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Ithaca, NY, United States

Chong J.M.,Kionix Inc.
28th International Technical Meeting of the Satellite Division of the Institute of Navigation, ION GNSS 2015 | Year: 2015

This talk with give a brief historical perspective on MEMS sensors used for navigation, examining performance trends and the state of the current offerings on the market. Design targets and market demands for sensors in mobiles phones will be compared to those targeted specifically for navigation. Finally, the development of a low power, low noise 9-axis solution will be discussed. Source

Techniques are described herein that perform capacitance-based pressure sensing using pressure vessel(s). A pressure vessel is an object that has a cross section that defines a void. The void has a shape that is configured to change based on a change of pressure difference between a cavity pressure in a cavity in which at least a portion of the pressure vessel is suspended and a vessel pressure in the pressure vessel. The pressure vessel may be formed in the shape of an enclosed loop (e.g., along a path that is perpendicular to the cross section), resulting in a looped pressure vessel. For instance, an end of the pressure vessel may be connected to another end of the pressure vessel to form the enclosed loop.

Kionix Inc. | Date: 2013-03-15

A method for calibrating an accelerometer of an electronic device to reduce an error of the accelerometer includes estimating a gravity vector using the accelerometer and a magnetic field vector using a magnetometer at a plurality of times. The method also includes calculating a characteristic that is a function of an angle between the estimated gravity vector and the estimated magnetic field at each of the plurality of times. Additionally, the method includes calculating a figure of merit over the plurality of times that is a function of the characteristic. The method includes dynamically adjusting a calibration parameter of the accelerometer during ordinary use of the electronic device such that the figure of merit is minimized. Adjusting the calibration parameter reduces the error of the accelerometer. A system can include a accelerometer, a magnetometer, a processor, and a memory having instructions to execute the calibration method on the processor.

Kionix Inc. | Date: 2012-08-10

A micro-electromechanical system (MEMS) device can include a substrate and a first beam suspended relative to a substrate surface. The first beam can include a first portion and a second portion that are separated by an isolation joint made of an insulative material. The first and second portions can each include a first semiconductor and a first dielectric layer. The MEMS device can also include a second beam suspended relative to the substrate surface. The second beam can include a second semiconductor and a second dielectric layer to promote curvature of the second beam. The MEMS device can also include a third beam suspended relative to the substrate surface. The third beam consists essentially of a first material. The second beam is configured to move relative to the third beam in response to an acceleration along an axis perpendicular to the surface of the substrate.

Kionix Inc. | Date: 2013-03-04

A calibration unit, system, and method for calibrating a device under test are provided. The calibration unit, system, and method use a single axis rotational unit to calibrate devices under test on a test head. The single axis rotation unit is configured to extend at an angle from a known axis. The test head can be designed in the shape of a frustum with multiple sides. The calibration unit, system, and method can use combinations of gravitational excitation, Helmholtz coil excitation, and rotational rate excitation for calibrating the device under test. The calibration unit, system, and method can calibrate a 3 degree for freedom or higher MEMS devices.

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