Hangzhou Aerospace Electrical Technology Co.

Hangzhou, China

Hangzhou Aerospace Electrical Technology Co.

Hangzhou, China

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Gao L.,Zhejiang University | Chen W.,Zhejiang University | Chen W.,Zhejiang Sci-Tech University | Liu J.,Zhejiang University | And 2 more authors.
Zhongguo Jixie Gongcheng/China Mechanical Engineering | Year: 2010

Based on the function of electrical connectors in a satellite and the space environment which the electrical connectors confront, a failure mode of the electrical connectors in space environment was analyzed. Firstly, the stress on electrical connectors confronted in orbit was analyzed; then, the effects of the stress on the electrical properties, the sealing properties and the electromagnetic shielding properties and the resulting failure modes were also analyzed. The results show that almost every space environment factor can affect the performance of electrical connector, which leads to electrical connector failures; and that the failure modes of the electrical connectors in space environment are very complex: some of space environment factors may cause a variety of failures, and the competing failure or relevant failure can happen.


Qian P.,Zhejiang University | Qian P.,Zhejiang Sci-Tech University | Chen W.,Zhejiang Sci-Tech University | Gao L.,Zhejiang University | And 2 more authors.
Zhongguo Jixie Gongcheng/China Mechanical Engineering | Year: 2011

For problems of reliability statistical model's accuracy, aiming at verifying the generalized Eyring-Weibull model of electrical connectors under multiple stresses derived from failure mechanism, from the statistical test point of view, based on the constant accelerated life test under multiple stresses, by using the probability graph and Van-Montfort methods, the failure life distribution of electrical connectors was verified that it followed Weibull distribution; by regression analysis, the accelerated life equation of electrical connectors was validated to be generalized Eyring model. The results provide a powerful evidence for that the reliability statistical model of Y11P series electrical connectors derived from failure mechanism can preferably describe its life characteristics.


Chen W.,Zhejiang University | Chen W.,Zhejiang Sci-Tech University | Gao L.,Zhejiang University | Li X.,Zhejiang University | And 2 more authors.
Zhongguo Jixie Gongcheng/China Mechanical Engineering | Year: 2011

Taking Y11P-1419 electrical connector as the object, the variation of insulation resistance with vacuum and temperature for Y11 series of aerospace electrical connectors was researched. The influences of vacuum and temperature on the insulation resistance of aerospace electrical connectors were analyzed. Through testing and statistical analysis for the testing data, the variation of the insulation resistance with vacuum and temperature was revealed, and the test phenomena and statistical results were explained from mechanism. The research results show that the changes of vacuum and temperature exert significant influences on the insulation resistance of electrical connectors, there are interactive effects of vacuum and temperature. When the temperature remains constant, the insulation resistance of electrical connectors increases as the pressure decreases; when the pressure remains constant, the insulation resistance of electrical connectors decreases as the temperature increases.


Chen W.,Zhejiang University | Chen W.,Zhejiang Sci-Tech University | Liu J.,Zhejiang University | Gao L.,Zhejiang University | And 2 more authors.
Chinese Journal of Mechanical Engineering (English Edition) | Year: 2011

As few or no failures occur during accelerated life test, it is difficult to assess reliability for long-life products with traditional life tests. Reliability assessment using degradation data of product performance over time becomes a significant approach. Aerospace electrical connector is researched in this paper. Through the analysis of failure mechanism, the performance degradation law is obtained and the statistical model for degradation failure is set up; according to the research on statistical analysis methods for degradation data, accelerated life test theory and method for aerospace electrical connector based on performance degradation is proposed by improving time series analysis method, and the storage reliability is assessed for Y11X series of aerospace electrical connector with degradation data from accelerated degradation test. The result obtained is basically consistent with that obtained from accelerated life test based on failure data, and the two estimates of product's characteristic life only have a difference of 8.7%, but the test time shortens about a half. As a result, a systemic approach is proposed for reliability assessment of highly reliable and long-life aerospace product. © 2011 Chinese Journal of Mechanical Engineering.


Qian P.,Zhejiang University | Qian P.,Zhejiang Sci-Tech University | Chen W.,Zhejiang Sci-Tech University | Ma Z.,Zhejiang University | And 2 more authors.
Jixie Gongcheng Xuebao/Journal of Mechanical Engineering | Year: 2010

For the problem that applicability of accelerated life model cannot be quantitatively assessed, by transforming accelerated life model into a more general linear model, meanwhile, by transforming the applicability validation problem of accelerated life model into the coplanarity test problem of spatial data points from the perspective of three-dimensional space, from the point of view of statistical test, accelerated life model under multiple stresses are fitted by multiple linear regression method. Taking the statistic as the test target, which characterizes the relative size of the sum of square of vertical distance between spatial data points and fitted values, and the sum of deviation square of spatial data, the verification method of multiple stresses accelerated life model by using constant stresses accelerated life test data is proposed, which can quantitatively assess the applicability of accelerated life model. After the verification of Y11P series aerospace electrical connectors' generalized Eyring model, the confidence level of model is quantitatively obtained. The verification result shows that the generalized Eyring model can preferably describe the nature of the electrical connectors' life characteristics variation under multiple stresses of temperature and vibration. © 2010 Journal of Mechanical Engineering.


Chen W.,Zhejiang University | Chen W.,Zhejiang Sci-Tech University | Liu J.,Zhejiang University | Gao L.,Zhejiang Sci-Tech University | And 2 more authors.
Chinese Journal of Mechanical Engineering (English Edition) | Year: 2013

In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period, accelerated degradation test data with a large amount of reliability information of product is adopted. Conducting a constant-stress accelerated degradation test(CSADT) is generally very costly as it requires a large sample size and long time for test. To overcome this problem, it is necessary to carry out research on modeling and statistical analysis methods of step-stress accelerated degradation test (SSADT). Taking electrical connectors as the object, a research is conducted on statistical model and assessment method for SSADT. On the basis of mixed-effect degradation path model, the statistical model of SSADT for electrical connectors is presented, the maximum likelihood method for SSADT data based on mixed-effect degradation model is proposed. SSADT accelerated by temperature stress is conducted to Y11X-1419 type of electrical connectors, and the storage reliability is assessed with the SSADT data. Compared with the result obtained from accelerated life test, the reliability estimation of 32-year storage period for electrical connectors obtained from SSADT data only have a difference of 0.869%, which validates the accuracy of the degradation model and the feasibility of the test data statistic analysis method put forward. © Chinese Mechanical Engineering Society and Springer-Verlag Berlin Heidelberg 2013.

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