Macronix International Co. | Date: 2017-01-11
A stacked non-volatile memory device (100) comprises a plurality of bitline (110) and wordline (120) layers stacked on top of each other. The bitline (110) layers comprise a plurality of bitlines that can be formed using advanced processing techniques making fabrication of the device efficient and cost effective. The device can be configured for NAND operation.
Macronix International Co. | Date: 2016-12-22
Counting status circuits are electrically coupled to corresponding status elements. The status elements selectably store a bit status of a bit line coupled to a memory array. The bit status can indicate one of at least pass and fail. The counting status circuits are electrically coupled to each other in a sequential order. Control logic causes processing of the counting status circuits in the sequential order to determine a total of the memory elements that store the bit status. The total number of memory elements that store the bit status indicate the number of error bits or non-error bits, which can help determine whether there are too many errors to be fixed by error correction codes.
Macronix International Co. | Date: 2016-07-20
A memory system has a plurality of memory devices coupled with a hub in discrete and shared port arrangements. A plurality of bus lines connect the plurality of memory devices to the hub, including a first subset of bus lines connected in a point-to-point configuration between the hub and a particular memory device, and a second subset of bus lines connected to all the memory devices in the plurality of memory devices including the particular memory device. Bus operation logic is configured to use the first subset of bus lines in a first operation accessing the particular memory device while simultaneously using the second subset of bus lines in a second operation accessing a different selected memory device of the plurality of memory devices.
Macronix International Co. | Date: 2016-01-14
A method and a device for performing a polar codes channel-aware procedure are provided. A plurality of bit-channels have a polar code construction which is dynamic. The method includes the following steps. A plurality of reliability indices of some of the bit-channels are ranked. Whether an updating condition is satisfied is determined according to a ranking sequence of the reliability indices. If the updating condition is satisfied, the polar code construction is updated according to the ranking sequence of the reliability indices.
Macronix International Co. | Date: 2015-11-04
Provided are improved semiconductor memory devices and methods for manufacturing such semiconductor memory devices. The methods may include two or more nitride removal steps during formation of gate layers in vertical memory cells. The two or more nitride removal steps may allow for wider gate layers increasing the gate fill-in, reducing the occurrence of voids, and thereby improving the word line resistance.
Macronix International Co. | Date: 2015-10-02
A method, apparatus and computer program product are provided in order to test word line failure of a non-volatile memory device. An example of the method includes performing a failure screening of the non-volatile memory device, wherein the non-volatile memory device comprises one or more word lines; identifying a point of failure located between a first word line and a second word line; and marking the first word line and the second word line as a single word line in response to identifying the point of failure between the first word line and the second word line.
Macronix International Co. | Date: 2015-10-22
A 3D semiconductor memory device includes a semiconductor substrate, a source line, a gate line and a plurality of memory cells connected in series. The semiconductor substrate has a protruding portion. The source line is disposed in the semiconductor substrate and partially extending below the protruding portion. The gate line is configured to surround and cover the protruding portion and electrically separated from the source line and the protruding portion. The memory cells are disposed on the semiconductor substrate and connected in series to the protruding portion at a top surface thereof.
Macronix International Co. | Date: 2016-07-18
An erasing method and a memory device are provided. The memory device includes a plurality of memory blocks. Each of the memory blocks has n sub-blocks. The erasing method includes the following steps. A first erase region is selected from a first memory block of the memory blocks, and the first erase region includes at least one sub-block. A sub-block erase operation is performed on the first erase region of the first memory block.
Macronix International Co. | Date: 2016-07-12
A method to operate a single bit per cell memory comprises erasing a group of memory cells establishing a first logical value by setting threshold voltages in a first range of threshold voltages. First writing, after said erasing, includes programming first selected memory cells to establish a second logical value by setting threshold voltages in a second range of threshold voltages, and saving a sensing state parameter to indicate a first read voltage. Second writing, after said first writing, includes programming second selected memory cells to establish the second logical value by setting threshold voltages in a third range of threshold voltages, and saving the sensing state parameter to indicate a second read voltage. After a number of writings including said first writing and said second writing reaches a threshold number for writing the group of memory cells, the group of memory cells can be erased.
Macronix International Co. | Date: 2016-04-08
A data allocating method includes steps of: determining whether data to be written into a physical memory block is hot data or cold data; when the data is hot data, according to a hot data allocating order, searching at least one first empty sub-block from the physical memory block to allocate the data; when the data is cold data, according to a cold data allocating order, searching at least one second empty sub-block from the physical memory block to allocate the data.