions different from one another; a virtual result acquisition portion for subjecting the sample information to simulations respectively based on the plurality of measurement conditions, to thereby acquire a plurality of virtual measurement results of measurements for the predetermined analysis purpose; and a comparison result output portion for outputting, as comparison results, at least two virtual measurement results among the plurality of virtual measurement results and at least two of the plurality of measurement conditions respectively corresponding to the at least two virtual measurement results.


Patent
Rigaku Corporation | Date: 2016-09-08

Provided is an X-ray small angle optical system, which easily achieves a desired angular resolution, including: an X-ray source having a microfocus; a multilayer mirror having an elliptical reflection surface, and being configured to collect X-rays emitted from the X-ray source and to irradiate a sample; and an X-ray detector configured to detect scattered X-rays generated from the sample, in which the elliptical reflection surface of the multilayer mirror has a focal point A and a focal point B, in which the X-ray source is arranged such that the microfocus includes the focal point A, and in which the X-ray detector is arranged on the multilayer mirror side of the focal point B.


Patent
Rigaku Corporation | Date: 2016-08-10

A stress analysis apparatus capable of improving the accuracy of a stress value, a method, and a program are provided. A stress analysis apparatus 100 that calculates a residual stress of a sample S includes an analysis unit configured to calculate an error as one of solutions by using an equation including an error term and prescribing a relationship between stress and strain with using measured values by diffracted X-rays with respect to a plurality of scattering vectors and a provisional value when the stress in the direction perpendicular to the surface of the sample S is constant, and a provisional value correction unit configured to correct the provisional value by the calculated error, and the analysis unit and the correction unit repeat the calculation of the error and the correction of the provisional value.


Patent
Rigaku Corporation | Date: 2016-06-29

Provided are an X-ray generator capable of suppressing effects of a fluctuation in a disturbance magnetic field and an adjustment method therefor. The X-ray generator includes: an electron-beam generating unit configured to emit an electron beam; an electron target onto which the electron beam is radiated to generate an X-ray; an electron-beam adjusting unit, which is arranged between the electron-beam generating unit and the electron target, and is configured to adjust the electron beam emitted from the electron-beam generating unit; an electron-beam deflecting unit, which is arranged between the electron-beam adjusting unit and the electron target, and is configured to deflect the electron beam to be radiated onto the electron target; and a magnetic sensor arranged in a vicinity of a region of the electron target, onto which the electron beam is radiated, so as to be away from the electron beam.


Patent
Rigaku Corporation | Date: 2016-04-20

Provided are an X-ray data processing apparatus and a method and a program therefor which can eliminate the influence of the phenomenon that the statistical variation of a count value after distribution is estimated differently from that at another position and can prevent the influence of correction from remaining. An X-ray data processing apparatus 200 that corrects the count value of X-ray intensity detected by a pixel array type detector includes a storage unit 220 to store a correspondence relationship of the shape and the position of a virtual pixel with respect to the shape and the position of an actual pixel, and a distribution unit 260 to distribute the count value of the actual pixel to the virtual pixel using a correspondence relationship in which randomness is provided to the stored correspondence relationship, and outputs the count value distributed to the virtual pixel as a correction result.


Patent
Rigaku Corporation | Date: 2016-06-09

The X-ray data processing apparatus to estimate a true value from an X-ray count value detected by the pixel array X-ray detector of a photon counting system includes a management unit 210 to receive and manage a detection value for each detection part, an effective area ratio calculation unit 230 to calculate a ratio of a detection ability under the influence of the charge share to an original detection ability in the detection part as an effective area ratio of the detection part using data regarding the detection part and data regarding an X-ray source and a detection energy threshold value, and a correction unit 250 to correct the managed count value using the calculated effective area ratio to estimate a true value.


Patent
Rigaku Corporation | Date: 2016-03-15

Provided are a CT-image processing apparatus and a method which can remove noise caused by one of a heartbeat and a breathing beat and extract only an accurate periodic motion by the other one. A CT-image processing apparatus 5 that processes projection data in which an animal is captured as a subject at each time by an X-ray CT apparatus includes a breathing beat threshold specification unit 36a to specify a lower limit of a breathing beat frequency from a feature amount waveform within a ROI for breathing beat synchronization in a series of projection data, a heartbeat threshold specification unit 37a to specify a lower limit of a heartbeat frequency from a feature amount waveform within a ROI for heartbeat synchronization in the series of projection data, a breathing beat extraction unit 36b to extract a breathing beat waveform using a band-pass filter defined by the lower limit of the breathing beat frequency and the lower limit of the heartbeat frequency.


Patent
Rigaku Corporation | Date: 2016-11-16

Provided are an X-ray generator (1) capable of easily measuring a beam size of an electron beam on an electron target (17), and an adjustment method therefor. The X-ray generator includes an electron target (17) including a first metal, a second metal different from the first metal, and a third metal different from the second metal, which are sequentially arranged side by side along a first direction in a continuous manner.


Patent
Rigaku Corporation | Date: 2016-10-05

There is provided an X-ray diffraction apparatus configured to irradiate a sample S on a sample stand with X-rays generated from an X-ray source and detect the X-rays diffracted by a sample using a detector, including a virtual mask setting section and a signal processing section. The detector outputs detection signals according to intensity of the X-rays received by detection elements, for each of the plurality of detection elements forming a detection surface. The virtual mask setting section is capable of setting a virtual mask on the detection surface of the detector, and setting at least an opening dimension of the virtual mask as an opening condition of the virtual mask independently in an X direction and a Y direction. The signal processing section processes the detection signals outputted from the detector according to the opening condition of the virtual mask set in the virtual mask setting section.

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