Cours-la-Ville, France
Cours-la-Ville, France

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Hamdi S.E.,Institute Of Mecanique Et Ingenierie | Delisee C.,Institute Of Mecanique Et Ingenierie | Malvestio J.,Institute Of Mecanique Et Ingenierie | Da Silva N.,Fibres Recherche Developpement | And 3 more authors.
Composites Part A: Applied Science and Manufacturing | Year: 2015

Abstract Optimizing the performance of lignocellulosic fibers often requires relating mechanical behavior or morphological characteristics to microstructure. X-ray computed microtomography (X-ray CT), which provides 3D images with a high level of detail at both the micro- and macro-scales, may overcome these difficulties. This work provides a comparative analysis of the potential of X-ray CT (3D) and an office scanner (2D) for morphological characterization of lignocellulosic fibers. To this end, three specimens of lignocellulosic fiber materials obtained after the first decortication of the plant were retained. X-ray CT and 2D scanning correlations of sample diameter distributions are presented. The general aspects of the fibers diameter correlation are discussed. Image analysis was used to assess the potential and limitations of both the X-ray CT and 2D scanning methods based on the experimental work, and the main conclusions of the benchmark study are given in a table. © 2015 Elsevier Ltd.

Guillemet T.,CNRS Institute of Chemistry | Guillemet T.,University of Nebraska - Lincoln | Kusiak A.,Institute Of Mecanique Et Ingenierie | Fan L.,University of Nebraska - Lincoln | And 6 more authors.
ACS Applied Materials and Interfaces | Year: 2014

Diamond (Dia) films are promising heat-dissipative materials for electronic packages because they combine high thermal conductivity with high electrical resistivity. However, precise knowledge of the thermal properties of the diamond films is crucial to their potential application as passive thermal management substrates in electronics. In this study, modulated photothermal radiometry in a front-face configuration was employed to thermally characterize polycrystalline diamond films deposited onto silicon (Si) substrates through laser-assisted combustion synthesis. The intrinsic thermal conductivity of diamond films and the thermal boundary resistance at the interface between the diamond film and the Si substrate were investigated. The results enlighten the correlation between the deposition process, film purity, film transverse thermal conductivity, and interface thermal resistance. © 2014 American Chemical Society.

Guillemet T.,CNRS Institute of Chemistry | Guillemet T.,University of Nebraska - Lincoln | Battaglia J.-L.,Institute Of Mecanique Et Ingenierie | Kusiak A.,Institute Of Mecanique Et Ingenierie | And 5 more authors.
ICALEO 2012 - 31st International Congress on Applications of Lasers and Electro-Optics | Year: 2012

Besides knowledge of thermal conductivities, information about the interfacial thermal resistances existing in layered systems such as power electronic packages is of primary importance. Indeed, thermal boundary resistances have a critical influence on the heat transfer process occurring between the layers. In this study, modulated infrared photothermal radiometry was employed to measure the thermal response of diamond films deposited on silicon substrates through laser-assisted combustion synthesis. The thermal resistance normal to the diamond/silicon interface was then estimated from the measurement of the phase and the amplitude of the thermal response. Preliminary results show that the layered diamond/Si system exhibits an interfacial thermal resistance of about 4×10-8 K.W-1. The technique developed in this study enables a precise evaluation of the thermal resistance at the diamond/silicon interface and is promising for various thermal management applications of diamond thin-films in optics, electronics, or mechanics.

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