Saini S.S.,Samalkha Group of Institutions |
Bhatt P.,Samalkha Group of Institutions |
Bhardwaj U.,Hindu PG College |
Bhardwaj S.,Hindu PG College
European Journal of Mass Spectrometry | Year: 2014
We have made a study of the total ionization cross-sections of a silane (SiH4) molecule caused by electron impact for a single ionization. Electron-impact ionization cross-sections (EIICS) have been calculated from threshold ionization energy to 1400 eV. The theoretical model, developed by Jain and Khare, has been used to calculate the EIICS for silane. We observed the following product ions: SiH3 +, SiH2 +, SiH+ Si+ H2 + and H+ . The predicted EIICS of silane for all six fragment ions are compared with other theoretical and experimental data. The present model shows a good agreement with the previously reported data. © IM Publications LLP 2014 All rights reserved.
Gahlot D.R.,Dhampur Degree College |
Vatsa V.K.,Hindu PG College |
Kumar D.,Dhampur Degree College
Vegetos | Year: 2010
Two improved cultivars of urdbean namely PU-19 and PU-35 were treated with single and combination dose/concentration of gamma rays, ethyl methane sulphonate (EMS) and diethyl sulphate (dES). A number of plant mutants viz. dwarf type, spreading type, umbel inflorescence, long inflorescence axis, broad leaved sterile vine type, broad leaved fertile vine type, lanceolate leaf sterile vine type, hastate leaf fertile vine type, hastate leaf sterile erect type and anthocyanin pigmentation were obtained in M2 generation of both varieties by various mutagenic treatments.