Nishi-Tokyo-shi, Japan
Nishi-Tokyo-shi, Japan

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Disclosed is a portable non-destructive testing (NDT) instrument system that transmits spectrum data measured from a test material sample to a remotely located computer for computation of the samples atomic element composition. The atomic element composition is subsequently transmitted back to the portable instrument for display to the operator in real time. The precision and accuracy of the compositional computation is improved by the greater processing power of the high performance remote computer. The operator of the NDT instrument may choose to use the remote computer to perform part or all of the compositional computation.


A semiconductor-based light source device for an endoscope that provides for an even power distribution and/or color distribution of light. The semiconductor-based light source device includes a plurality of semiconductor light sources and a plurality of fiber bundles, in which the respective fiber bundles are each segregated into a plurality of fiber sub-bundles for directing substantially the same amount of illumination from a respective semiconductor light source to each of a corresponding plurality of illumination windows disposed at a distal end of the endoscope. By providing such a semiconductor-based light source device, in which the respective semiconductor light sources are operative to adjust the intensity and/or color or wavelength of the light emitted by the respective semiconductor light sources, a desired color temperature and/or color balance for illumination of tissue and/or other matter under examination by the endoscope can be achieved.


Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.


Patent
Olympus Inc. | Date: 2017-03-08

A surgical device comprising: a handle assembly; a locking collar and a set of replaceable bits that load along an axis into the handle assembly; wherein the locking collar is fully removable from the handle assembly, the locking collar loads axially to a first position, and the locking collar rotates between the first position and a second position; wherein, in the first position, the locking collar is free to be axially removed from the handle assembly and the replaceable bits are free to be loaded or unloaded from the handle assembly; wherein in the second position, the locking collar is prevented from axial movement relative to the handle assembly and the replaceable bits are prevented from being received within, or removed from, the handle assembly.


Patent
Olympus Inc. | Date: 2017-03-22

A cutting instrument comprising: an outer tube; an inner tube rotatably disposed within the outer tube; the inner tube comprising an opening having a leading edge and a trailing edge; and the outer tube comprising a window having a leading edge and a trailing edge; at least one of the leading edge of the opening, the trailing edge of the opening, the leading edge of the window and the trailing edge of the window comprising a canted edge; and the window of the outer tube being adapted to be completely blocked by the inner tube during a phase of the rotation of the inner tube within the outer tube.


A lever latching system comprising: a housing; a lever having a latch pin fixedly mounted to the lever, the lever being movably mounted to the housing so that the latch pin moves in an arc; and a latch plate movably mounted to the housing for linear movement with respect to the housing, the latch plate comprising a labyrinth for receiving the latch pin.


Disclosed is an NDT/NDI probe array and manufacturing method. The probe array includes a sheet of flexible circuit 10 with a plurality of lower pins 102 and corresponding, electrically connected, upper pins 104. The probe further comprises a backing block 12, a layer of piezoelectric ceramic 16 having a plurality of conductive elements 162, a matching layer 18 and a frame 14. An adhesive material such as epoxy is applied to the circuit, the backing, the ceramic and the matching layer, and all are aligned and stack pressed at least partially into the frame and permanently bonded in such a fashion that each of the lower pins of the flexible circuit is firmly and permanently in contact with a corresponding one of the conductive elements of the ceramic.


Disclosed is an NDT/NDI probe array and manufacturing method. The probe array includes a sheet of flexible circuit 10 with a plurality of lower pins 102 and corresponding, electrically connected, upper pins 104. The probe further comprises a backing block 12, a layer of piezoelectric ceramic 16 having a plurality of conductive elements 162, a matching layer 18 and a frame 14. An adhesive material such as epoxy is applied to the circuit, the backing, the ceramic and the matching layer, and all are aligned and stack pressed at least partially into the frame and permanently bonded in such a fashion that each of the lower pins of the flexible circuit is firmly and permanently in contact with a corresponding one of the conductive elements of the ceramic.


Patent
Olympus Inc. | Date: 2016-03-31

The phased-array probe to be received on a probe receiving area of a wedge generally has a probe housing, a plurality of acoustic transducer elements disposed in the probe housing and distributed along a length of a working surface of the probe housing, and a matching layer covering the plurality of acoustic transducer elements and extending to cover an extended region of the working surface of the probe housing such that the matching layer forms a closed contact with an upper end of an acoustic damping junction of the wedge when the working surface of the probe housing of the phased-array probe is received on the probe receiving area of the wedge, wherein the closed contact prevents acoustic energy from being reflected from the extended region of the working surface of the probe housing.


Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test targets responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and a window protecting film assembly allowing X-rays to pass through and providing protection to the window, the film assembly being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film assembly presently in use. An embodiment of the film assembly comprises a thin film fixed with an adhesive layer to a supporting frame having a closely spaced array of apertures.

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