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Kirkland, WA, United States

Grant
Agency: Department of Energy | Branch: | Program: SBIR | Phase: Phase II | Award Amount: 750.00K | Year: 2002

65083 The field emission electron source is a key element in powerful electron microscopes that characterize matter on the atomic scale, but the brightness, coherence, and stability are no longer sufficient to investigate materials at the level of resolution demanded by modern industry. Specifically, brightness needs to be improved by a factor of ten, the energy spread needs to be decreased 2-3 times, and the overall stability, reliability, and user-friendliness all must be improved substantially. This project will develop a 200 keV field emission electron source using a Zr/O/W(100) or similar low workfunction emitter. The new source is expected to have unprecedented brightness (>1010A cm-2 sr-1eV-1 at 200 keV), monochromaticity (10 hours between emitter cleanings, >10 years lifetime of the emitter), surpassing all existing electron sources. Phase I developed and tested a new type of electron source with the desired properties: increased brightness, decreased energy spread, and improved longevity. The source, using a Zr/O/W(100) cathode operated at liquid nitrogen temperature, achieved a workfunction of 2.7 eV, angular confinement of emission to within ¿4¿, emission noise 8 hours between cleanings. Phase II will develop a new type of electron accelerator that allows the electron source to be held at 78K in an ultra-clean, ultra-high vacuum. New high-voltage electronics also will be developed with extensive computer control that provides unprecedented stability at 200 keV and completely automated operation. Commercial Applications and Other Benefits as described by the awardee: The new source should ultimately be incorporated in an advanced electron microscope that will provide revolutionary new capabilities for imaging and analyzing matter. The world-wide market for such instruments is greater than $500 million, and there is no U.S. manufacturer.


Grant
Agency: Department of Energy | Branch: | Program: SBIR | Phase: Phase I | Award Amount: 99.86K | Year: 2001

65083 The field emission electron source is a key element in powerful electron microscopes that characterize matter on the atomic scale, but the brightness, coherence, and stability are no longer sufficient to investigate materials at the level of resolution demanded by modern industry. Specifically, brightness needs to be improved by a factor of ten, the energy spread needs to be decreased 2-3 times, and the overall stability, reliability and user-friendliness all must be improved substantially. This project will develop a new low-workfunction, cold-field emission electron source with reduced emitter radius that can meet these criteria. The source will operate at liquid nitrogen temperature in an exceptionally high vacuum and will be used in a 200 keV scanning transmission electron microscope. Phase I will study the performance of selected low-workfunction cold field emitters in a dedicated ultra high-vacuum test chamber. Candidate low workfunction systems include Zr/O, Sc/O and Ba/O coatings on tungsten, all cooled to 78 K. Their workfunction, brightness, stability and reproducibility will be determined. The best system will be incorporated in a 200 keV electron gun to be developed in Phase II Commercial Applications And Other Benefits as described by awardee: The complete 200 keV electron gun would be incorporated in an aberration-corrected scanning transmission electron microscope. It should allow entry into the highly competitive electron microscope market with the first US-designed and made electron microscope in over 40 years.


Grant
Agency: Department of Energy | Branch: | Program: SBIR | Phase: Phase I | Award Amount: 0.00 | Year: 2002

65083 The field emission electron source is a key element in powerful electron microscopes that characterize matter on the atomic scale, but the brightness, coherence, and stability are no longer sufficient to investigate materials at the level of resolution demanded by modern industry. Specifically, brightness needs to be improved by a factor of ten, the energy spread needs to be decreased 2-3 times, and the overall stability, reliability, and user-friendliness all must be improved substantially. This project will develop a 200 keV field emission electron source using a Zr/O/W(100) or similar low workfunction emitter. The new source is expected to have unprecedented brightness (>1010A cm-2 sr-1eV-1 at 200 keV), monochromaticity (10 hours between emitter cleanings, >10 years lifetime of the emitter), surpassing all existing electron sources. Phase I developed and tested a new type of electron source with the desired properties: increased brightness, decreased energy spread, and improved longevity. The source, using a Zr/O/W(100) cathode operated at liquid nitrogen temperature, achieved a workfunction of 2.7 eV, angular confinement of emission to within ¿4¿, emission noise 8 hours between cleanings. Phase II will develop a new type of electron accelerator that allows the electron source to be held at 78K in an ultra-clean, ultra-high vacuum. New high-voltage electronics also will be developed with extensive computer control that provides unprecedented stability at 200 keV and completely automated operation. Commercial Applications and Other Benefits as described by the awardee: The new source should ultimately be incorporated in an advanced electron microscope that will provide revolutionary new capabilities for imaging and analyzing matter. The world-wide market for such instruments is greater than $500 million, and there is no U.S. manufacturer.

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