Tokyo, Japan
Tokyo, Japan

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Patent
JEOL Ltd. | Date: 2016-09-07

An analysis method includes: acquiring a photoelectron spectrum and an X-ray-excited Auger spectrum, the photoelectron spectrum being obtained by detecting photoelectrons emitted from a specimen by irradiating the specimen with X-rays, and the X-ray-excited Auger spectrum being obtained by detecting Auger electrons emitted from the specimen by irradiating the specimen with X-rays; calculating a quantitative value of each element included in the specimen based on the photoelectron spectrum; and performing a curve fitting process on the X-ray-excited Auger spectrum by using an electron beam-excited Auger electron standard spectrum, and calculating a quantitative value of an analysis target element in each chemical bonding state included in the specimen.


Patent
Jeol Ltd. | Date: 2017-03-15

There is provided a charged particle system capable of measuring deflection fields in a sample without using a segmented detector. The charged particle system (100) has: illumination optics (104) for illuminating the sample with charged particles; an imaging deflector system (112) disposed behind an objective lens (110) and operative to deflect the charged particles; a detector (116) having a detection surface (115) and operative to detect the charged particles incident thereon, imaging optics (114) disposed behind the imaging deflector system (112) and operative to focus the charged particles as diffraction discs (2) onto the detection surface (115); a storage unit (120) for storing intensity information detected by the detector (116); and a controller (130) for controlling the imaging deflector system (112). The controller (130) controls the imaging deflector system (112) to cause the charged particles passing through a given position of particle impingement on the sample to be deflected under successively different sets of deflection conditions and to bring the diffraction discs (2) into focus onto successively different regions of the detection surface (115). The storage unit (120) stores the intensity information for each set of the deflection conditions.


An method is offered which can clean the nozzles of a reaction cuvette wash unit. A first detergent is put in first reagent containers located on a first reagent turntable. A computer controller drives a first reagent pipette to aspirate the detergent from the first reagent containers and to deliver the detergent into reaction cuvettes. The controller drives a reaction turntable to bring each reaction cuvette holding the detergent therein to the reaction cuvette wash unit. The controller drives the reaction cuvette wash unit to aspirate the detergent from inside the reaction cuvettes using reaction cuvette wash nozzles to thereby clean the wash nozzles. A second detergent is then used to clean the nozzles.


Patent
JEOL Ltd. | Date: 2016-09-07

There is provided a charged particle system capable of measuring deflection fields in a sample without using a segmented detector. The charged particle system (100) has: illumination optics (104) for illuminating the sample with charged particles; an imaging deflector system (112) disposed behind an objective lens (110) and operative to deflect the charged particles; a detector (116) having a detection surface (115) and operative to detect the charged particles incident thereon, imaging optics (114) disposed behind the imaging deflector system (112) and operative to focus the charged particles as diffraction discs (2) onto the detection surface (115); a storage unit (120) for storing intensity information detected by the detector (116); and a controller (130) for controlling the imaging deflector system (112). The controller (130) controls the imaging deflector system (112) to cause the charged particles passing through a given position of particle impingement on the sample to be deflected under successively different sets of deflection conditions and to bring the diffraction discs (2) into focus onto successively different regions of the detection surface (115). The storage unit (120) stores the intensity information for each set of the deflection conditions.


Patent
JEOL Ltd. | Date: 2016-08-10

There is provided a charged particle beam system capable of reducing contamination of at least one sample. The charged particle beam system (100) has a sample chamber (15) in which the sample (S) is irradiated with a charged particle beam. The system (100) has a receptacle chamber (21) which is connected into the sample chamber (15) via an isolation valve (25) and in which the sample (S) is accommodated. The system further includes a transport mechanism (22) for conveying the sample (S) from the receptacle chamber (21) into the sample chamber (15), an exhaust portion (24) for vacuum pumping the receptacle chamber (21), and a cleaning portion (30) for cleaning the sample (S) accommodated in the receptacle chamber (21).


Patent
Jeol Ltd. | Date: 2017-05-10

There is provided a charged particle beam system in which a detector can be placed in an appropriate analysis position. The charged particle beam system (100) includes: a charged particle source (11) for producing charged particles; a sample holder (20) for holding a sample (S); a detector (40) for detecting, in the analysis position, a signal produced from the sample (S) by impingement of the charged particles on the sample (S); a drive mechanism (42) for moving the detector (40) into the analysis position; and a controller (52) for controlling the drive mechanism (42). The controller (52) performs the steps of: obtaining information about the type of the sample holder (20); determining the analysis position on the basis of the obtained information about the type of the sample holder (20); and controlling the drive mechanism (42) to move the detector (40) into the determined analysis position.


Patent
JEOL Ltd. | Date: 2016-10-21

There is provided a method capable of calibrating a sample stage easily. This method is for use in a charged particle beam system having the sample stage for moving a sample and an imaging subsystem for capturing a charged particle beam image and obtaining a final image. The method includes the steps of obtaining the final image from the imaging subsystem (step S100), obtaining correlation information that associates a given position in the final image with a position of the sample stage assumed when the final image was taken (step S102), obtaining length information about a length per pixel of the final image at a final magnification (step S106), and finding a correction between coordinates of the final image and coordinates of the sample stage on the basis of the correlation information and of the length information (step S110).


Patent
JEOL Ltd. | Date: 2016-10-21

There is provided a detector apparatus capable of detecting the position or tilt angle of a sample stage with high resolution and high reliability. The detector apparatus (100) is operative to detect the position or tilt angle of the sample stage (2), and has a potentiometer (10) for detecting the position or tilt angle of the sample stage (2), an encoder (20) for detecting the position or tilt angle of the sample stage (2), and a computing unit (30) for calculating the position or tilt angle of the sample stage (2), based both on an output signal from the potentiometer (10) and on an output signal from the encoder (20).


A probe head in a nuclear magnetic resonance measurement apparatus includes a rotating mechanism. In the probe head, an exhaust gas having a high temperature or a low temperature is discharged from a discharge port of the rotating mechanism. An additive gas having room temperature is introduced into the probe head through a plurality of ejection holes. The additive gas is mixed with the exhaust gas, and, as a result, an exhaust gas mixture having a temperature closer to room temperature than is the temperature of the sample is produced. A deflector regulates the direction in which the exhaust gas flows.


A three-dimensional image reconstruction method capable of analyzing a three-dimensional structure of membrane proteins present within a lipid membrane is offered. A three-dimensional image reconstruction method associated with the present invention comprises the steps of: obtaining a first transmission electron microscope image of a sample containing the membrane proteins present within a lipid membrane, the image having been taken by illuminating an electron beam on the sample from a direction tilted relative to a line normal to the membrane surface of the lipid membrane (step S10); obtaining a second transmission electron microscope image of the sample taken by illuminating the electron beam on the sample perpendicularly to the membrane surface of the lipid membrane (step S12); identifying orientations of the membrane proteins of the first transmission electron microscope image on a basis of the second transmission electron microscope image (step S14); and analyzing a three-dimensional structure of the membrane proteins from the first transmission electron microscope image on a basis of information about the identified orientations of the membrane proteins (step S18).

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