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Harvey J.E.,Photon Engineering LLC
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2014

Anecdotes and recollections from a graduate student at the Optical Sciences Center (OSC) in the late 1960s and early 1970s. The early faculty of the OCS fostered an exciting environment where even graduate students served significant roles on major government research contracts. Teamwork and collaboration between research groups was often required to meet the contract goals. This unique learning experience at the OSC almost 50 years ago served as a springboard for a satisfying and rewarding career in Optical Engineering. © 2014 SPIE. Source

Mulder S.,Photon Engineering LLC
Optics InfoBase Conference Papers | Year: 2013

A number of simple graphical methods for designing optics in CAD are presented. These methods are based on the law of reflection, Snell's Law, Fermat's principle and a property of focal conics. These graphical methods will be illustrated using the practical example of designing a catadioptric LED collimator. © OSA 2013. Source

Pfisterer R.N.,Photon Engineering LLC
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2012

The process to convert raw profilometer data describing surface roughness into PSD and BSDF is discussed, but not well-documented in the open optical engineering literature, and is therefore prone to procedural mistakes. This paper describes the step-by-step numerical process as well as the three "check points" that insure that errors have not been introduced into the calculation. A numerical example is discussed. © 2012 SPIE. Source

Harvey J.E.,Photon Engineering LLC
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2013

The modulation transfer function (MTF) is widely used as the image quality criterion of choice for imaging applications where fine detail in extended images needs to be specified or evaluated. In this paper we present a parametric analysis of the effect of scattered light upon the MTF of an imaging system, and illustrate the results for three specific applications: (i) a visible Newtonian telescope with moderately good optical surfaces which produce no significant effect upon the MTF, (ii) an extreme ultraviolet Newtonian telescope where scattering effects can dominate both diffraction effects and aberrations in the resulting image degradation even for state-of-the-art optical surfaces, and (iii) a visible system made up of three diamond-turned off-axis aspheric mirrors where we use the predicted MTF to estimate whether post-polishing is required (huge cost and schedule impact) to meet a specific image quality requirement. © 2013 SPIE. Source

Harvey J.E.,Photon Engineering LLC
Applied Optics | Year: 2015

The recent validation of a generalized linear systems formulation of surface scatter theory and an analysis of image degradation due to surface scatter in the presence of aberrations has provided credence to the development of a systems engineering analysis of image quality as degraded not only by diffraction effects and geometrical aberrations, but to scattering effects due to residual optical fabrication errors as well. This generalized surface scatter theory provides insight and understanding by characterizing surface scatter behavior with a surface transfer function closely related to the modulation transfer function of classical image formation theory. Incorporating the inherently band-limited relevant surface roughness into the surface scatter theory provides mathematical rigor into surface scatter analysis, and implementing a fast Fourier transform algorithm with logarithmically spaced data points facilitates the practical calculation of scatter behavior from surfaces with a large dynamic range of relevant spatial frequencies. These advances, combined with the continuing increase in computer speed, leave the optical design community in a position to routinely derive the optical fabrication tolerances necessary to satisfy specific image quality requirements during the design phase of a project; i.e., to integrate optical metrology and fabrication into the optical design process. © 2015 Optical Society of America. Source

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