Hamamatsu, Japan
Hamamatsu, Japan

Time filter

Source Type

Toyoda H.,Hamamatsu Photonics K K | Inoue T.,Hamamatsu Photonics K K | Mukozaka N.,Hamamatsu Photonics K K | Hara T.,Hamamatsu Photonics K K | Wu M.H.,Hamamatsu Corporation
Digest of Technical Papers - SID International Symposium | Year: 2014

A high quality and high performance 2D Spatial Light Phase Modulator has been developed for wide range of basic and practical applications. We will discuss how LCOS micro-display device is developed into LCOS-SLM for various important non-display applications ranging from basic and applied researches such as singular optics and fluorescence microscopy to industrial applications in laser processing and machining. © 2014 Society for Information Display.

Ireland R.M.,Johns Hopkins University | Liu Y.,Johns Hopkins University | Spalenka J.W.,University of Wisconsin - Madison | Jaiswal S.,Hamamatsu Corporation | And 6 more authors.
Physical Review Applied | Year: 2014

A solid-state picosecond laser is used to ablate semiconductor thin films in spatially localized areas, providing an alternative to device isolation strategies based on chemical or ion etching techniques. Field-effect transistors (FETs) of emerging organic and inorganic materials often utilize a continuous semiconductor film and an array of top-contact electrodes. Electrically isolating individual FET components from other circuit elements is essential in order to reduce parasitic capacitances and unwanted current pathways, both to improve device performance and to enable the observation of new or enhanced physical phenomena. We pattern FET arrays with ultrafast-pulse-duration (1.5 ps) and low-fluence (0.09 J cm-2) optical pulses using the fundamental wavelength (1030 nm) of an Yb-YAG laser. We investigate two representative semiconductor materials. First, zinc oxide (ZnO) is deposited onto Si/SiO2 substrates by sol-gel methods and used to create n-channel FETs with aluminum top electrodes. Isolation of individual FETs enables the clear observation of photomodulation of the FET device parameters via photoinduced electron donation from an adsorbed chromophore. The second system comprises thin-film bilayers of tellurium and organic semiconductor molecules sequentially vapor-deposited onto Si/SiO2 substrates, with gold electrodes deposited last. Charge carrier mobility is maintained for devices isolated by picosecond lasers, but leakage currents through the FET dielectric are drastically reduced. © 2014 American Physical Society.

Kaufman K.,Hamamatsu Corporation
Spectroscopy (Santa Monica) | Year: 2010

Engineers have been improving the design and manufacturing of complementary metal oxide semiconductor (CMOS) image sensors. The goal of these improvements has been to increase the sensitivity so that pixel size can be decreased while still being able to capture an image at the same, or even lower, light levels. The architecture of a CMOS chip differs from the CCD in that there is an amplifier for each photodiode. This is called an active pixel sensor because the amplifier is part of the pixel. Transistor switches connect each photodiode to the intrapixel amplifier at the time of readout. The pixel amplifier, switches, and signal lines are masked. The CMOS image sensor is read out serially and also has intrinsic noise. By using an optimized buried transistor design, the amplifier noise and the switching noise are reduced. By matching the gain in each amplifier through careful control, the fixed pattern noise is reduced. Other developments in the new CMOS sensor include a well capable of storing as many as 18,000 electrons.

Iwai Y.,Hama matsu Corporation
Laser Focus World | Year: 2011

Monolithic arrays of Geiger-mode avalanche photodiodes (APD) offer researchers a new tool in applications ranging from medical imaging to high-energy physics. One type of Geiger-mode APDs are multipixel implementations, known as silicon photomultipliers (SiPMs) as they are capable of counting multi-photon events, similar to traditional photo-multipliers (PMTs). It is possible to trigger on the multiphoton events and use them for multiphoton events and use them for timing measurements in this implementation. Applications, such as positron emission tomography (PET) that require large-area imagers are driving interest in larger arrays and increasing the demand for Geiger-mode APDs.

Fu D.,Massachusetts Institute of Technology | Oh S.,Massachusetts Institute of Technology | Choi W.,Korea University | Yamauchi T.,Massachusetts Institute of Technology | And 5 more authors.
Optics Letters | Year: 2010

Traditional Normarski differential interference contrast (DIC) microscopy is a very powerful method for imaging nonstained biological samples. However, one of its major limitations is the nonquantitative nature of the imaging. To overcome this problem, we developed a quantitative DIC microscopy method based on off-axis sample selfinterference. The digital holography algorithm is applied to obtain quantitative phase gradients in orthogonal directions, which leads to a quantitative phase image through a spiral integration of the phase gradients. This method is practically simple to implement on any standard microscope without stringent requirements on polarization optics. Optical sectioning can be obtained through enlarged illumination NA. © 2010 Optical Society of America.

Bulayev Y.,Hamamatsu Corporation
IPC APEX EXPO 2012 | Year: 2012

As a result of heightened requirements for quality, integrity and reliability of electronic products, the role of wafer auditing and nondestructive testing of printed circuit boards and electronic assemblies has grown at an unprecedented rate. Nondestructive testing improves a product's performance, increases quality and reliability, and lowers return rate. It is estimated that the cost of a failure decreases by a factor of ten when the error is identified in the course of production instead of in the field. Optical and x-ray cameras have become the most efficient and reliable tools for nondestructive testing. Time delay integration (TDI) method of imaging is based on the concept of accumulation of multiple exposures of the same object. The primary advantage of this method compared to the conventional line-scan method is the possibility of detecting low exposure levels with a superior signal-to-noise ratio when high spatial resolution is required. In the semiconductor industry, TDI-based instruments are used for wafer and reticle inspections where ultraviolet (UV) and deep ultraviolet (DUV) instruments are mandated by defect detection requirements. In the electronics industry, TDI-based instruments can be efficiently used for high-speed automated optical inspection (AOI) of high-density electronic assemblies where dimensions of components populated on the PCB (printed circuit board) become smaller, and spacing between the components becomes narrower. X-ray TDI cameras are a critical part of the automated x-ray inspection (AXI) systems used for inspection of multilayer printed circuit boards and circuit card assemblies with BGA (ball grid array) and other SMT (surface-mount technology) components. High-resolution x-ray TDI cameras allow efficient inspection of the printed pattern, wire bonding, quality of soldering of BGA components, and other elements of a PCB structure and circuit assembly.

Gilmore J.,Hamamatsu Corporation | Weldon J.,Hamamatsu Corporation | Lares M.,Hamamatsu Corporation
Biophotonics International | Year: 2010

The article focuses on the key features and benefits of complementary metal oxide semiconductor (CMOS) technology used in the dental field. CBCT equipment takes slices of images, which are then reconstructed to form a three-dimensional image of a patient's entire jaw and mouth. CBCT, also known as cone beam volumetric tomography (CBVT) or cone beam volumetric imaging (CBVI), generates 3-D images of the teeth and head using x-rays and computer software. Dental specialists and surgeons use the data from CBCT for placement of dental implants, third-molar extractions, temporomandibular joint (TMJ) evaluations, orthodontic treatment planning, surgical planning and others. Miles believes that CBCT will become the standard of care for presurgical implant assessment and third-molar extraction. Besides CBCT, panoramic imaging also uses CMOS technology. Dentists use the panoramic mode to image the entire set of teeth and parts of the jaw in a single view for placement of dental implants and assessment of TMJ disorders, sinus infections and other problems.

Gilmore J.,Hamamatsu Corporation
Photonics Spectra | Year: 2011

Several measures that need to be considered when selecting detector for Raman spectroscopy are presented. Manufacturers who own a foundry tend to have better quality control over the CCD manufacturing process compared with those who outsource. The foundry enables optimizing the wafer processing conditions to reduce the dark current that is important for Raman spectroscopy. The back-thinned CCD (BT-CCD) is well suited for low light detection because their quantum efficiency (QE) reaches 90 percent at the peak wavelength. Laser treatment of the BT-CCD can further increase the QE in the red and near-IR regions. An effective technique to reduce etaloning is to create irregular patterns at the origin of reflection, preventing the light from reflecting back into the active region. A transmission mode grating with a fiber-coupled entrance slit enables designers to achieve high optical throughput and narrow optical resolution.

Hamamatsu Corporation | Date: 2012-10-08

An optical metrology inspection system comprised of a light source, one or more cameras and sensors in communication with computer software and hardware; Digital cameras; Digital cameras for industrial use; Digital video cameras; Video cameras.

Hamamatsu Corporation | Date: 2013-01-09

Computer software for organizing and viewing digital images and photographs; Computer software for processing digital images; Digital cameras; Digital cameras for industrial use; Digital video cameras; Software for processing digital images of the anatomy for diagnosis and treatment.

Loading Hamamatsu Corporation collaborators
Loading Hamamatsu Corporation collaborators