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Chen L.,CAEP - China Academy of Engineering Physics | Wan X.,CAEP - China Academy of Engineering Physics | Jin D.,CAEP - China Academy of Engineering Physics | Tan X.,CAEP - China Academy of Engineering Physics | And 2 more authors.
Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams | Year: 2015

According to the characteristics of imporant parameters and application requirments for pulsed plasma, a time of flight mass spectrometry diagnosis system for pulsed plasma has been developed using orthogonal-injection, grid reflecting and two-stage space focusing method. The mass resolution, range of detecting energy, time resolution are ~1690 FWHM, 3~150 eV and ~0.45 μs respectively. Important characters, such as ion mass spectrometry and ion energy distribution function, have been achieved by time of flight mass spectrometry researching and analyzing of typical pulsed plasma. The dominating components are Tin+ ions with different charge state, the most probable energies of Ti+ and Ti2+ ions are nearly 23 eV and 48 eV respectively. ©, 2015, Editorial Office of High Power Laser and Particle Beams. All right reserved. Source


Qing J.,Fudan University | Huang Z.,Jinan University | Zhang Y.,Guangzhou Hexin Anallytical Instrument CO. | Zhu H.,Guangzhou Hexin Anallytical Instrument CO. | And 3 more authors.
Analyst | Year: 2013

A miniaturised reflectron time-of-flight mass spectrometer combined with an electron ionisation ion source has been developed for the analysis of gases. An entirely new helium ion removal pulsing technique in this mass spectrometer is used to achieve an improved performance for the first time. The helium carrier gas, which enters into the source along with the gaseous sample, is simultaneously ionised and then orthogonally introduced into the time-of-fight mass analyser. Once the relatively light helium ions in the ion packet become extremely close to the reflectron plate (B-plate for short in this article), a modulated pulse is instantaneously applied on the B-plate and a negative reflectron voltage is set to the B-plate and lasts for a very short period, during which all the helium ions are directly bumped into the B-plate and subsequently removed. The helium ion removal pulsing technique can efficiently avoid saturation of the micro-channel plate caused by too many helium ions. A compact and durable instrument is designed, which has a mass resolving resolution greater than 400 FWHM for online gas analysis. The technology may also be further developed to remove other ions for TOF mass spectrometry. © 2013 The Royal Society of Chemistry. Source

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