Ostermann M.,BAM Federal Institute of Materials Research and Testing |
Kuhn A.,BAM Federal Institute of Materials Research and Testing |
Bjeoumikhov A.,IfG Institute for Scientific Instruments GmbH |
Wedell R.,IAP Institute fur Angewandte Photonik E.V.
Technisches Messen | Year: 2011
Elemental analysis directly at the material stream of production processes using X-ray fluorescence spectrometry is gathering importance. Thanks to technical developments, X-ray fluorescence analysis can be used as information source in the elemental analysis of material in industrial processes without tedious sample preparation steps. The employment of online X-ray fluorescence analysis pays off both in financial as well in time aspects, since it can be used for the economic application of raw materials or e. g. for recycling. This paper describes four different applications of X-ray fluorescence spectroscopy. © Oldenbourg Wissenschaftsverlag. Source
Boone M.N.,Ghent University |
Garrevoet J.,Ghent University |
Tack P.,Ghent University |
Scharf O.,IfG Institute for Scientific Instruments GmbH |
And 6 more authors.
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | Year: 2014
High resolution X-ray radiography and computed tomography are excellent techniques for non-destructive characterization of an object under investigation at a spatial resolution in the micrometer range. However, as the image contrast depends on both chemical composition and material density, no chemical information is obtained from this data. Furthermore, lab-based measurements are affected by the polychromatic X-ray beam, which results in beam hardening effects. New types of X-ray detectors which provide spectral information on the measured X-ray beam can help to overcome these limitations. In this paper, an energy dispersive CCD detector with high spectral resolution is characterized for use in high resolution radiography and tomography, where a focus is put on the experimental conditions and requirements of both measurement techniques. © 2013 Published by Elsevier B.V. All rights reserved. Source
Grassi N.,National Institute of Nuclear Physics, Italy |
Guazzoni C.,Polytechnic of Milan |
Alberti R.,Polytechnic of Milan |
Klatka T.,Polytechnic of Milan |
Bjeoumikhov A.,IfG Institute for Scientific Instruments GmbH
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | Year: 2010
We developed a PIXE detection system for the analysis of medium-light elements which exploits a weakly focusing polycapillary lens for the transmission of the X-rays emitted from the target material to a Silicon Drift Detector. The polycapillary lens efficiently collects X-rays, while prevents back-scattered protons from impinging on the detector chip, thus avoiding electronics perturbation and consequent quality loss of PIXE spectra. The system is optimized for the detection of X-rays in the energy range 1-10 keV, when the emission from the target is induced by MeV proton beams with size of the order of a few hundreds of micrometers. This work reports the results of the lens characterization in terms of X-ray collection spot, i.e. the area of the sample actually "seen" by the lens, and its dependence on the X-ray energy. The lens properties have been measured using the external scanning microbeam facility of the Tandetron accelerator at LABEC-INFN in Florence. The detection system was used to detect X-rays from a set of pure elemental standards with an incident 3 MeV proton beam focused to a size of about 30 μm scanning an area of 1.9 × 1.6 mm2. By measuring the spatial distribution of characteristic X-rays from each given material, the collection profile of the lens at the corresponding X-ray energy was obtained. Using several standards, the behaviour throughout the range 1-10 keV was examined. The sensitivity of the lens collection profile on the lens-sample out-of-focus distance was also investigated. © 2010 Elsevier B.V. All rights reserved. Source
Radtke M.,BAM Federal Institute of Materials Research and Testing |
Buzanich G.,BAM Federal Institute of Materials Research and Testing |
Curado J.,BAM Federal Institute of Materials Research and Testing |
Reinholz U.,BAM Federal Institute of Materials Research and Testing |
And 2 more authors.
Journal of Analytical Atomic Spectrometry | Year: 2014
Recent advances in synchrotron sources and detector technology have led to substantial improvements in spatial resolution and detection limits for X-ray fluorescence analysis (XRF). However, the non-destructive three-dimensional elemental sensitive characterization of samples remains a challenge. We demonstrate the use of the so-called "Color X-ray Camera" (CXC) for 3D measurements for the first time. The excitation of the sample is realized with a thin sheet-beam. The stepwise movement of the sample allows getting the elemental distribution for each layer with one measurement. These layers can be combined to a full 3D dataset for each element afterwards. Since the information is collected layer by layer, there is no need to apply reconstruction techniques, which quite often are the reason for artifacts in the results achieved by computed tomography (CT). The field of applications is wide, as the 3D elemental distribution of a material contains clues to processes inside the samples from a variety of origins. The technique is of special interest and well suited for biological specimens, because their light matrix minimizes restricting absorption effects. Measurement examples of a hornet and the teeth of a Sorex araneus are shown. This journal is © the Partner Organisations 2014. Source
Agency: Cordis | Branch: FP7 | Program: MC-ITN | Phase: FP7-PEOPLE-2012-ITN | Award Amount: 3.54M | Year: 2013
SPRITE is a multi-disciplinary European training network which brings together Europes premier research institutes in technology and applications of ion beams. Those involved are already actively collaborating, for example in the recently very favourably reviewed EC Infrastructure project SPIRIT. SPRITE addresses the urgent European need - identified in a recent Foresight Review - to train the next generation of researchers in this multi- and supra- disciplinary emerging field. Through its Internship Mobility Partnerships (IMPs) SPRITE offers an innovative training package, providing the researchers with the opportunity to gain real world experience and business facing skills in the private and public sectors. In addition, ELVEs (European Laboratory Visit Exchanges) are an integral part of the training program. In combination with the IMPs, every ER and ESR will thus spend up to 30% of its time outside its host laboratory, part of this time in another EC country. Collaboration with the IAEA opens up a further dimension to SPRITE, enabling the researchers to put their research into a global context and to interact with scientists from all over the world. Despite the numerous participants SPRITE is able to offer a personalized training program. For this purpose the Action Planner, a web-based training needs analysis tool, developed at the University of Surrey will be used. This maps on to the Researcher Development Framework, currently being trialled by the European Science Foundation. Action Planner allows the training for each researcher to be tailored to their individual needs and aspirations. In addition to individualized training, SPRITE organizes network wide training events, encompassing amongst others technical training and business facing skills. In this way SPRITE researchers will leave not only as a brilliant and experienced researcher but also as a skilled manager, able to lead their own group.