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LeCroy Corporation

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Spring Valley, NY, United States
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Patent
LeCroy Corporation | Date: 2012-04-04

A method is provided which measures PCB trace characteristics from measurements of a PCB trace structure.


Patent
LeCroy Corporation | Date: 2011-01-31

A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.


Patent
LeCroy Corporation | Date: 2011-01-31

An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.


A method for improving bandwidth of an oscilloscope involves, in preferred embodiments, the use of frequency up-conversion and down-conversion techniques. In an illustrative embodiment the technique involves separating an input signal into a high frequency content and a low frequency content, down-converting the high frequency content in the analog domain so that it may be processed by the oscilloscopes analog front end, digitizing the low frequency content and the down-converted high frequency content, and forming a digital representation of the received analog signal from the digitized low frequency content and high frequency content.


Patent
LeCroy Corporation | Date: 2010-09-23

A system and method for performing a time domain reflectometry measurement. The system includes a coherent interleaved sampling timebase, a sampling strobe generator for generating one or more sampling strobes in accordance with the coherent interleaved sampling timebase, a time domain reflectometry sampling strobe generator for generating one or more time domain reflectometry strobes in accordance with one or more of the generated sampling strobes; and a sampling module for sampling a time domain reflectometry signal in accordance with one or more of the one or more generated sampling strobes and one or more of the one or more generated time domain reflectometry strobes. The system further includes an analog to digital converter for analog to digital converting the samples of the time domain reflectometry signal and a memory for storing the converted samples of the time domain reflectometry signal.


Patent
LeCroy Corporation | Date: 2011-09-27

A complex acquisition system and method for synchronizing components thereof. The complex acquisition system further including a master acquisition module. The master acquisition module further including an analog to digital acquisition signal generator for generating an analog to digital acquisition signal, a memory acquisition signal generator for generating a memory acquisition signal, a delay calibration signal for generating a delay calibration signal, a step source signal generator for generating a step source signal, and a synchronization module. The complex acquisition system further includes a plurality of slave acquisition modules, each also including a synchronization module. The complex acquisition system additionally includes a distribution system for distributing each of the analog to digital acquisition signal, memory acquisition signal, delay calibration signal and step source signal to each of the synchronization modules in the master and plurality of slave acquisition modules.


Patent
LeCroy Corporation | Date: 2012-03-06

A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger configuration to a second trigger element of the test and measurement apparatus so that these trigger elements operate substantially simultaneously, It is then determined whether the input signal generates a trigger in accordance with the one or more trigger configurations.


Patent
LeCroy Corporation | Date: 2010-11-08

A physically rotatable display for a test and measurement apparatus is provided. The display of instrument information and data is automatically reconfigured based on the user selected orientation to provide optimal data display


Patent
LeCroy Corporation | Date: 2011-01-26

A system for estimating bit error rates (BER) may include using a normalization factor that scales a BER to substantially normalize a Q-scale for a distribution under analysis. A normalization factor may be selected, for example, to provide a best linear fit for both right and left sides of a cumulative distribution function (CDF). In some examples, the normalized Q-scale algorithm may identify means and probabilistic amplitude(s) of Gaussian jitter contributors in the dominant extreme behavior on both sides of the distribution. For such contributors, means may be obtained from intercepts of both sides of the CDF(Qnorm(BER) with the Q(BER)=0 axis, standard deviations (sigmas) may be obtained from reciprocals of slopes of best linear fits, and amplitudes may be obtained directly from the normalization factors. In an illustrative example, a normalized Q-scale algorithm may be used to accurately predict bit error rates for sampled repeating or non-repeating data patterns.


Patent
LeCroy Corporation | Date: 2011-06-20

A method is provided for de-embedding fixtures and/or probes from measurements of devices where probes and fixtures are connected between the ports of a network analysis instrument and a device-under-test.

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