JEOL Ltd

Tokyo, Japan
Tokyo, Japan
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Patent
Jeol Ltd. | Date: 2017-07-19

A sample tube (50) is arranged in a sample temperature adjusting pipe, and a temperature adjustment gas is supplied. A vacuum vessel (28) is formed with the sample temperature adjusting pipe (24) and an outer wall body (26), and a detection coil (52) to be placed in a cooling state are arranged in the vacuum vessel. A sealed section between the sample temperature adjusting pipe and the outer wall body is sealed by a sealing structure. The sealing structure includes a high-vacuum O-ring (60) and a low-temperature O-ring (58). The high-vacuum O-ring has characteristics for sealing the sealed section in a regular temperature region. The regular temperature region is a temperature region excluding a low temperature region, and the low temperature region is a temperature region including a lower limit in a possible temperature adjustment range of the temperature adjustment gas. The low-temperature O-ring has characteristics for sealing the sealed section in the low temperature region.


Patent
Jeol Ltd. | Date: 2017-01-04

There is provided an electron microscope capable of easily achieving power saving. The electron microscope (100) includes a controller (60) for switching the mode of operation of the microscope from a first mode where electron lenses (12, 14, 18, 20) are activated to a second mode where the electron lenses (12, 14, 18, 20) are not activated. During this operation for making a switch from the first mode to the second mode, the controller (60) performs the steps of: closing a first vacuum gate valve (50), opening a second vacuum gate valve (52), and vacuum pumping the interior of the electron optical column (2) of the microscope by the second vacuum pumping unit (40); then controlling a heating section (26) to heat an adsorptive member (242); then opening the first vacuum gate valve (50), closing the second vacuum gate valve (52), and vacuum pumping the interior of the electron optical column (2) by the first vacuum pumping unit (30); and turning off the electron lenses (12, 14, 18, 20).


Patent
Jeol Ltd. and Fujirebio Inc. | Date: 2017-03-22

To clean a nozzle that is part of an automated analyzer and is provided with both a tubular discharge unit that discharges a cleaning liquid and a tubular suction unit that suctions in cleaning liquid that was discharged from the discharge unit and is running down an outer surface, first the discharge unit is made to start discharging, and then in parallel with said discharging, the suction unit is made to start suctioning. After the suction unit has suctioned in the cleaning liquid running down the aforementioned outer surface for a prescribed length of time, the suctioning is temporarily stopped. Next, after a prescribed amount of the cleaning liquid has accumulated in a cleaning tank, the discharging is stopped, and with the suction unit immersed in the cleaning liquid accumulated in the cleaning tank, the suctioning is restarted.


Patent
Jeol Ltd. | Date: 2017-03-15

There is provided a charged particle system capable of measuring deflection fields in a sample without using a segmented detector. The charged particle system (100) has: illumination optics (104) for illuminating the sample with charged particles; an imaging deflector system (112) disposed behind an objective lens (110) and operative to deflect the charged particles; a detector (116) having a detection surface (115) and operative to detect the charged particles incident thereon, imaging optics (114) disposed behind the imaging deflector system (112) and operative to focus the charged particles as diffraction discs (2) onto the detection surface (115); a storage unit (120) for storing intensity information detected by the detector (116); and a controller (130) for controlling the imaging deflector system (112). The controller (130) controls the imaging deflector system (112) to cause the charged particles passing through a given position of particle impingement on the sample to be deflected under successively different sets of deflection conditions and to bring the diffraction discs (2) into focus onto successively different regions of the detection surface (115). The storage unit (120) stores the intensity information for each set of the deflection conditions.


Patent
Jeol Ltd. | Date: 2017-03-08

An analysis method includes: acquiring a photoelectron spectrum and an X-ray-excited Auger spectrum, the photoelectron spectrum being obtained by detecting photoelectrons emitted from a specimen (S) by irradiating the specimen with X-rays, and the X-ray-excited Auger spectrum being obtained by detecting Auger electrons emitted from the specimen (S) by irradiating the specimen (S) with X-rays; calculating a quantitative value of each element included in the specimen (S) based on the photoelectron spectrum; and performing a curve fitting process on the X-ray-excited Auger spectrum by using an electron beam-excited Auger electron standard spectrum, and calculating a quantitative value of an analysis target element in each chemical bonding state included in the specimen (S).


Patent
Jeol Ltd. and Fujirebio Inc. | Date: 2017-03-22

This invention provides a container supply unit and an automated analyzer in which anomalous orientations of containers ejected from a container (cuvette) ejection part can be prevented in advance. This container supply unit has a container storage part, a container ejection part, and a container alignment part. The container ejection part includes a circular belt, placement members provided on said circular belt, and a belt rotation mechanism. Said belt rotation mechanism rotates the circular belt in an R direction, forming an outward leg along which the placement members move upwards and a return leg along which the placement members move downwards. The placement members carry containers placed thereon on the outward leg and eject said containers to the container alignment part between the outward leg and the return leg. The top of each placement member during the outward leg comprises the following: a first inclined surface that is sloped upwards from one end, on the circular-belt side, towards the other end; and a second inclined surface that is sloped downwards from one end, which connects to the first inclined surface, towards the other end.


Patent
Jeol Ltd. and Fujirebio Inc. | Date: 2017-01-25

This reagent vessel housing unit 7 is provided with a drive unit 121, a base member 122, a first opening/closing mechanism 135, and a second opening/closing mechanism 136. By means of the driving force of the drive unit 121, the base member 122 can move to an initial position, at which the cap of a first reagent vessel and the cap of a second reagent vessel are closed, a first opening position at which the cap of the first reagent vessel is opened, and a second opening position at which the cap of the second reagent vessel is opened. The first opening/closing mechanism 135 opens the cap of the first regent vessel. The second opening/closing mechanism 136 opens the cap of the second regent vessel.


Patent
JEOL Ltd. | Date: 2017-01-11

A sample tube is arranged in a sample temperature adjusting pipe, and a temperature adjustment gas is supplied. A vacuum vessel is formed with the sample temperature adjusting pipe and an outer wall body, and a detection coil and the like to be placed in a cooling state are arranged in the vacuum vessel. A sealed section between the sample temperature adjusting pipe and the outer wall body is sealed by a sealing structure. The sealing structure includes a high-vacuum O-ring and a low-temperature O-ring. The high-vacuum O-ring has characteristics for sealing the sealed section in a regular temperature region. The regular temperature region is a temperature region excluding a low temperature region, and the low temperature region is a temperature region including a lower limit in a possible temperature adjustment range of the temperature adjustment gas. The low-temperature O-ring has characteristics for sealing the sealed section in the low temperature region.


A three-dimensional image reconstruction method capable of analyzing a three-dimensional structure of membrane proteins present within a lipid membrane is offered. A three-dimensional image reconstruction method associated with the present invention comprises the steps of: obtaining a first transmission electron microscope image of a sample containing the membrane proteins present within a lipid membrane, the image having been taken by illuminating an electron beam on the sample from a direction tilted relative to a line normal to the membrane surface of the lipid membrane (step S10); obtaining a second transmission electron microscope image of the sample taken by illuminating the electron beam on the sample perpendicularly to the membrane surface of the lipid membrane (step S12); identifying orientations of the membrane proteins of the first transmission electron microscope image on a basis of the second transmission electron microscope image (step S14); and analyzing a three-dimensional structure of the membrane proteins from the first transmission electron microscope image on a basis of information about the identified orientations of the membrane proteins (step S18).


Patent
Jeol Ltd. | Date: 2017-05-10

There is provided a charged particle beam system in which a detector can be placed in an appropriate analysis position. The charged particle beam system (100) includes: a charged particle source (11) for producing charged particles; a sample holder (20) for holding a sample (S); a detector (40) for detecting, in the analysis position, a signal produced from the sample (S) by impingement of the charged particles on the sample (S); a drive mechanism (42) for moving the detector (40) into the analysis position; and a controller (52) for controlling the drive mechanism (42). The controller (52) performs the steps of: obtaining information about the type of the sample holder (20); determining the analysis position on the basis of the obtained information about the type of the sample holder (20); and controlling the drive mechanism (42) to move the detector (40) into the determined analysis position.

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