Infineon Technology Kulim SDN. Bhd.

Kedah Darul Aman, Malaysia

Infineon Technology Kulim SDN. Bhd.

Kedah Darul Aman, Malaysia
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Sing L.S.,Infineon Technology Kulim SDN. Bhd. | Ping L.S.,Infineon Technology Kulim SDN. Bhd.
Conference Proceedings from the International Symposium for Testing and Failure Analysis | Year: 2016

This paper outlines the physical analysis approach to investigate droplet-like copper discoloration defects. These defects are proven to be caused by differences in copper oxidation based on quantification results of the CuO and Cu2O chemical states using X-ray photoelectron spectroscopy (XPS) analysis. Copyright © 2016 ASM International® All rights reserved.

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