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Malashevich N.,Scientific Manufacturing Complex Technological Center Zelenograd | Makarceva M.,Scientific Manufacturing Complex Technological Center Zelenograd | Fedorov R.,National Research University of Electronic Technology Zelenograd
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS | Year: 2015

The problem of information storage reliability improvement in random access memory (RAM) devices oriented to application as part of gate arrays designed for space-related application is considered in this article. © 2015 IEEE. Source


Shilyaeva Y.I.,National Research University of Electronic Technology Zelenograd | Bardushkin V.V.,National Research University of Electronic Technology Zelenograd | Gavrilov S.A.,National Research University of Electronic Technology Zelenograd | Silibin M.V.,National Research University of Electronic Technology Zelenograd | And 6 more authors.
Physical Chemistry Chemical Physics | Year: 2014

The arrays of metallic nanowires are considered as promising precursors for 1D semiconductor nanostructures after appropriate treatment at temperatures close to the melting point. Therefore the melting behaviour of the metallic structures in oxide templates is a key parameter for the subsequent conversion process. The present paper focuses on understanding of the effect of mechanical stress generated during heating on the melting point of the metal nanowires deposited into the pores of anodic alumina. Extremely high local compressive stress appears due to the difference in the thermal coefficients of the oxide template and nanowires inside the pores. The effect of the composite structural parameter that may be related to the concentration of nanowires on the melting temperature has been investigated. A numerical model predicting the melting point has been developed for composites with indium, tin, and zinc nanowires. The simulation results obtained using the suggested model were compared with the experimental data. © 2014 The Owner Societies. Source

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