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Windt D.L.,Reflective X-ray Optics, LLC
Review of Scientific Instruments | Year: 2015

A laboratory-based X-ray reflectometer has been developed to measure the performance of hard X-ray multilayer coatings at their operational X-ray energies and incidence angles. The instrument uses a sealed-tube X-ray source with a tungsten anode that can operate up to 160 kV to provide usable radiation in the 15-150 keV energy band. Two sets of adjustable tungsten carbide slit assemblies, spaced 4.1 m apart, are used to produce a low-divergence white beam, typically set to 40 μm × 800 μm in size at the sample. Multilayer coatings under test are held flat using a vacuum chuck and are mounted at the center of a high-resolution goniometer used for precise angular positioning of the sample and detector; additionally, motorized linear stages provide both vertical and horizontal adjustments of the sample position relative to the incident beam. A CdTe energy-sensitive detector, located behind a third adjustable slit, is used in conjunction with pulse-shaping electronics and a multi-channel analyzer to capture both the incident and reflected spectra; the absolute reflectance of the coating under test is computed as the ratio of the two spectra. The instrument's design, construction, and operation are described in detail, and example results are presented obtained with both periodic, narrow-band and depth-graded, wide-band hard X-ray multilayer coatings. © 2015 AIP Publishing LLC. Source


Windt D.L.,Reflective X-ray Optics, LLC | Gullikson E.M.,Lawrence Berkeley National Laboratory
Applied Optics | Year: 2015

A new extreme ultraviolet (EUV) multilayer coating has been developed comprising Pd and Y layers with thin B4C barrier layers at each interface, for normal incidence applications near 10 nm wavelength. Periodic, nonperiodic, and dual-stack coatings have been investigated and compared with similar structures comprising either Mo/Y or Pd/B4C bilayers. We find that Pd/B4C/Y multilayers provide higher reflectance than either Mo/Y or Pd/B4C, with much lower film stress than Pd/B4C. We have also investigated the performance of periodic multilayers comprising repetitions of Pd/Y, Ru/Y, or Ru/B4C/Y, as well as Pd/B4C multilayers deposited using reactive sputtering with an Ar:N2 gas mixture in order to reduce stress: these material combinations were all found to provide poor EUV performance. The temporal stability of a periodic Pd/B4C/Y multilayer stored in air was investigated over a period of 16 months, and a slight reduction in peak reflectance was observed. Periodic Pd/B4C/Y multilayers were also found to be thermally stable up to 100K°C; at higher temperatures (200K°C and 300K°C) we observe a slight reduction in peak reflectance and a slight increase in multilayer period. High-resolution transmission electron microscopy and selected area diffraction of an as-deposited Pd/B4C/Y film indicates a fully amorphous structure, with interfaces that are both smoother and more abrupt than those observed in a comparable Pd/B4C multilayer in which the Pd layers are polycrystalline. The new Pd/B4C/Y multilayers are suitable for normal-incidence imaging and spectroscopy applications, including solar physics, plasma physics, high-brightness EUV light sources, and others. © 2015 Optical Society of America. Source


Windt D.L.,Reflective X-ray Optics, LLC
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2015

This paper describes recent progress in the development of new EUV multilayer coatings for solar physics. In particular, we present results obtained with Pd/B4C/Y, Al/Zr, and Al-Mg/SiC multilayers, designed for normal incidence operation in the 9-50 nm wavelength range. We describe the development of both periodic multilayer films designed for narrowband imaging, and non-periodic multilayers designed to have a broad-spectral response for spectroscopy. The higher EUV reflectance provided by these new coatings, relative to older-generation coatings such as Si/Mo, Mo/Y, and others, will facilitate the development of future solar physics instruments for both imaging and spectroscopy having higher spatial and spectral resolution, while supporting the exposure times and cadences necessary to capture the evolution of flares, jets, CMEs and other dynamic processes in the solar atmosphere. © 2015 SPIE. Source


Windt D.L.,Reflective X-ray Optics, LLC
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2015

This paper is focused on recent progress in the development of broad-band multilayer coatings designed for hard X-ray energies, for use in future astronomical telescopes. We describe a new laboratory-based hard X-ray reflectometer for atwavelength characterization of multilayer films, we present the results of an experimental comparison of the hard X-ray performance of several W-based periodic multilayer coatings, and we describe the optimization and experimental performance of new non-periodic Co-based multilayer coatings (both depth-graded and aperiodic), designed for continuous response through the W and Pt K-edges near 70 and 80 keV, respectively. We discuss future research directions in light of these new results. © 2015 SPIE. Source


Corso A.J.,National Research Council Italy | Corso A.J.,University of Padua | Zuppella P.,National Research Council Italy | Windt D.L.,Reflective X-ray Optics, LLC | And 3 more authors.
Optics Express | Year: 2012

In this work we present the design of a Pd/B4C multilayer structure optimized for high reflectance at 6.67 nm. The structure has been deposited and also characterized along one year in order to investigate itstemporal stability. This coating has been developed for the beam transport system of FERMI@Elettra Free Electron Laser: the use of an additional aperiodic capping layer on top of the structure combines the high reflectance with filter properties useful in rejecting the fundamental harmonic when the goal is to select the third FEL harmonic. ©2012 Optical Society of America. Source

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