Nishi-Tokyo-shi, Japan
Nishi-Tokyo-shi, Japan

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Disclosed is a portable non-destructive testing (NDT) instrument system that transmits spectrum data measured from a test material sample to a remotely located computer for computation of the samples atomic element composition. The atomic element composition is subsequently transmitted back to the portable instrument for display to the operator in real time. The precision and accuracy of the compositional computation is improved by the greater processing power of the high performance remote computer. The operator of the NDT instrument may choose to use the remote computer to perform part or all of the compositional computation.


Disclosed is a Hall Effect instrument with the capability of compensating for temperature drift consistently, accurately and in real time of operation. The instrument embodies a four-point ohmmeter circuit measuring Hall Effect sensor resistance and tracking the effect of temperature on the Hall Effect sensor. The instrument takes into account a relationship between the temperature and a temperature compensation index on a per probe basis, which has exhibited a deterministic difference observed by the present inventor.


Disclosed is an NDT/NDI probe array and manufacturing method. The probe array includes a sheet of flexible circuit 10 with a plurality of lower pins 102 and corresponding, electrically connected, upper pins 104. The probe further comprises a backing block 12, a layer of piezoelectric ceramic 16 having a plurality of conductive elements 162, a matching layer 18 and a frame 14. An adhesive material such as epoxy is applied to the circuit, the backing, the ceramic and the matching layer, and all are aligned and stack pressed at least partially into the frame and permanently bonded in such a fashion that each of the lower pins of the flexible circuit is firmly and permanently in contact with a corresponding one of the conductive elements of the ceramic.


Patent
Olympus Inc. | Date: 2015-04-15

A mechanical converter assembly includes an input, a lever stack (multiple levers), and an output. The input is configured to receive a mechanical drive force (or mechanical input signal) from a driver resource. The lever stack translates the received drive force into a mechanical output force (or mechanical output signal). The output of the mechanical converter assembly is configured to apply the mechanical output force produced by the lever stack to a driven element. In one embodiment, use of the lever stack in the mechanical converter assembly provides translational gain in which an amount of translational movement at the input of the mechanical converter assembly results in a substantially greater amount of corresponding translational movement at the output.


Disclosed is an NDT/NDI probe array and manufacturing method. The probe array includes a sheet of flexible circuit 10 with a plurality of lower pins 102 and corresponding, electrically connected, upper pins 104. The probe further comprises a backing block 12, a layer of piezoelectric ceramic 16 having a plurality of conductive elements 162, a matching layer 18 and a frame 14. An adhesive material such as epoxy is applied to the circuit, the backing, the ceramic and the matching layer, and all are aligned and stack pressed at least partially into the frame and permanently bonded in such a fashion that each of the lower pins of the flexible circuit is firmly and permanently in contact with a corresponding one of the conductive elements of the ceramic.


Disclosed is a calibration method and system for non-destructive testing and inspection (NDT/NDI). The method and system involve establishment of a reference database by conducting FMC acquisition on a first calibration block having standardly known indications with a first series of depths and under a laboratory standard calibration condition. Then phased-array operation is conducted on a second calibration block, which is substantially the same as the first block, having indications with a series of corresponding user measured depths and under a second calibration condition as close to the laboratory condition as possible. The calibration is then made with the gain compensation calculated based on the response signals from the indications of the second block, the first series of gain data from the reference database, and the user measured depths for the corresponding indications under the second calibration condition.


The method for calibrating an inspection instrument coupled with acoustic transducers disposed at circumferential positions distributed around a surface of an elongated object to inspect generally has the steps of: for each one of the circumferential positions, measuring a first and a second received signal using two acoustic transducers disposed at two axial positions along the object, the received signals resulting from the propagation of an acoustic guided wave signal along the object; identifying an acoustic mode according to the first received and the second received signals using a known period of time associated with the propagation of the acoustic guided wave signal between the two axial positions along the object; and determining a coupling coefficient associated with the acoustic mode, the coupling coefficient being indicative of the coupling of the acoustic transducers on the object; and calibrating the inspection instrument coupled to the object based on the coupling coefficients.


Patent
Olympus Inc. | Date: 2016-03-31

The phased-array probe to be received on a probe receiving area of a wedge generally has a probe housing, a plurality of acoustic transducer elements disposed in the probe housing and distributed along a length of a working surface of the probe housing, and a matching layer covering the plurality of acoustic transducer elements and extending to cover an extended region of the working surface of the probe housing such that the matching layer forms a closed contact with an upper end of an acoustic damping junction of the wedge when the working surface of the probe housing of the phased-array probe is received on the probe receiving area of the wedge, wherein the closed contact prevents acoustic energy from being reflected from the extended region of the working surface of the probe housing.


Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test targets responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and a window protecting film assembly allowing X-rays to pass through and providing protection to the window, the film assembly being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film assembly presently in use. An embodiment of the film assembly comprises a thin film fixed with an adhesive layer to a supporting frame having a closely spaced array of apertures.


Disclosed is phased array inspection system with automatically generated PAUT scan plan based on a set of configurable probe operation parameters and a combination of preferred code requirement and rules given by PAUT expertise. The complex code requirements and PAUT expertise are pre-assembled into a plurality of templates applicable to categories of inspection tasks by PAUT experts. Requirements and optimization scoring schemes are then used to automatically score each of specifically proposed scan plan setup, including the selection of probe operation parameters against the corresponding template for a specific task. This allows less skilled field inspector to operate with the correct interpretation of the complex code and accurate evaluation of the scan plan.

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