Cleveland, OH, United States
Cleveland, OH, United States

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Patent
Keithley Instruments Inc. | Date: 2016-05-18

A method for producing sampled data, which as the requested sampling period is increased, each sample is the average of an increasing number of ADC samples such that a maximum number of ADC samples are evenly space across the sample period. The method can include choosing one of multiple ADC with varying speed versus resolution capabilities to further increase the quality of the sampled data as the sampling period increases.


Patent
Keithley Instruments Inc. | Date: 2016-06-22

A method for calibrating a test instrument having an initial output voltage level and an open output relay can include programming the test instrument for a certain current level, starting a timer, and stopping the timer (responsive to the test instrument entering compliance) to determine a time interval. The method can also include determining whether the time interval is within a desired range.


Patent
Keithley Instruments Inc. | Date: 2016-05-18

A switching power supply can include multiple power MOSFETs that receive an initial gate drive waveform comprising a fast slew rate region having a negative slope and a slow slew rate region also having a negative slope. The MOSFETs can turn off during the slow slew rate region of the initial gate drive waveform.


Patent
Keithley Instruments Inc. | Date: 2016-02-04

A connection interface for connecting one or more devices under test (DUTs) to one or more remote test and measurement instruments includes a device-under-test connector for connecting a DUT to the interface, a host-instrument connector for connecting the interface to a host test and measurement instrument, and an electrical path between the device-under-test connector and the host-instrument connector. The connection interface also includes a display that has a first portion visually associated with the device-under-test connector and configured to display an identifier for a particular connection point on the DUT. In some embodiments, the first portion of the display is configured to display measurement data from the particular connection point on the DUT. In some embodiments, the display has a second portion that is configured to display information related to the host test and measurement instrument, or to display a name for a particular measurement of the DUT.


Patent
Keithley Instruments Inc. | Date: 2016-05-25

A method in an electronic device that may include determining, with a processor, a quantity of group markers in a data set, and determining, with the processor and based on the quantity of group markers, a suggested view from a plurality of available views, each view in the plurality of available views diagrammatically depicting at least a portion of the data set. Also, a processor-implemented method of navigating between portions of a data set may include displaying, on a touchscreen display, a diagrammatical depiction of a first portion of the data set; detecting a continuous arc gesture at the touchscreen display; determining a direction of the arc gesture; selecting a second portion of the data set based on the determined direction of the arc gesture; and displaying a diagrammatical depiction of the second portion of the data set.


Patent
Keithley Instruments Inc. | Date: 2016-04-27

A method of magnetization balancing for a switching power supply having at least two MOSFETs can include measuring first and second commutation times, adjusting the timing of the on time (pulse width) of the first MOSFETs gate relative to the on time (pulse width) of the second MOSFETs gate, and determining whether the commutation times are equal.


Patent
Keithley Instruments Inc. | Date: 2016-03-30

Embodiments of the present invention provide a two-cable connection system (105) for connecting electrical test instrumentation (100) to a device under test (DUT, 130). In one embodiment, a single pair of equal-length triaxial cables (110,120) each has a desired characteristic impedance. Each cable has a center conductor (110c,120c), intermediate conductor (110b,120b), and outer conductor (110a,120a). The proximal end of each cable is connected to the test instrumentation, and the distal ends are located at the DUT. At the distal end, the center conductors are connected to the DUT, the intermediate conductors are allowed to float, and the outer conductors are connected to each other. The proximal end of each cable is connected to the device using an appropriate connection for the test that will be performed. This allows the test instrumentation to perform different types of tests without changing connections to the DUT.


Patent
Keithley Instruments Inc. | Date: 2016-06-01

A voltage clamp circuit (200) which operates using a voltage controlled current source (I0) where the change of the polarity of the voltage controlled current source controls whether it is clamping or not. While clamping, the stability of the control loop uses the capacitance of the output (C1) to create and single pole roll-off of the loop gain and while not clamping, uses the capacitance (C2) of the circuit which sets the clamping voltage to produce the roll-off. The circuit operates in a linear fashion both while clamping and not clamping, which allows for a faster response when clamping is needed.


Patent
Keithley Instruments Inc. | Date: 2015-09-23

Bias tees, according to certain embodiments of the present invention, include switches (645, 650) in the AC signal path, the DC signal path, or both, to improve the capability of the bias tees to be used for high impedance AC measurement, low current DC measurement, or both. Optical control (670, 675) of the switches, as well as control of the switches using a DC bias present within the AC signal input to the bias tee, is described. Including a set of diodes into the DC signal path, rather than a switch, provides enhanced capability of the bias tee to be used for high impedance AC measurements.


Patent
Keithley Instruments Inc. | Date: 2016-08-17

A connection interface for connecting one or more devices under test (DUTs) to one or more remote test and measurement instruments includes a device-under-test connector for connecting a DUT to the interface, a host-instrument connector for connecting the interface to a host test and measurement instrument, and an electrical path between the device-under-test connector and the host-instrument connector. The connection interface also includes a display that has a first portion visually associated with the device-under-test connector and configured to display an identifier for a particular connection point on the DUT. In some embodiments, the first portion of the display is configured to display measurement data from the particular connection point on the DUT. In some embodiments, the display has a second portion that is configured to display information related to the host test and measurement instrument, or to display a name for a particular measurement of the DUT.

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