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Vienna, Austria

Platzgummer E.,IMS Nanofabrication AG
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2010

Multi-beam writing becomes mandatory in order to stay within reasonable realization times for the fabrication of leading-edge complex masks and templates. IMS Nanofabrication has developed multi-beam projection techniques implementing a programmable aperture plate system (APS) and charged-particle projection optics with 200x reduction. Proof-of-concept of multi-beam writing was demonstrated in 2009 with 10 keV ion multi-beams and 50 keV electron multi-beams using 43-thousand and 2.5-thousand, respectively, programmable 12.5nm sized beams. In Q4 2009 the development of a 50 keV electron multi-beam Mask Exposure Tool (eMET) was started with the aim to realize 256-thousand programmable 20 nm and 10 nm sized beams. The eMET column realization will provide important synergies for the development of projection mask-less lithography (PML2) for direct write on wafers. In order to enhance throughput a Multi-Axis-PML2 scheme is put forward with potential throughput of 5 WPH for the 16 nm hp technology node and below. Clustering such maskless tools a throughput of 50-100 WPH within a scanner floor space is envisioned. Ion multi-beam techniques may be applied for 2.5D / 3D template fabrication and resistless nanopatterning. © 2010 Copyright SPIE - The International Society for Optical Engineering.


Patent
IMS Nanofabrication AG | Date: 2010-02-19

In a particle multi-beam structuring apparatus for forming a pattern on a targets surface using a beam of electrically charged particles, during exposure steps the particle beam is produced, directed through a pattern definition means producing a patterned particle beam composed of multiple beamlets, and projected by an optical column including a controllable deflection means onto the target surface to form, at a nominal location on the target, a beam image comprising the image of defining structures in the pattern definition means. The beam images nominal location relative to the target is changed between exposure steps. The actual location of the beam image is varied within each exposure step around the nominal location, through a set of locations realizing a distribution of locations within the image plane around a mean location coinciding with the nominal location, thus introducing an additional blur which is homogenous over the entire beam image.


Patent
IMS Nanofabrication AG | Date: 2011-03-18

For irradiating a target with a beam of energetic electrically charged particles comprising a plurality of beamlets, the target is exposed in a sequence of exposure stripes composed image pixels. These stripes (s


Patent
IMS Nanofabrication AG | Date: 2015-07-09

An exposure pattern is computed which is used for exposing a desired pattern on a target in a charged-particle multi-beam processing apparatus so as to match a reference writing tool, possible of different type: The desired pattern is provided as a graphical representation suitable for the reference tool, such as a raster graphics, on the image area on the target. A convolution kernel is used which describes a mapping from an element of the graphical representation to a group of pixels which is centered around a nominal position of said element. A nominal exposure pattern is calculated by convolution of the graphical representation with the convolution kernel, said nominal exposure pattern being suitable to create a nominal dose distribution on the target when exposed with the processing apparatus.


Patent
Ims Nanofabrication Ag | Date: 2010-01-25

The disclosure relates to a method for producing a multi-beam deflector array device with a plurality of openings for use in a particle-beam exposure apparatus, in particular a projection lithography system, said method starting from a CMOS wafer and comprising the steps of generating at least one pair of parallel trenches on the first side of the wafer blank at the edges of an area where the circuitry layer below is non-functional, the trenches reaching into the layer of bulk material; passivating the sidewalls and bottom of the trenches; depositing a conducting filling material into the trenches, thus creating columns of filling material serving as electrodes; attaching metallic contact means to the top of the electrodes; structuring of an opening between the electrodes, said opening stretching across abovementioned area so that the columns are arranged opposite of each other on the sidewalls of the opening.

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