Tokyo, Japan
Tokyo, Japan

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Patent
JEOL Ltd. | Date: 2016-09-07

An analysis method includes: acquiring a photoelectron spectrum and an X-ray-excited Auger spectrum, the photoelectron spectrum being obtained by detecting photoelectrons emitted from a specimen by irradiating the specimen with X-rays, and the X-ray-excited Auger spectrum being obtained by detecting Auger electrons emitted from the specimen by irradiating the specimen with X-rays; calculating a quantitative value of each element included in the specimen based on the photoelectron spectrum; and performing a curve fitting process on the X-ray-excited Auger spectrum by using an electron beam-excited Auger electron standard spectrum, and calculating a quantitative value of an analysis target element in each chemical bonding state included in the specimen.


Patent
Jeol Ltd. and Fujirebio Inc. | Date: 2015-03-13

This reagent vessel housing unit 7 is provided with a drive unit 121, a base member 122, a first opening/closing mechanism 135, and a second opening/closing mechanism 136. By means of the driving force of the drive unit 121, the base member 122 can move to an initial position, at which the cap of a first reagent vessel and the cap of a second reagent vessel are closed, a first opening position at which the cap of the first reagent vessel is opened, and a second opening position at which the cap of the second reagent vessel is opened. The first opening/closing mechanism 135 opens the cap of the first regent vessel. The second opening/closing mechanism 136 opens the cap of the second regent vessel.


Patent
Jeol Ltd. | Date: 2017-03-15

There is provided a charged particle system capable of measuring deflection fields in a sample without using a segmented detector. The charged particle system (100) has: illumination optics (104) for illuminating the sample with charged particles; an imaging deflector system (112) disposed behind an objective lens (110) and operative to deflect the charged particles; a detector (116) having a detection surface (115) and operative to detect the charged particles incident thereon, imaging optics (114) disposed behind the imaging deflector system (112) and operative to focus the charged particles as diffraction discs (2) onto the detection surface (115); a storage unit (120) for storing intensity information detected by the detector (116); and a controller (130) for controlling the imaging deflector system (112). The controller (130) controls the imaging deflector system (112) to cause the charged particles passing through a given position of particle impingement on the sample to be deflected under successively different sets of deflection conditions and to bring the diffraction discs (2) into focus onto successively different regions of the detection surface (115). The storage unit (120) stores the intensity information for each set of the deflection conditions.


Patent
Jeol Ltd. and Fujirebio Inc. | Date: 2017-03-22

To clean a nozzle that is part of an automated analyzer and is provided with both a tubular discharge unit that discharges a cleaning liquid and a tubular suction unit that suctions in cleaning liquid that was discharged from the discharge unit and is running down an outer surface, first the discharge unit is made to start discharging, and then in parallel with said discharging, the suction unit is made to start suctioning. After the suction unit has suctioned in the cleaning liquid running down the aforementioned outer surface for a prescribed length of time, the suctioning is temporarily stopped. Next, after a prescribed amount of the cleaning liquid has accumulated in a cleaning tank, the discharging is stopped, and with the suction unit immersed in the cleaning liquid accumulated in the cleaning tank, the suctioning is restarted.


Patent
Jeol Ltd. | Date: 2017-03-08

An analysis method includes: acquiring a photoelectron spectrum and an X-ray-excited Auger spectrum, the photoelectron spectrum being obtained by detecting photoelectrons emitted from a specimen (S) by irradiating the specimen with X-rays, and the X-ray-excited Auger spectrum being obtained by detecting Auger electrons emitted from the specimen (S) by irradiating the specimen (S) with X-rays; calculating a quantitative value of each element included in the specimen (S) based on the photoelectron spectrum; and performing a curve fitting process on the X-ray-excited Auger spectrum by using an electron beam-excited Auger electron standard spectrum, and calculating a quantitative value of an analysis target element in each chemical bonding state included in the specimen (S).


Patent
Jeol Ltd. and Fujirebio Inc. | Date: 2017-01-25

This reagent vessel housing unit 7 is provided with a drive unit 121, a base member 122, a first opening/closing mechanism 135, and a second opening/closing mechanism 136. By means of the driving force of the drive unit 121, the base member 122 can move to an initial position, at which the cap of a first reagent vessel and the cap of a second reagent vessel are closed, a first opening position at which the cap of the first reagent vessel is opened, and a second opening position at which the cap of the second reagent vessel is opened. The first opening/closing mechanism 135 opens the cap of the first regent vessel. The second opening/closing mechanism 136 opens the cap of the second regent vessel.


Patent
Jeol Ltd. and Fujirebio Inc. | Date: 2017-03-22

This invention provides a container supply unit and an automated analyzer in which anomalous orientations of containers ejected from a container (cuvette) ejection part can be prevented in advance. This container supply unit has a container storage part, a container ejection part, and a container alignment part. The container ejection part includes a circular belt, placement members provided on said circular belt, and a belt rotation mechanism. Said belt rotation mechanism rotates the circular belt in an R direction, forming an outward leg along which the placement members move upwards and a return leg along which the placement members move downwards. The placement members carry containers placed thereon on the outward leg and eject said containers to the container alignment part between the outward leg and the return leg. The top of each placement member during the outward leg comprises the following: a first inclined surface that is sloped upwards from one end, on the circular-belt side, towards the other end; and a second inclined surface that is sloped downwards from one end, which connects to the first inclined surface, towards the other end.


Patent
Jeol Ltd. | Date: 2017-01-04

There is provided an electron microscope capable of easily achieving power saving. The electron microscope (100) includes a controller (60) for switching the mode of operation of the microscope from a first mode where electron lenses (12, 14, 18, 20) are activated to a second mode where the electron lenses (12, 14, 18, 20) are not activated. During this operation for making a switch from the first mode to the second mode, the controller (60) performs the steps of: closing a first vacuum gate valve (50), opening a second vacuum gate valve (52), and vacuum pumping the interior of the electron optical column (2) of the microscope by the second vacuum pumping unit (40); then controlling a heating section (26) to heat an adsorptive member (242); then opening the first vacuum gate valve (50), closing the second vacuum gate valve (52), and vacuum pumping the interior of the electron optical column (2) by the first vacuum pumping unit (30); and turning off the electron lenses (12, 14, 18, 20).


An image processor capable of facilitating image processing is provided. The image processor (100) includes an image acquisition section (112) for obtaining an image, a histogram generating section (114) for generating a histogram representative of a distribution of brightness values of pixels of the image from the image, a binning processing section (116) for binning the histogram on the basis of a maximum one of the brightness values of the image, and a contrast adjusting section (118) for adjusting the contrast of the image on the basis of the binned histogram.


Patent
Jeol Ltd. | Date: 2016-05-18

A measurement container supply device can more reliably hold a measurement container, and transfer the measurement container to a predetermined supply position. A supply section that transfers the measurement container to the predetermined supply position includes a holding section (50) that holds the measurement container, and the holding section (50) has a first groove (52) that is formed to have a width that corresponds to the outer diameter of a body of the measurement container, and a second groove (54) that is formed to have a width that corresponds to the outer diameter of a neck of the measurement container. When the holding section (50) holds the measurement container, the first groove (52) comes in contact with the outer circumferential surface of the body, the second groove (54) comes in contact with the outer circumferential surface of the neck, and a step (56) that is formed by the first groove (52) and the second groove (54) comes in contact with a step that is formed by the body and the neck.

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