Horiba Jobin Yvon Inc.

Edison, NJ, United States

Horiba Jobin Yvon Inc.

Edison, NJ, United States
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— The Report is a professional and in-depth study on the current state of the Raman Spectroscopy market. The report provides a basic overview of the Raman Spectroscopy industry including definitions, classifications, applications and industry chain structure. This report also states import/export consumption, supply and demand figures, cost, price, revenue and gross margins, and the global market size (volume and value), and the sales segment market is also discussed by product type, applications and region. Key companies profiled in this report are Horiba Jobin Yvon, Renishaw, Thermo, B&W Tek, Kaiser Optical, Bruker, Ocean Optics, Smiths Detection, Witec, Agilent Technologies, Perkinelmer, Jasco, Tsi, Sciaps, Zolix And Gangdong and more in terms of basic information, product categories, Sales (Volume), Revenue (Million USD), Price (USD/Unit) and Gross Margin (%) (2012-2017). Global Raman Spectroscopy Market Report covers Bench top type, Portable type and others as product types whereas applications covered in this report are Pharmaceutics, R&D in academia, Industrial sector and Other. Table of Contents: 1 Raman Spectroscopy Market Overview 2 Global Raman Spectroscopy Competitions by Players 3 Global Raman Spectroscopy Competitions by Types 4 Global Raman Spectroscopy Competitions by Application 5 Global Raman Spectroscopy Production Market Analysis by Region 6 Global Raman Spectroscopy Sales Market Analysis by Region 7 Imports and Exports Market Analysis 8 Global Raman Spectroscopy Players Profiles and Sales Data 9 Raman Spectroscopy Manufacturing Cost Analysis 10 Industrial Chain and Downstream Buyers 11 Marketing Channels Analysis 12 Global Raman Spectroscopy Market Forecast (2017-2022) 13 Research Findings and Conclusion Inquire for more details / sample / discount at: https://www.themarketreports.com/report/ask-your-query/478658 For more information, please visit https://www.themarketreports.com/report/2017-global-raman-spectroscopy-industry-research-report


Richard S.,Horiba Jobin Yvon Inc. | Bencheikh K.,CNRS Laboratory for Photonics and Nanostructures | Boulanger B.,CNRS Neel Institute | Levenson J.A.,CNRS Laboratory for Photonics and Nanostructures
Optics Letters | Year: 2011

In this Letter we study spontaneous generation of triple photon states in optical fibers by third order spontaneous downconversion. Using a semiclassical approach we derive an explicit expression for the triple photons generation efficiency as a function of fiber parameters. We show that optical fibers with well suited index profiles and standard outer diameters could be the key component of future triple photons sources. © 2011 Optical Society of America.


Bencheikh K.,CNRS Laboratory for Photonics and Nanostructures | Richard S.,Horiba Jobin Yvon Inc. | Melin G.,PRYSMIAN DRAKA COMTEQ | Krabshuis G.,PRYSMIAN DRAKA COMTEQ Fibre B.V. | And 2 more authors.
Optics Letters | Year: 2012

Phase-matched third-harmonic generation is demonstrated in a germanium-doped optical fiber. Green light at 514.4 nm is generated in an LP03 mode when a pump field at ~1543.3 nm is launched into the fiber in the fundamental LP01 mode. The phase matching is achieved for a particular combination of the germanium doping concentration and the fiber core diameter. © 2012 Optical Society of America.


Pisonero J.,University of Oviedo | Lobo L.,University of Oviedo | Bordel N.,University of Oviedo | Tempez A.,Horiba Jobin Yvon Inc. | And 3 more authors.
Solar Energy Materials and Solar Cells | Year: 2010

The analytical potential of pulsed radiofrequency glow discharge time-of-flight mass spectrometry (pulsed-rf-GD-TOFMS) is investigated for fast quantitative analysis of major and dopant elements in bulk and thin film layers. This technique does not require sampling at ultra-high vacuum conditions and so it facilitates high sample throughput compared to reference techniques as secondary ionization mass spectrometry (SIMS). In this paper, bulk and boron implanted silicon samples are analyzed. Boron concentration in Si samples is calculated from calibration curves obtained using solar grade silicon and B doped silicon wafers as calibrating materials, and using 29Si+ ion signal as internal standard. Qualitative depth profiles of 10B implanted silicon are determined in a few seconds using the low-pressure pulsed-rf-GD-TOFMS system. Additionally, quantitative depth profiles are easily determined making use of the calibration curves. A good agreement with the depth profiles measured using SIMS was obtained, demonstrating the analytical potential of the pulsed-GD-TOFMS system for fast, sensitive and high depth resolution analysis of implanted silicon samples. © 2010 Elsevier B.V. All rights reserved.


Patent
Horiba Jobin Yvon Inc. | Date: 2011-03-08

A system or method for analyzing a sample include an input light source, a double subtractive monochromator positioned to receive light from the input light source and to sequentially illuminate the sample with each of a plurality of wavelengths, a multi-channel fluorescence detector positioned to receive and substantially simultaneously detect multiple wavelengths of light emitted by the sample for each of the plurality of excitation wavelengths, an absorption detector positioned to receive and detect light passing through the sample, and a computer in communication with the monochromator, the fluorescence detector, and the absorption detector, the computer controlling the monochromator to sequentially illuminate the sample with each of the plurality of wavelengths while measuring absorption and fluorescence of the sample based on signals received from the fluorescence and absorption detectors


A spectrometer which in one embodiment including a dispersive element and a concave element. The dispersive element may be a flat or concave grating which receives light and reflects the light in different collimated wavelengths. The concave element being located downstream from the dispersive element and arranged to reflect and focus the light toward a detector. The reflected light from the concave element including astigmatism. A cylindrical lens positioned between the concave element and the detector and configured to simultaneously correct the astigmatism and demagnify the light across the detector. In one embodiment the cylindrical lens varies in thickness progressively along its length.


A spectrometer which in one embodiment including a dispersive element and a concave element. The dispersive element may be a flat or concave grating which receives light and reflects the light in different collimated wavelengths. The concave element being located downstream from the dispersive element and arranged to reflect and focus the light toward a detector. The reflected light from the concave element including astigmatism. A cylindrical lens positioned between the concave element and the detector and configured to simultaneously correct the astigmatism and demagnify the light across the detector. In one embodiment the cylindrical lens varies in thickness progressively along its length.


Trademark
Horiba Jobin Yvon Inc. | Date: 2013-01-15

Scientific apparatus and instruments for optical analysis, namely, Raman, photoluminescence and fluorescence spectrometers and spectrographs and related components thereof, namely, light source controller modules, laser diodes, and light emitting diodes used as light sources and pulsed light sources.


Trademark
Horiba Jobin Yvon Inc. | Date: 2015-09-14

Scientific equipment, namely, surface plasmon resonance sensors, and instrumentation, namely, instruments for measuring binding affinity and for measuring, identifying and analyzing biomolecular interactions; surface plasmon resonance spectrometers; chips, plates, and glass slides having multi-spot arrays for use in surface plasmon resonance analysis and component and replacement parts for surface plasmon resonance spectrometers; computer programs, computer software and firmware for use in system operation of surface plasmon resonance sensors and spectrometers.


Trademark
Horiba Jobin Yvon Inc. | Date: 2013-11-29

Scientific equipment, namely, surface plasmon resonance sensors, and instrumentation, namely, instruments for measuring binding affinity and for measuring, identifying and analyzing biomolecular interactions; surface plasmon resonance spectrometers; mass spectrometers; chips, plates, and slides for use in surface plasmon resonance analysis and component and replacement parts for surface plasmon resonance spectrometers and mass spectrometers; computer programs and computer software and firmware for use in mass spectrometers and surface plasmon resonance sensors and spectrometers.

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