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Gonzalez-Jorge H.,University of Vigo | Alvarez-Valado V.,Laboratorio Oficial Of Metroloxia Of Galicia | Valencia J.L.,Laboratorio Oficial Of Metroloxia Of Galicia | Torres S.,Laboratorio Oficial Of Metroloxia Of Galicia
Sensors | Year: 2010

Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry. Measurements are made using a portable atomic force microscope on the CNC diamond cutting machine where an initial sample of transparent conductive oxide is cut into four pieces. The method is validated by making a comparison between the parameters obtained in this process and in the laboratory under optimal conditions. Areal roughness parameters and Fourier Spectral Analysis of the data show good compatibility and open the possibility to use this type of measurement instrument to perform in situ quality control. This procedure gives a sample for evaluation without destroying any of the transparent conductive oxide; in this way 100% of the production can be tested, so improving the measurement time and rate of production. © 2010 by the authors. Source


Diz-Bugarin J.,University of Vigo | Dorrio B.V.,University of Vigo | Blanco J.,University of Vigo | Miranda M.,University of Vigo | And 2 more authors.
Optical Engineering | Year: 2013

We have developed an interferometer for gauge block calibration based on phase shifting algorithms. The measurement process can provide flatness, parallelism, and length. Wavelength values need to be corrected according to the refractive index of air. This correction is obtained indirectly using Edlén's equation. High-resolution sensors provide the temperature, pressure, and relative humidity readings. To preserve stability, the interferometer is encapsulated in a chamber with active temperature control. Its design, measurement principle, calibration, stability, and reproducibility are analyzed. Since one goal is to employ robust and cheap diode lasers as light sources, we describe the system developed to stabilize a red laser diode using a mode locking technique with a reference gas cell. The instruments and assembly are used to avoid the Doppler effect in the gas cell, which would limit wavelength resolution. Several experiments are carried out to restrict the influence of environmental changes, which affect laser diode frequency. © 2013 Society of Photo-Optical Instrumentation Engineers (SPIE). Source


Diz-Bugarin J.,University of Vigo | Outumuro-Gonzalez I.,Laboratorio Oficial Of Metroloxia Of Galicia | Vazquez-Dorrio J.B.,University of Vigo | Valencia-Alvarez J.L.,Laboratorio Oficial Of Metroloxia Of Galicia | Blanco-Garcia J.,University of Vigo
IEEE Transactions on Instrumentation and Measurement | Year: 2016

This paper presents a new electronic Vernier fringe counter for the wavelength measurement of a diode laser in a scanning interferometer. The system is intended to be a low cost alternative to commercial systems used for gauge block calibration. The counter stage and phase coincidence detector are made with a microcontroller and high-speed CMOS logic to achieve the required resolution. The microcontroller also can synchronize with other elements to make a fully automated measurement system. This electronic design improves the resolution of the electronic counters in the previous designs. © 2015 IEEE. Source

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