Jeong Y.,Japan Advanced Institute of Science and Technology |
Hirade M.,Japan Advanced Institute of Science and Technology |
Hirade M.,Shimadzu Corporation |
Kokawa R.,JST Advanced Measurement and Analysis |
And 11 more authors.
Current Applied Physics | Year: 2012
Local interaction imaging of cleaved InAs surface (110) using a high aspect ratio (HAR) SiGe quantum dot (QD) probe was demonstrated by frequency-modulation mode noncontact atomic force microscopy under atmospheric pressure. The local contrast image with pronounced brightness is mainly attributed to no contact potential difference between the HAR SiGe-QD probe apex and the sample surface, and low frequency-change of the HAR SiGe-QD probe. © 2011 Elsevier B.V. All rights reserved.