Jpk Instruments Ag

Jpk Instruments Ag


Time filter

Source Type

Trademark
Jpk Instruments Ag | Date: 2014-08-19

Microscopes, namely, Scanning Probe Microscopes and Atomic Force Microscopes for analyzing and manipulating surfaces at the nanometer scale by means of an atomically fine tip that scans over the surface of a sample.

Loading Jpk Instruments Ag collaborators
Loading Jpk Instruments Ag collaborators