LeCroy Corporation | Date: 2012-03-06
A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger configuration to a second trigger element of the test and measurement apparatus so that these trigger elements operate substantially simultaneously, It is then determined whether the input signal generates a trigger in accordance with the one or more trigger configurations.
LeCroy Corporation | Date: 2010-11-08
A physically rotatable display for a test and measurement apparatus is provided. The display of instrument information and data is automatically reconfigured based on the user selected orientation to provide optimal data display
LeCroy Corporation | Date: 2011-01-26
A system for estimating bit error rates (BER) may include using a normalization factor that scales a BER to substantially normalize a Q-scale for a distribution under analysis. A normalization factor may be selected, for example, to provide a best linear fit for both right and left sides of a cumulative distribution function (CDF). In some examples, the normalized Q-scale algorithm may identify means and probabilistic amplitude(s) of Gaussian jitter contributors in the dominant extreme behavior on both sides of the distribution. For such contributors, means may be obtained from intercepts of both sides of the CDF(Qnorm(BER) with the Q(BER)=0 axis, standard deviations (sigmas) may be obtained from reciprocals of slopes of best linear fits, and amplitudes may be obtained directly from the normalization factors. In an illustrative example, a normalized Q-scale algorithm may be used to accurately predict bit error rates for sampled repeating or non-repeating data patterns.
LeCroy Corporation | Date: 2011-01-31
A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.
LeCroy Corporation | Date: 2012-04-04
A method is provided which measures PCB trace characteristics from measurements of a PCB trace structure.