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Shiga, Japan

Patent
Otsuka Electronics Co. | Date: 2014-01-23

A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.


An optical characteristic measuring apparatus includes a light source, a detector and a data processing unit. Data processing unit includes a modeling unit, an analyzing unit and a fitting unit. The plurality of film model equations are solved, and prescribed calculation is performed on the assumption that the optical constants included in the plurality of film model equations is identical. Fitting is performed between a waveform obtained by substituting the obtained film thickness and the obtained optical constants of the film into the film model equations and a waveform of the wavelength distribution characteristic obtained by detector, thereby determining that the optical constants included in the plurality of film model equations is identical and that the film thickness and the optical constants obtained by the analyzing unit are correct values.


A light source support apparatus includes: a base member; a first support member supporting the base member rotatably about a first axis; first and second arm members connected respectively to opposite ends of the base member and extending in a direction parallel to the first axis; and a pair of second support members disposed at respective positions, which are opposite to each other, of the first and second arm members for supporting a sample light source. The pair of second support members is configured to be able to rotate the supported sample light source about a second axis orthogonal to the first axis. At least one of the first and second arm members is configured to be attachable to and detachable from the base member.


Patent
Otsuka Electronics Co. | Date: 2013-04-12

An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.


Patent
Otsuka Electronics Co., Tokyo University of Agriculture and Technology | Date: 2015-06-18

A dynamic light scattering measurement device includes an irradiation section that applies light emitted from a low-coherence light source to a sample that includes particles, a spectral intensity acquisition section that disperses reflected light from a reference plane and scattered light from the sample that has passed through the reference plane to acquire a spectral intensity of interference light of the reflected light and the scattered light, the reference plane being situated to intersect an optical path through which the light is applied to the sample, and a measurement section that measures dynamic light scattering of the sample based on the acquired spectral intensity.

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