Bosisio Parini, Italy
Bosisio Parini, Italy

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Capuano G.,TSD Space | Longobardi P.,TSD Space | Formicola G.,TSD Space | Rossi M.,Media Lario Technologies | Bianucci G.,Media Lario Technologies
Proceedings of the International Astronautical Congress, IAC | Year: 2016

The growing interest in multispectral space imaging applications, at the same using small satellite platforms, poses very strict and challenging requirements for the optical payloads. In the frame of an ESA technology development program, aimed at addressing the growing small satellite market for Earth observation, an innovative mid-to-high resolution multispectral optical payload, named STREEGO, is under developing by Media Lario Technologies as prime, and Techno Systems Developments (TSD) for the Focal Plane Assembly (FPA) and Camera Electronics. STREEGO is characterized by a compact envelope (320 × 600 × 600 mm3), reduced mass (<20kg.), and competitive cost. The optical design is based on a Three Mirror Anastigmatic (TMA) configuration, which adopts a 12Mpixel large two-dimensional CMOS sensor, in order to provide, at a nominal altitude of 600 km, a Swath of 11.3 km, a Ground Sampling Distance (GSD) of 2.75 m for panchromatic images and 5.5 m for multispectral images. In this paper, we describe in details the very innovative, compact, low power and high performance Camera Electronics that TSD has developed specifically for the STREEGO Payload. The original design solution allows the integration of all the electronics directly on the Telescope structure, thus avoiding the need of external electronic units and minimizing the overall Payload SWAP (Size, Weight and Power). The high performance architecture, adopts a powerful XQR5XVFX130 FPGA System-On-Chip (SOC), high speed memory chipset and data links, and provides a complete and extended set of functionalities as: detector configuration and control/synchronization, image data acquisition, re-assembly pre-processing, compression and additional on board data reduction techniques, aimed at overcoming the data downlink limitations of small satellites. The Camera Electronics consists of two sections, electrically interconnected by means of flexible PCBs: the detector proximity electronics section, located into the FPA, and the main electronics section integrated on the telescope structure, but thermally decoupled from it. The form factor of the main electronics, specifically designed for STREEGO, and its compact volume of only 262 × 216 × 25 mm3 have a minimum impact on the overall payload envelope and the power consumption and mass of the entire camera electronics are respectively 17W and 1.5kg, thus resulting compatible also with very small satellite platform. The expected throughput is 180Mpixel/s at 10bit/pixel and 132Mpixel/s at 12bit/pixel. The FPA has been already integrated into the telescope and successfully tested, while the integration and testing of the camera electronics are foreseen within Q1 of 2016.


Sironi G.,National institute for astrophysics | Citterio O.,National institute for astrophysics | Pareschi G.,National institute for astrophysics | Negri B.,Italian Space Agency | And 7 more authors.
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2011

This paper presents the huge advance in metrology represented by a new free-form profilometer, the Profilometer/Rotondimeter (MPR-700). The MPR-700 is a 3D metrological machine capable to measure quasicylindrical and free-form normal incidence optics maintaining the 2D measuring error below 40 nm at 2σ up to a length of 700 mm. The key to success of MPR is its innovative detection system design that boasts remarkable advantages in the positioning error reduction and to the instantaneous subtraction of the dynamical error. These characteristics make the MPR extremely precise and accurate, insomuch that measurements can be acquired in flight at high speed maintaining the measuring performances. The main advantage of the MPR design is the capability to couple the measuring quality offered by one-dimensional profilometer to the opportunity to the three-dimensional motion of a 3D machines. Here we present the MPR design and the results obtained on single profiles measurements and 3D shape reconstruction for optics of different geometry. © 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).


Rituccia A.,Media Lario Technologies | Rossia M.,Media Lario Technologies
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2013

A vertical Long Trace Profiler (LTP) has been developed to characterize profile slope and figure error of grazing incidence aspherical X-ray mirrors with short radius of curvature (1 m - 5 m) and length up to 300 mm while achieving more than 100 mrad-level dynamical range and acceptable value of measurement accuracy (< 10 μrad). The increase of the dynamical range is obtained by separating the optical path delivering the probe beam to the test surface from the light path reflected by the sample, and by using a movable collecting mirror to redirect it towards the detector. Experimental data acquired through the developed prototype on X-ray optics are compared with the profiles measured on the same samples through a more complex profiler (called MPR700) based on a high resolution distance measuring sensor, laser interferometers and precise optical flats. The comparison between the two devices demonstrates the functionality of the proposed LTP scheme and shows the possibility to extend the field of applications of the LTPs avoiding the need of more expensive measuring devices based on distance measuring sensors and optical references. © 2013 SPIE.


Gonte F.,European Southern Observatory | Mazzoleni R.,Media Lario Technologies | Surdej I.,European Southern Observatory | Noethe L.,European Southern Observatory
Applied Optics | Year: 2011

New optical phasing sensor technologies have been studied with a test bench experiment, called Active Phasing Experiment, on-sky at the European Southern Observatory Very Large Telescope. One of the sensors was of the Shack-Hartmann type using cylindrical lenslets across the segment borders for the measurement of the phasing errors. With bright stars, the precision of the measurement of piston steps at a single border was better than 9nm wavefront RMS, and the precision of the closed-loop correction of the piston errors of the segments across the whole mirror was better than 10nmwavefrontRMS. With dimmer stars of magnitude up to 14.5, precisions of the order of 22nm wavefront RMS were obtained. © 2011 Optical Society of America.


Bianucci G.,Media Lario Technologies | Cassol G.L.,Media Lario Technologies | Ceglio N.M.,CA Technologies | Valsecchi G.,Media Lario Technologies | Zocchi F.,Media Lario Technologies
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2012

Media Lario Technologies (MLT) uses its proprietary replication by electroforming technology to manufacture grazing incidence collectors in support of the EUVL technology roadmap. With the experience of more than 20 alpha and preproduction collectors installed to date, and with the development results of the Advanced Cooling Architecture (ACA) for High Volume Manufacturing (HVM) collector generation, we present optical, lifetime, and thermo-optical performance of the grazing incidence collectors, meeting the requirements of HVM scanners for a throughput target of more than 100 wafers per hour. The ruthenium reflective layer of the grazing incidence collector is very forgiving to the hostile environment of the plasma sources, as proven by the installed base with 1-year lifetime expectancy. On the contrary, the multilayer-based collector is vulnerable to Sn deposition and ion bombardment, and the need to mitigate this issue has led to a steady increase of the complexity of the LPP source architecture. With the awareness that the source and collector module is the major risk against the timely adoption of EUVL in HVM, we propose a new paradigm that, by using the field-proven design simplicity and robustness of the grazing incidence collector in both LDP and LPP sources, effectively reduces the risk of both source architectures and improves their reliability. © 2012 SPIE.


Bianucci G.,Media Lario Technologies | Bragheri A.,Media Lario Technologies | Cassol G.L.,Media Lario Technologies | Johnson B.,Media Lario Technologies | And 2 more authors.
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2010

Media Lario Technologies (MLT), leveraging off its unique in-field collector experience, has designed the Grazing Incidence Collector (GIC) for the Sn-fueled Discharge Produced Plasma (DPP) source developed by Philips Extreme UV (PEUV) and XTREME technologies (XT) for High Volume Manufacturing (HVM) deployment. The performance of the HVM GIC described in this work shows a point-source collection efficiency of 24%, and is enabled by an integrated thermal control system designed to ensure optical stability for an absorbed thermal load of 6 kW. The GIC reflective layer has been custom tailored to match the debris mitigation strategy developed and characterized by PEUV and XT, supporting at least a 1-year lifetime proposition of the source-collector module. Leveraging off the experience gained in GIC, MLT is developing the processes to manufacture the Normal Incidence Collector (NIC) for Laser Produced Plasma (LPP) sources. Using its proprietary disruptive replication technology by electroforming, MLT is developing thermal management designs for NIC enabling stable operation at room temperature. This work reports on the performance of (symbol) 150 mm thermally managed NIC demonstrators. The mirror substrates have been integrated with new proprietary thermal management designs that are well suited to the electroformed mirrors. We also report on the reflectivity of the Mo/Si multilayer coated mirror, achieving maximum reflectivity values of 62% and a center wavelength (FWHM) of 13.52 nm, which demonstrates acceptable performance in an LPP NIC application. © 2010 Copyright SPIE - The International Society for Optical Engineering.


Sironi G.,National institute for astrophysics | Sironi G.,University of Insubria | Spiga D.,National institute for astrophysics | Raimondi L.,National institute for astrophysics | And 5 more authors.
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2010

Mandrel replication by NiCo electroforming is an upgrade of the well-suited X-ray mirrors manufacturing process with pure Nickel. In this process, a Gold layer deposited on the mandrel acts as release agent and, at the same time, as reflective coating. To increase the optical performances of X-ray mirrors, the replicated optical surface is meant to reproduce the smooth topography of the mandrel: a surface degradation is commonly observed, indeed. A factor leading to surface smoothness worsening can be the spontaneous roughness growth of the Gold layer itself; therefore, the optical quality of the reflecting surface might be improved by optimizing the Gold layer thickness. A preliminary study, aimed at investigating the effects of Gold thickness reduction (< 100 nm Vs. the usual 200 nm), had already been dealt in the spectral range 0.02-1000 μm: measurements performed on flat electroformed samples showed that the Gold thickness reduction chiefly affects the roughness around 1 μm. Here we presents a study of the effectiveness of a Gold layer with reduced (< 100 nm) thickness in the NiCo X-ray mirrors electroforming, aimed at surface micro-roughness mitigation. The characterization, in the spectral range 0.02-1000 μm, of 3 X-ray mirrors manufactured utilizing Gold layers with different thickness values from a flight mandrel is reported. The performed investigation is organized as follows: (a) characterization of the flight mandrel; (b) dependence of the micro-roughness from different Gold layers thicknesses supported by XRD study; (c) comparison of the micro-roughness of mirrors manufactured in NiCo in Ni, with the same Gold layer thickness. As a conclusive remark the effects of the Gold layer thinning on the angular degradation at high energy are reported. © 2010 SPIE.


Vernani D.,Media Lario Technologies
Proceedings of the 12th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2012 | Year: 2012

Focusing mirrors manufactured via galvanic replication process from negative shape mandrels is the selected solution for the approved X-ray astronomy mission eROSITA and the candidate solution for some of the next future X-ray astronomy missions. Media Lario Technologies (MLT) is the industrial enabler for manufacturing (in collaboration with the Max Planck Institute (MPE) and the German Space Agency (DLR)) of the Optical Payload for eROSITA - including the flight quality mandrels. Media Lario Technologies (MLT) is also now developing, in collaboration with Brera Astronomical Observatory (INAF/OAB), the Optical Payload for the New Hard X-ray Mission (NHXM). For the eROSITA mandrels production an evolution of the approach used for the manufacturing of past mission mandrels (JET-X, XMM) have been developed. The low energy angular resolution of the eROSITA mirror payload needs to be 15 arcsec HEW or better; and at 8.05keV the angular resolution needs to be 20 arcsec HEW or better. Replicated mirrors with performance in this range for the low energy radiation have been obtained in the past by using mandrels that have superior geometrical shape accuracy. A proprietary multistep surface finishing process has now been developed for reaching the aggressive performance requirements demanded by the mission. The status of the eROSITA series mandrels manufactured so far, by using the advanced polishing process, are presented. In the paper, the x-ray performance of mirror shells (as measured at MPE PANTER facility) replicated from a flight quality eROSITA mandrel, are reported.


Bianucci G.,Media Lario Technologies | Bragheri A.,Media Lario Technologies | Cassol G.L.,Media Lario Technologies | Ghislanzoni R.,Media Lario Technologies | And 2 more authors.
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2011

Media Lario Technologies (MLT) has enabled the Extreme Ultraviolet Lithography (EUVL) roadmap with its grazing incidence collectors installed in all DPP sources since 2006. Furthermore, with several 100 WIF capable production grazing incidence collectors shipped in 2010, MLT is ready to support the start of High Volume Manufacturing (HVM). With a point-source collection efficiency of 25% and 6 kW power loading capability, the 9-shell collector design is capable of delivering 100 W in-band EUV power through the intermediate focus aperture. The customized reflective layer and the debris mitigation technology enable the 1-year lifetime objective under full production operating conditions. Integration of the grazing incidence collector in XTREME technologies' (XT) DPP source attached to ASML's NXE:3100 scanner has provided initial validation of the optical, thermal, and lifetime design objectives. In full HVM regime, we anticipate that the collector power loading will progressively reach 20 kW to enable 500 W inband EUV peak power at intermediate focus. We have started the development of a thermal management design maintaining the current optical stability with a collector power loading of 30 kW, thus meeting the aggressive HVM requirements. © 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).


Vernani D.,Media Lario Technologies
Proceedings of the 11th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2011 | Year: 2011

Focusing mirrors manufactured via a galvanic replication process from negative shape mandrels are the selected solution for the eROSITA x-ray astronomy mission and the candidate solution for some of future x-ray missions. Media Lario Technologies (MLT) is the industrial entity manufacturing, in collaboration with Max Planck Institute (MPE), the Optical Payload for eROSITA. Media Lario Technologies (MLT) is now developing, in collaboration with Brera Astronomical Observatory (INAF/OAB), the Optical Payload for the New Hard X-ray Mission (NHXM). Media Lario Technologies (MLT) has adapted its proprietary manufacturing technology for space applications to successfully develop and manufacture grazing incidence collectors for XTREME Technologies' (XT) Sn-fueled DPP source, enabling the Extreme Ultraviolet Lithography (EUVL) roadmap. The current and ongoing development/manufacturing activities in Media Lario Technologies complement the electroforming technology with a suite of critical manufacturing and assembly of the optical systems: mandrels manufacturing, mirror shell replication, single/multi-layer coating deposition and mirror integration.

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