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Bagatin M.,University of Padua | Gerardin S.,University of Padua | Paccagnella A.,University of Padua | Ferlet-Cavrois V.,European Space Agency | And 4 more authors.
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS | Year: 2013

We study the response of NAND Flash memories to neutron and alpha particle exposure, with both Single- and Multi-Level Cell architecture devices. We analyze the error rate in the terrestrial environment and discuss scaling trends. © 2013 IEEE.

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