Nanometrics

Kanata, Canada

Nanometrics

Kanata, Canada
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News Article | May 4, 2017
Site: globenewswire.com

MILPITAS, Calif., May 04, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced its participation in the following investor events: 18th Annual B. Riley Co. Investor Conference Loews Santa Monica Beach Hotel, Santa Monica, CA May 24-25, 2017 Presentation Time: 11:30 AM PT on May 25 Presentation materials, along with a live and archived audio webcast from each event, will be made available on Nanometrics' website at www.nanometrics.com. Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components.  Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics’ systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics’ website is http://www.nanometrics.com.


MILPITAS, Calif., July 10, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that its Atlas® systems have been adopted by multiple leading memory manufacturers for production control of thin film deposition processes. Complementing the large installed base of Atlas tools, the Atlas MPU and Atlas III systems are new members of a fleet of solutions that Nanometrics has deployed to enable yield learning and factory control across multiple process steps of the industry’s advanced 3D-NAND and DRAM devices. The Atlas MPU and the Altas III platforms are extensions to the widely deployed Atlas product line, delivering higher productivity and improved thin film metrology performance. Using a common platform architecture strategy, the Atlas MPU is targeted to film applications in customer fabs which have already deployed Atlas XP+ systems into high-volume manufacturing. The Atlas III provides enhanced performance and productivity over the Atlas II+ by enabling sub-angstrom level process control and film metrology capabilities suitable for the most challenging leading-edge device applications. Atlas MPU and Atlas III both leverage Nanometrics’ industry-leading NanoDiffract® OCD modeling capabilities. “The Atlas MPU and Atlas III systems for thin film metrology significantly lowers overall cost-of-ownership and increases operational flexibility within volume manufacturing,” commented Dr. Srini Vedula, vice president, Thin Film & OCD Solutions, at Nanometrics. “Our customers recognize the benefit and value of extending their metrology capabilities with new platforms compatible with their existing Atlas fleet. By working closely with them on upgradable options and new system performance, the Atlas MPU and Atlas III enable our customers to maximize their existing investments in our Atlas platforms and solutions while providing significant fab-wide performance and productivity improvements.” For a review of all Atlas metrology systems and the full suite of process control metrology systems, visit Nanometrics at SEMICON West July 11-13, Moscone Center, San Francisco, booth #5844 North hall. About Nanometrics Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components.  Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics’ systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics’ website is http://www.nanometrics.com. Forward Looking Statements Certain statements in this press release are forward-looking statements that involve a number of risks and uncertainties that could cause actual results to differ materially from those described in this release.  Although Nanometrics believes that the expectations reflected in the forward-looking statements are reasonable, actual results could differ materially from these expectations due to a variety of factors, including, but not limited to: failure of customers to adopt the new products; decreased levels of industry spending; Nanometrics’ inability to gain additional market share, increase sales, ship products as scheduled, achieve customer acceptance of new products or outperform the industry; decreased demand for Nanometrics’ products; shifts in the timing of customer orders and product shipments; technology adoption rates; changes in customer and product mix; changes in market share; changes in operating expenses; and general economic conditions. For additional information and considerations regarding the risks faced by Nanometrics that could cause actual results to differ materially, see its annual report on Form 10-K for the year ended December 31, 2016, as filed with the Securities and Exchange Commission on March 3, 2017 including under the caption “Risk Factors,” as well as other periodic reports filed with the SEC from time to time. Nanometrics disclaims any obligation to update information contained in any forward-looking statement, except as required by law.


MILPITAS, Calif., July 10, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that its Atlas® systems have been adopted by multiple leading memory manufacturers for production control of thin film deposition processes. Complementing the large install base of Atlas tools, the Atlas MPU and Atlas III systems are new members of a fleet of solutions that Nanometrics has deployed to enable yield learning and factory control across multiple process steps of the industry’s advanced 3D-NAND and DRAM devices. The Atlas MPU and the Altas III platforms are extensions to the widely deployed Atlas product line, delivering higher productivity and improved thin film metrology performance. Using a common platform architecture strategy, the Atlas MPU is targeted to film applications in customer fabs which have already deployed Atlas XP+ systems into high-volume manufacturing. The Atlas III provides enhanced performance and productivity over the Atlas II+ by enabling sub-angstrom level process control and film metrology capabilities suitable for the most challenging leading-edge device applications. Atlas MPU and Atlas III both leverage Nanometrics’ industry-leading NanoDiffract® OCD modeling capabilities. “The Atlas MPU and Atlas III systems for thin film metrology significantly lowers overall cost-of-ownership and increases operational flexibility within volume manufacturing,” commented Dr. Srini Vedula, vice president, Thin Film & OCD Solutions, at Nanometrics. “Our customers recognize the benefit and value of extending their metrology capabilities with new platforms compatible with their existing Atlas fleet. By working closely with them on upgradable options and new system performance, the Atlas MPU and Atlas III enable our customers to maximize their existing investments in our Atlas platforms and solutions while providing significant fab-wide performance and productivity improvements.” For a review of all Atlas metrology systems and the full suite of process control metrology systems, visit Nanometrics at SEMICON West July 11-13, Moscone Center, San Francisco, booth #5844 North hall. About Nanometrics Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components.  Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics’ systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics’ website is http://www.nanometrics.com. Forward Looking Statements Certain statements in this press release are forward-looking statements that involve a number of risks and uncertainties that could cause actual results to differ materially from those described in this release.  Although Nanometrics believes that the expectations reflected in the forward-looking statements are reasonable, actual results could differ materially from these expectations due to a variety of factors, including, but not limited to: failure of customers to adopt the new products; decreased levels of industry spending; Nanometrics’ inability to gain additional market share, increase sales, ship products as scheduled, achieve customer acceptance of new products or outperform the industry; decreased demand for Nanometrics’ products; shifts in the timing of customer orders and product shipments; technology adoption rates; changes in customer and product mix; changes in market share; changes in operating expenses; and general economic conditions. For additional information and considerations regarding the risks faced by Nanometrics that could cause actual results to differ materially, see its annual report on Form 10-K for the year ended December 31, 2016, as filed with the Securities and Exchange Commission on March 3, 2017 including under the caption “Risk Factors,” as well as other periodic reports filed with the SEC from time to time. Nanometrics disclaims any obligation to update information contained in any forward-looking statement, except as required by law.


News Article | July 10, 2017
Site: globenewswire.com

MILPITAS, Calif., July 10, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced the release of NanoDiffract® 4, the latest version of its industry-leading optical critical dimension (OCD) modeling and analysis software with an optimized user interface. NanoDiffract 4 enhances user productivity with added features and options resulting in reduced time-to-solution for the most complex devices. The software is designed to improve modeling and analysis for the latest-generation high-aspect-ratio structures used in DRAM and 3D-NAND, as well as handling the most complex 3D FinFET logic/foundry structures. The NanoDiffract 4 analysis engine coupled with its high-fidelity modeling accuracy greatly improves metrology performance, enabling enhanced in-line sensitivity to critical steps, leading to better factory control. “Nanometrics’ OCD metrology has been broadly adopted by our customers across all device types and key unit operations in R&D and production for its productivity and sensitivity,” commented Adrian Wilson, vice president and general manager of the software & analytics business unit at Nanometrics. “Our customers have to manage very narrow process tolerances, and with the latest Diffract 4 they get rapid visibility in-line to control their most challenging processes.” NanoDiffract 4 is in production on the latest Nanometrics Atlas®, IMPULSE® and NanoGen™ systems for thin film and OCD metrology and currently deployed across numerous customer sites for advanced memory and logic/foundry devices. Combined with the company’s advanced metrology platforms, the latest NanoDiffract 4 software further extends Nanometrics’ comprehensive solutions in process control metrology for the most challenging 3D device structures, including a new SRAM optimizer and 3D-NAND configuration for support of 100+ layers. For a review of NanoDiffract 4 and the full suite of process control metrology systems, visit Nanometrics at SEMICON West July 11-13, Moscone Center, San Francisco, booth #5844 North hall. About Nanometrics Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com. Forward Looking Statements Certain statements in this press release are forward-looking statements that involve a number of risks and uncertainties that could cause actual results to differ materially from those described in this release.  Although Nanometrics believes that the expectations reflected in the forward-looking statements are reasonable, actual results could differ materially from these expectations due to a variety of factors, including, but not limited to: failure of customers to adopt the new products; decreased levels of industry spending; Nanometrics’ inability to gain additional market share, increase sales, ship products as scheduled, achieve customer acceptance of new products or outperform the industry; decreased demand for Nanometrics’ products; shifts in the timing of customer orders and product shipments; technology adoption rates; changes in customer and product mix; changes in market share; changes in operating expenses; and general economic conditions. For additional information and considerations regarding the risks faced by Nanometrics that could cause actual results to differ materially, see its annual report on Form 10-K for the year ended December 31, 2016, as filed with the Securities and Exchange Commission on March 3, 2017 including under the caption “Risk Factors,” as well as other periodic reports filed with the SEC from time to time. Nanometrics disclaims any obligation to update information contained in any forward-looking statement, except as required by law.


News Article | July 11, 2017
Site: globenewswire.com

MILPITAS, Calif., July 11, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced the introduction of SpectraProbe™, a new software-based process control solution designed to provide advanced data analytics to maximize fab productivity.  Complementing the high-fidelity modeling capabilities of NanoDiffract® for optical critical dimension (OCD) metrology, SpectraProbe analyzes data generated by a customer’s fleet of Nanometrics Atlas®, IMPULSE® and T3 metrology systems, providing real-time excursion monitoring, rapid model-less OCD recipe analysis and tracking of other process parameters. When combined with patented Atlas full Mueller matrix data set and SpectraProbe machine learning algorithms, a unique model-less recipe mode has been developed for 3D-NAND channel hole etch tilt measurement. “Not only are we be able to reduce time to solution from days to minutes, SpectraProbe measurements can be done in-die. Furthermore, our tilt measurement mode provides customers with the ability to discover excursions quickly and determine when process tools, such as etchers, require maintenance, generating a significant cost savings in preventative maintenance cycles and meaningful improvement in edge of wafer die yield,” said Adrian Wilson, vice president and general manager of the software & data analytics business unit at Nanometrics. SpectraProbe expands Nanometrics software process control metrology suite which includes model-based NanoDiffract OCD measurement and fleet management tools for the Atlas, IMPULSE and T3 family of metrology systems.  “We are engaged with multiple customers in advanced 3D-NAND development that are working to resolve new manufacturing challenges as they ramp their processes. SpectraProbe provides our customers with expanded analysis capabilities, reduced time to solution and new insights into process tool performance,” continued Wilson. “Our machine learning algorithms can stream process health in real-time to a user dashboard, a factory host or directly to the fab’s big data analytics system, providing customers with even more data and insight to control manufacturing processes”. For a review of SpectraProbe and the full suite of process control metrology solutions visit Nanometrics at SEMICON West July 11-13, Moscone Center, San Francisco, booth #5488 North hall. Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com. Forward Looking Statements Certain statements in this press release are forward-looking statements that involve a number of risks and uncertainties that could cause actual results to differ materially from those described in this release.  Although Nanometrics believes that the expectations reflected in the forward-looking statements are reasonable, actual results could differ materially from these expectations due to a variety of factors, including, but not limited to: failure of customers to adopt the new products; decreased levels of industry spending; Nanometrics’ inability to gain additional market share, increase sales, ship products as scheduled, achieve customer acceptance of new products or outperform the industry; decreased demand for Nanometrics’ products; shifts in the timing of customer orders and product shipments; technology adoption rates; changes in customer and product mix; changes in market share; changes in operating expenses; and general economic conditions. For additional information and considerations regarding the risks faced by Nanometrics that could cause actual results to differ materially, see its annual report on Form 10-K for the year ended December 31, 2016, as filed with the Securities and Exchange Commission on March 3, 2017 including under the caption “Risk Factors,” as well as other periodic reports filed with the SEC from time to time. Nanometrics disclaims any obligation to update information contained in any forward-looking statement, except as required by law.


News Article | May 24, 2017
Site: globenewswire.com

MILPITAS, Calif., May 24, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that its president and chief executive officer, Dr. Timothy J. Stultz, has notified the company of his plans to retire. The company has retained Spencer Stuart to identify a successor. Dr. Stultz will continue as CEO until his successor is named, assist with a seamless transition, and continue to serve as a director of the company. Since joining Nanometrics in 2007, Dr. Stultz led a successful turnaround of the company and a new era of market leadership, growth and outperformance within the semiconductor capital equipment industry. Dr. Stultz commented, “As I complete my 10th year at Nanometrics and look forward to my 70th birthday, I decided in consultation with the Board that now is the time to initiate the transition to new leadership of the company. Today, Nanometrics is one of the most relevant and enabling companies in the industry. Every major semiconductor manufacturer in the world depends on us for process control of their most advanced device types. Nanometrics is in a terrific position to identify a new CEO to lead its next phase of growth, and I look forward to continuing with the company during the transition period, and as a director.” Chairman Bruce C. Rhine said, “The Board extends its deep appreciation to Tim for his outstanding leadership during his tenure. Over the last ten years, Tim has built a world-class team that, under his leadership, established a leading market position in the industry, became a trusted partner solving difficult problems for its customers, and created substantial shareholder value. He developed a company culture of respect, hard work and integrity that represents a strong foundation for future growth. His leadership leaves us with a strong pipeline of new technologies and market opportunities, and we look forward to Tim’s continued leadership as we execute our succession plan, and appreciate his willingness to serve in an advisory capacity during the transition.” Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.


News Article | May 24, 2017
Site: globenewswire.com

MILPITAS, Calif., May 24, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that its president and chief executive officer, Dr. Timothy J. Stultz, has notified the company of his plans to retire. The company has retained Spencer Stuart to identify a successor. Dr. Stultz will continue as CEO until his successor is named, assist with a seamless transition, and continue to serve as a director of the company. Since joining Nanometrics in 2007, Dr. Stultz led a successful turnaround of the company and a new era of market leadership, growth and outperformance within the semiconductor capital equipment industry. Dr. Stultz commented, “As I complete my 10th year at Nanometrics and look forward to my 70th birthday, I decided in consultation with the Board that now is the time to initiate the transition to new leadership of the company. Today, Nanometrics is one of the most relevant and enabling companies in the industry. Every major semiconductor manufacturer in the world depends on us for process control of their most advanced device types. Nanometrics is in a terrific position to identify a new CEO to lead its next phase of growth, and I look forward to continuing with the company during the transition period, and as a director.” Chairman Bruce C. Rhine said, “The Board extends its deep appreciation to Tim for his outstanding leadership during his tenure. Over the last ten years, Tim has built a world-class team that, under his leadership, established a leading market position in the industry, became a trusted partner solving difficult problems for its customers, and created substantial shareholder value. He developed a company culture of respect, hard work and integrity that represents a strong foundation for future growth. His leadership leaves us with a strong pipeline of new technologies and market opportunities, and we look forward to Tim’s continued leadership as we execute our succession plan, and appreciate his willingness to serve in an advisory capacity during the transition.” Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.


News Article | May 24, 2017
Site: globenewswire.com

MILPITAS, Calif., May 24, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that its president and chief executive officer, Dr. Timothy J. Stultz, has notified the company of his plans to retire. The company has retained Spencer Stuart to identify a successor. Dr. Stultz will continue as CEO until his successor is named, assist with a seamless transition, and continue to serve as a director of the company. Since joining Nanometrics in 2007, Dr. Stultz led a successful turnaround of the company and a new era of market leadership, growth and outperformance within the semiconductor capital equipment industry. Dr. Stultz commented, “As I complete my 10th year at Nanometrics and look forward to my 70th birthday, I decided in consultation with the Board that now is the time to initiate the transition to new leadership of the company. Today, Nanometrics is one of the most relevant and enabling companies in the industry. Every major semiconductor manufacturer in the world depends on us for process control of their most advanced device types. Nanometrics is in a terrific position to identify a new CEO to lead its next phase of growth, and I look forward to continuing with the company during the transition period, and as a director.” Chairman Bruce C. Rhine said, “The Board extends its deep appreciation to Tim for his outstanding leadership during his tenure. Over the last ten years, Tim has built a world-class team that, under his leadership, established a leading market position in the industry, became a trusted partner solving difficult problems for its customers, and created substantial shareholder value. He developed a company culture of respect, hard work and integrity that represents a strong foundation for future growth. His leadership leaves us with a strong pipeline of new technologies and market opportunities, and we look forward to Tim’s continued leadership as we execute our succession plan, and appreciate his willingness to serve in an advisory capacity during the transition.” Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.


News Article | May 24, 2017
Site: globenewswire.com

MILPITAS, Calif., May 24, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that its president and chief executive officer, Dr. Timothy J. Stultz, has notified the company of his plans to retire. The company has retained Spencer Stuart to identify a successor. Dr. Stultz will continue as CEO until his successor is named, assist with a seamless transition, and continue to serve as a director of the company. Since joining Nanometrics in 2007, Dr. Stultz led a successful turnaround of the company and a new era of market leadership, growth and outperformance within the semiconductor capital equipment industry. Dr. Stultz commented, “As I complete my 10th year at Nanometrics and look forward to my 70th birthday, I decided in consultation with the Board that now is the time to initiate the transition to new leadership of the company. Today, Nanometrics is one of the most relevant and enabling companies in the industry. Every major semiconductor manufacturer in the world depends on us for process control of their most advanced device types. Nanometrics is in a terrific position to identify a new CEO to lead its next phase of growth, and I look forward to continuing with the company during the transition period, and as a director.” Chairman Bruce C. Rhine said, “The Board extends its deep appreciation to Tim for his outstanding leadership during his tenure. Over the last ten years, Tim has built a world-class team that, under his leadership, established a leading market position in the industry, became a trusted partner solving difficult problems for its customers, and created substantial shareholder value. He developed a company culture of respect, hard work and integrity that represents a strong foundation for future growth. His leadership leaves us with a strong pipeline of new technologies and market opportunities, and we look forward to Tim’s continued leadership as we execute our succession plan, and appreciate his willingness to serve in an advisory capacity during the transition.” Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.


News Article | June 26, 2017
Site: globenewswire.com

MILPITAS, Calif., June 26, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that company management will participate in the 9th Annual CEO Investor Summit 2017, taking place Wednesday, July 12th, in San Francisco, California. About The 9th Annual CEO Summit The CEO Summit is an accredited investor and publishing research analyst event held concurrently with SEMICON West and Intersolar 2017 in San Francisco.  The event is hosted by executive management from participating companies and will feature a “round-robin” format consisting of small group meetings, each 30 minutes in duration. During the event, investors and analysts will have the opportunity to meet with up to 10 of the 18 management teams during the 30-minute group meeting sessions, as well as opportunities to meet with additional management teams during the breakfast and lunch networking sessions. The 18 management teams collectively hosting the 2017 CEO Summit include: Aehr Test (AEHR), Axcelis (ACLS), BE Semiconductor Industries (BESI.AS), Brooks (BRKS), Cabot Micro (CCMP), Camtek (CAMT), Cohu (COHU), CyberOptics (CYBE), Electro Scientific (ESIO), FormFactor (FORM), Ichor Systems (ICHR), inTEST (INTT), Intevac (IVAC), Kulicke & Soffa (KLIC), Nanometrics (NANO), Rudolph (RTEC), Soitec (SOIT), and Ultra Clean Technology (UCTT). Sponsoring the networking luncheon is Cowen & Co. The CEO Investor Summit is by invitation only and is open to accredited investors and publishing research analysts.  As space is limited, please RSVP early. Hosts reserve the right to limit attendance as necessary. Last day for registration is July 7, 2017. While held concurrently with SEMICON West and Intersolar 2017, the event is not affiliated with the show. RSVP Contacts for 9th Annual CEO Summit 2017 To RSVP for the CEO Summit, please contact either of the Summit’s co-chairs. Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.

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