Minami-rinkan, Japan
Minami-rinkan, Japan

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The present invention makes possible to correct the output of (prepare a calibration curve for) a photodetector 4 used for a spectroscopic analyzer 100 or a spectroscope, in a short period of time with a simple configuration. The present invention is adapted to make light beams emitted from a light source 1 enter the photodetector 4 both when interposing an optical element 6 having known characteristics and when not interposing the optical element 6, and acquire a first output value and a second output value that are the output values of the photodetector 4 with respect to each of light beams that respectively have predetermined multiple wavenumbers and are included in the incident light beams ,and obtain an arithmetic expression for calculating intensity of incident light beams from an output value of the photodetector, using parameters that are a ratio between the first output value and the second output value at each of the predetermined wavenumbers and the wavenumber transmission or reflection characteristic of the optical element.


Patent
Horiba Ltd. | Date: 2017-02-08

A purpose of this invention is to provide an electrode that is extremely preferably used for measuring a pH of a cell culture medium. This electrode is designed to be inserted into an insertion bore arranged on a container into which a sample solution as being a measuring object is put, and comprises an internal electrode, a storage that houses the internal electrode, a gelled or liquefied internal liquid that is filled into the storage so as to contact the internal electrode, and a sensor part that is electrically connected to the internal electrode through the internal liquid and arranged at a distal end surface of the storage as to detect a electric potential of the sample solution. The storage has a positioning surface for positioning the storage at a mounting position at which the inner wall surface of the container and the distal end surface of the storage are on the same plane.


Patent
HORIBA Ltd. | Date: 2016-10-24

A gas analyzing apparatus includes a plurality of light sources, an inlet, a light detector, and an analyzing unit. The plurality of light sources simultaneously output a plurality of measurement light beams. The inlet introduces the plurality of measurement light beams into a measurement space. The light detector measures total intensity. The analyzing unit analyzes the target gases based on a difference between a measured target intensity and a reference intensity, in which the measured target intensity is a total intensity measured by the light detector after passing through the measurement space in which one of the target gases exists, while the reference intensity is the total intensity measured by the light detector after passing through the measurement space in which none of the target gases exists.


In order to provide a radiation thermometer with which a temperature of a measurement object disposed in a chamber configured to form plasma therein can be accurately measured in a noncontact manner from outside of the chamber, the radiation thermometer includes an infrared sensor and a window temperature compensation part. The infrared sensor is disposed outside the chamber configured to form plasma therein, and is configured to detect infrared ray emitted from the measurement object in the chamber through a transmission window provided in the chamber. The infrared sensor is configured to output an output signal according to energy of detected infrared ray. The window temperature compensation part is configured to compensate for a pre-compensation temperature of the measurement object being indicated by the output signal of the infrared sensor, on the basis of a temperature of the transmission window.


The present invention is a sample analyzer 100 that makes it possible to accurately analyze a sample even when the sample is such as one in a state where particles are cross-linked, or one containing foreign bodies and that calculates an autocorrelation function from a detection signal obtained by irradiating a sample with inspection light L1, and from the autocorrelation function, analyzes the sample. In addition, the sample analyzer 100 includes: an autocorrelation function determination part 53 that determines whether or not the displacement amount of an autocorrelation function serving as a comparison target from an autocorrelation function serving as a reference is within a predetermined range; and a sample analysis part 54 that analyzes the sample with use of an autocorrelation function of which the displacement amount is determined by the autocorrelation function determination part 53 to be within the predetermined range.


In order to provide an exhaust gas dilution device 100 capable of making a flow rate range wider than before, the exhaust gas dilution device 100 is adapted to include: a dilution tunnel 2 through which diluent gas such as air flows; an orifice member 51 adapted to block the dilution tunnel 2 except for an orifice hole 5a provided in a central part; and an exhaust gas introduction pipe 1 of which a discharge port 1a is disposed so as to face to the orifice hole 5a and face to a downstream side and through which exhaust gas is discharged from the discharge port 1a into the dilution tunnel 2. In addition, in the exhaust gas dilution device 100, the orifice member 51 is formed with a concave part S that is gradually concaved from an outer circumferential edge part toward the orifice hole 5a as viewed from an upstream side.


In order to provide an exhaust gas measurement apparatus (100) having a simpler configuration capable measuring a concentration of a predetermined component contained in exhaust gas under various situations without deteriorating a measurement accuracy, there is provided a sampling mechanism (1) that can select any one of two states, i.e., a first operation mode for outputting the sampled exhaust gas without dilution and a second operation mode for outputting the sampling exhaust gas mixed with dilution gas. In a situation where the sampling mechanism (1) is operating in the first operation mode, in the case where the concentration of the predetermined component measured by a measurement apparatus body (2) exceeds a predetermined first threshold value, the sampling mechanism (1) is controlled such that the first operation mode thereof is changed to the second operation mode.


Patent
Horiba Ltd. | Date: 2017-06-21

In order to provide a fuel cell powered vehicle testing system capable of performing a test of a power system of a fuel cell powered vehicle by a simpler facility, includes: a dynamometer which is connected to an output shaft of an electric motor mounted on a fuel cell powered vehicle for applying a simulation travelling load to the electric motor; and a supply power simulator adapted to simulate an operation of the fuel cell mounted on the fuel cell powered vehicle and to apply power to the electric motor, the power being to be supplied from the fuel cell to the electric motor.


Patent
Fondazione Bruno Kessler and Horiba Ltd. | Date: 2017-06-28

Provided are a semiconductor detector (1), a radiation detector (2) and a radiation detection apparatus that allow for reduction in size of the radiation detector (2) and enhancement in accuracy of radiation detection by loosening the condition of cooling. A semiconductor detector (1) for detecting radiation comprises a first semiconductor part (11) in which an electron and a hole are generated by incident radiation; a signal output electrode (14) outputting a signal base on the electron or the hole; and a gettering part (13) gettering impurities in the first semiconductor part (11). In addition, the semiconductor detector (1) further comprises a second semiconductor part (12) doped with a type of dopant impurities and having dopant impurity concentration higher than that of the first semiconductor part (11). The second semiconductor part (12) is in contact with the first semiconductor part (11). The gettering part (13) is in contact with the second semiconductor part (12) and not in contact with the first semiconductor part (11).


Provided are a semiconductor detector (1), a radiation detector (2) and a radiation detection apparatus that prevent the yield from lowering due to a configuration for reducing surface current. A semiconductor detector (1) comprises a plate-shaped semiconductor part (11), a signal output electrode (14) for outputting a signal which is provided at one surface of the semiconductor part (11), a plurality of curved electrodes (12) which are provided at the one surface of the semiconductor part (11) and which have distances from the signal output electrode (14) that are different from each other, and an arc-shaped collection electrode (131) for collecting an electric charge generated at the semiconductor part (11). The plurality of curved electrodes (12) are applied with voltage so as to generate in the semiconductor part (11) a potential gradient in which a potential varies toward the signal output electrode (14). The collection electrode (131) is located at a part of the semiconductor part (11) located between an adjacent pair of curved electrodes (12). In addition, the collection electrode (131) is connected to a curved electrode (12) located with a distance from the signal output electrode (14) shorter than a distance between the collection electrode (131) and the signal output electrode (14) among the multiple curved electrodes (12).

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