Entity

Time filter

Source Type

Sutton, MA, United States

Ruiz-Cruz J.A.,Autonomous University of Madrid | Fahmi M.M.,University of Waterloo | Mansour R.R.,University of Waterloo | Mansour R.R.,NanoWave
IEEE Transactions on Microwave Theory and Techniques | Year: 2012

Novel combline resonators and filters with enhanced dual-band characteristics are introduced in this paper. The proposed resonator is made up of three metallic conductors: an inner post, an intermediate conductor, and an enclosure. This structure provides two asynchronous resonant modes that can be used for realizing compact microwave dual-band filters. Such dual-band filters offer the low cost, compact size, and ease of manufacturing features of traditional combline resonator filters, with additional size reduction due to the fact that a single physical cavity provides two electrical resonators. In addition, the new cavity introduces a transmission zero in the guard-bands enhancing the filter selectivity, while keeping a simple and compact inline topology. The design of filters based on this novel resonator is discussed, starting with the resonator circuit model, the coupling scheme, and the complete filter design methodology. Simulations as well as experimental results of a tenth-order (2 × 5) dual-band filter with a measured rejection level in excess of 100 dB in the guard-band are presented to show the concept. © 1963-2012 IEEE. Source


Grant
Agency: NSF | Branch: Standard Grant | Program: | Phase: | Award Amount: 135.15K | Year: 2010

This Small Business Innovation Research Phase I project will establish the feasibility of transforming a wide-field optical microscope into a real-time imaging/metrology system. The system will have a spatial resolution better than 10 nanometers, when used as a wide-field optical microscope, and better than 1 Angstrom when used as a position tracker for nanoscale particles. Recent progress reaching effective resolutions below the Rayleigh diffraction limit of ~200 nm has spurred research in the fields of medical imaging and micro metrology. However, these optical microscopes and interferometers rely on a temporal image formed on an image sensor for the intensity and phase map calculation, which makes it difficult to isolate the measurement from vibration and other noise. In order to mitigate this issue, we will develop a system which integrates (1) an active optoelectronic mixing method to provide fast, synchronous phase-amplitude detection within a single frame acquisition time with high signal-to-noise and dynamic range, (2) a picometer-resolution motion scanner for precise active positioning of the pixel and/or structured illumination pattern with real-time super-resolution image reconstruction and (3) a real-time signal processing engine to solve the complicated inverse filter problem, to allow fast processing and better image resolution.

The broader impact/commercial potential of this project is to provide an economical add-on solution to optical microscopes to enhance observation and metrology performance to a level which is comparable to much more expensive electron microscopy or scanning probe systems. The resulting add-on system will allow many researchers and industrial users to significantly enhance their existing optical microscopes performance at a fraction of the cost of conventional high-resolution imaging systems. The proposed system is expected to increase imaging productivity for manufacturing process evaluation and quality inspection in the fields of biomedical science, semiconductor devices, data storage and optical components. The new imaging capability, integrated with a quantitative phase measurement capability, is not only useful for life science (for example, for understanding system behavior at the molecular level in living cells), but also vital for inspecting and measuring surface parameters and nanoscale particle behavior for semiconductor manufacturers, makers of high precision optical components, and others involved in the fabrication and inspection of nanoscale materials and systems.


Patent
NanoWave | Date: 2013-04-04

An electronically tunable filter (ETF) and systems comprising an ETF are disclosed herein. The ETF comprises: a first image rejection mixer; a second image rejection mixer; a first hybrid coupler, the first hybrid coupler being coupled to the first image rejection mixer; a second hybrid coupler, the second hybrid coupler being coupled to the second image rejection mixer; an internal filter coupled to the first hybrid coupler and the second hybrid coupler; a control port for receiving a control signal; a power splitter coupled to the control port, the first image rejection mixer, and the second image rejection mixer; a first port coupled to the first image rejection mixer; and a second port coupled to the first image rejection mixer.


Grant
Agency: National Science Foundation | Branch: | Program: SBIR | Phase: Phase I | Award Amount: 135.15K | Year: 2010

This Small Business Innovation Research Phase I project will establish the feasibility of transforming a wide-field optical microscope into a real-time imaging/metrology system. The system will have a spatial resolution better than 10 nanometers, when used as a wide-field optical microscope, and better than 1 Angstrom when used as a position tracker for nanoscale particles. Recent progress reaching effective resolutions below the Rayleigh diffraction limit of ~200 nm has spurred research in the fields of medical imaging and micro metrology. However, these optical microscopes and interferometers rely on a temporal image formed on an image sensor for the intensity and phase map calculation, which makes it difficult to isolate the measurement from vibration and other noise. In order to mitigate this issue, we will develop a system which integrates (1) an active optoelectronic mixing method to provide fast, synchronous phase-amplitude detection within a single frame acquisition time with high signal-to-noise and dynamic range, (2) a picometer-resolution motion scanner for precise active positioning of the pixel and/or structured illumination pattern with real-time super-resolution image reconstruction and (3) a real-time signal processing engine to solve the complicated inverse filter problem, to allow fast processing and better image resolution. The broader impact/commercial potential of this project is to provide an economical add-on solution to optical microscopes to enhance observation and metrology performance to a level which is comparable to much more expensive electron microscopy or scanning probe systems. The resulting add-on system will allow many researchers and industrial users to significantly enhance their existing optical microscopes' performance at a fraction of the cost of conventional high-resolution imaging systems. The proposed system is expected to increase imaging productivity for manufacturing process evaluation and quality inspection in the fields of biomedical science, semiconductor devices, data storage and optical components. The new imaging capability, integrated with a quantitative phase measurement capability, is not only useful for life science (for example, for understanding system behavior at the molecular level in living cells), but also vital for inspecting and measuring surface parameters and nanoscale particle behavior for semiconductor manufacturers, makers of high precision optical components, and others involved in the fabrication and inspection of nanoscale materials and systems.


Grant
Agency: National Aeronautics and Space Administration | Branch: | Program: SBIR | Phase: Phase I | Award Amount: 100.00K | Year: 2009

In this SBIR, we propose a new type of laser interferometer engine for in-situ large optics inspection and metrology and supporting system platform. The proposed FPGA signal processing concept together with new generation high-speed CMOS image sensor enables high speed (> 1m/sec) and real-time continuous surface profiling with minimum local memory. This transforms the currently available laser interferometer into a sub-nanometer precision instrument with only minor modification while providing easy scalability for large optic surface testing and measurement capability simultaneously.

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