Moscow Institute of Electronic Technology

eng.miet.ru/
Zelenograd, Russia

National Research University Electronic Technology — is a Russian technical university in the field of microelectronics and one of 29 National Research Universities. University is founded in 1965 as Moscow Institute of Electronic Technology and located in Zelenograd, Moscow . The university was often considered the center of the Soviet Silicon Valley. Wikipedia.

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Agency: European Commission | Branch: FP7 | Program: CSA | Phase: ICT-2009.3.2 | Award Amount: 520.84K | Year: 2009

Russia is one of a few countries in the world to have in depth knowledge and capabilities spanning research, design and production of microelectronics and integrated circuits. Despite these strengths, there were no Russian semiconductor organisations participating in FP6 IST. Meanwhile, EU faces challenges in addressing the research priorities for semiconductor design methods and tools identified in the FP7 ICT WP and ENIAC SRA. This situation offers a favourable opportunity for strategic collaboration in semiconductor design between Russia and EU Consequently, the main aim of the SEMIDEC project is to increase cooperation in developing semiconductor design methods and tools between the two regions. SEMIDEC will achieve its overall aim via a range of activities implemented over 24 months: 1) Assessment of the semiconductor design collaboration potential. This involves mapping Russian semiconductor organisations involved in research relevant to the EUs priorities concerning semiconductor design methods, tools and standardisation. It also involves producing a Report on organisations and research on semiconductor design methods and tools in Russia; 2) Organisation of combined awareness-raising/training/networking events in Russia about semiconductor design calls from FP7 ICT WP. Inviting key EU semiconductor organisations to attend who are open to collaboration with Russian counterparts. Also, inviting Russian experts to attend key semiconductor events in EU and examining potential for Russia to participate in ENIAC. Also, producing a good practice guide to participation in FP7 semiconductor components/electronic system projects in Russian; and 3) Provide hands-on support services to competent Russian semiconductor organisations to build long-term relationships with key EU counterparts. Central to this will be i) support to joining EU consortia preparing FP7 ICT proposals and ii) support to Russian researchers to make secondments at EU organisations.


Plokhov D.I.,RAS A.M. Prokhorov General Physics Institute | Zvezdin A.K.,RAS A.M. Prokhorov General Physics Institute | Popov A.I.,Moscow Institute of Electronic Technology
Physical Review B - Condensed Matter and Materials Physics | Year: 2011

We study the quantum dynamics of polygonal rare-earth molecular clusters with Ising-type ion magnetization. It is shown that the ground state of such systems is a nonmagnetic quasidoublet of states with oppositely twisted ion spins. The states differ in the sign of the toroidal moment, a natural physical quantity characterizing the spin chirality of the clusters. The possibility of macroscopic quantum tunneling of the toroidal moment between the states is predicted. The effects of an external current are considered, both in equilibrium and in the framework of the Landau-Zener-Stückelberg tunneling model. Special treatment is given to the important case of triangular rare-earth clusters. © 2011 American Physical Society.


Basaev A.S.,Moscow Institute of Electronic Technology
Semiconductors | Year: 2012

The effect of the ferrocene concentration in a working gas mixture on carbon nanotube (CNT) growth by the CVD method is studied. It is shown that a change in the ferrocene concentration in a gas mixture has a significant effect on CNT growth. A decrease in the ferrocene concentration increases the melt's free energy and leads to the growth of smaller-diameter nanotubes with a lower number of walls, i. e., two or three. An increase in the ferrocene concentration above 1% leads to degradation of the quality of the growing nanotubes. © 2012 Pleiades Publishing, Ltd.


Lavrov I.V.,Moscow Institute of Electronic Technology
Semiconductors | Year: 2011

The effective conductivity tensor of a polycrystalline medium with a texture has been calculated based on the method of self-consistent solution and the theory of rotation group representations. The medium consists of a single-type of biaxial spherical crystallites, oriented in space according to some probabilistic law, which implies the existence of uniaxial texture. An analytical solution is obtained for two cases: (i) weakly anisotropic crystallites and (ii) a small spread in the orientations of one of the crystallite axes with respect to the texture axis. © 2011 Pleiades Publishing, Ltd.


Novak A.V.,Moscow Institute of Electronic Technology | Novak V.R.,Moscow Institute of Electronic Technology
Technical Physics Letters | Year: 2013

We have performed atomic-force-microscopy studies of the roughness and spatial and correlation properties of the surface for three typical LPCVD films of silicon: amorphous and polycrystalline films with a relatively smooth surface, as well as polycrystalline films with hemispherical grains (HSG-Si) having considerable surface roughness. As follows from analysis of the correlation function and power spectral density function, the model of a self-affine surface is suitable for describing morphology of amorphous and polycrystalline silicon films, while the model of a mounded surface is preferable for HSG-Si films. © 2013 Pleiades Publishing, Ltd.


Afonin S.M.,Moscow Institute of Electronic Technology
Russian Engineering Research | Year: 2012

The use of nano- and micro-scale piezomotors in precision electromechanical systems is considered. The deformation of the piezoconverter corresponding to its stress state is investigated. © 2012 Allerton Press, Inc.


Afonin S.M.,Moscow Institute of Electronic Technology
Russian Engineering Research | Year: 2016

A structural–parametric model of a piezo motor is formulated by solving the wave equation. The influence of geometric and physical parameters and external loads on its static and dynamic characteristics in the control system is studied. Transfer functions are derived for piezo motors used in nanodrives. The parametric structure of the piezo motor is determined and transformed. © 2016, Allerton Press, Inc.


Lapshin R.V.,Moscow Institute of Electronic Technology
Applied Surface Science | Year: 2016

A method of distributed calibration of a probe microscope scanner is suggested. The main idea consists in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby each point of the movement space of the scanner can be characterized by a unique set of scale factors. Feature-oriented scanning (FOS) methodology is used as a basis for implementation of the distributed calibration permitting to exclude in situ the negative influence of thermal drift, creep and hysteresis on the obtained results. Possessing the calibration database enables correcting in one procedure all the spatial systematic distortions caused by nonlinearity, nonorthogonality and spurious crosstalk couplings of the microscope scanner piezomanipulators. To provide high precision of spatial measurements in nanometer range, the calibration is carried out using natural standards - constants of crystal lattice. One of the useful modes of the developed calibration method is a virtual mode. In the virtual mode, instead of measurement of a real surface of the standard, the calibration program makes a surface image "measurement" of the standard, which was obtained earlier using conventional raster scanning. The application of the virtual mode permits simulation of the calibration process and detail analysis of raster distortions occurring in both conventional and counter surface scanning. Moreover, the mode allows to estimate the thermal drift and the creep velocities acting while surface scanning. Virtual calibration makes possible automatic characterization of a surface by the method of scanning probe microscopy (SPM). © 2016 Elsevier B.V. All rights reserved.


Lapshin R.V.,Moscow Institute of Electronic Technology
Applied Surface Science | Year: 2016

A description is given of a three-dimensional box-shaped graphene (BSG) nanostructure formed/uncovered by mechanical cleavage of highly oriented pyrolytic graphite (HOPG). The discovered nanostructure is a multilayer system of parallel hollow channels located along the surface and having quadrangular cross-section. The thickness of the channel walls/facets is approximately equal to 1 nm. The typical width of channel facets makes about 25 nm, the channel length is 390 nm and more. The investigation of the found nanostructure by means of a scanning tunneling microscope (STM) allows us to draw a conclusion that it is possible to make spatial constructions of graphene similar to the discovered one by mechanical compression, bending, splitting, and shifting graphite surface layers. The distinctive features of such constructions are the following: simplicity of the preparation method, small contact area between graphene planes and a substrate, large surface area, nanometer cross-sectional sizes of the channels, large aspect ratio. Potential fields of application include: ultra-sensitive detectors, high-performance catalytic cells, nanochannels for DNA manipulation, nanomechanical resonators, electron multiplication channels, high-capacity sorbents for hydrogen storage. © 2015 Elsevier B.V. All rights reserved.


Lapshin R.V.,Moscow Institute of Electronic Technology
Applied Surface Science | Year: 2015

The method of distributed calibration of a probe microscope scanner consists in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby each point of the movement space of the scanner can be defined by a unique set of scale factors. Feature-oriented scanning (FOS) methodology is used to implement the distributed calibration, which permits to exclude in situ the negative influence of thermal drift, creep and hysteresis on the obtained results. The sensitivity of LCCs to errors in determination of position coordinates of surface features forming the local calibration structure (LCS) is eliminated by performing multiple repeated measurements followed by building regression surfaces. There are no principle restrictions on the number of repeated LCS measurements. Possessing the calibration database enables correcting in one procedure all the spatial distortions caused by nonlinearity, nonorthogonality and spurious crosstalk couplings of the microscope scanner piezomanipulators. To provide high precision of spatial measurements in nanometer range, the calibration is carried out using natural standards - constants of crystal lattice. The method may be used with any scanning probe instrument. © 2015 Elsevier B.V. All rights reserved.

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