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Masunaga H.,Japan Synchrotron Radiation Research Institute | Ogawa H.,Japan Synchrotron Radiation Research Institute | Takano T.,Japan Synchrotron Radiation Research Institute | Sasaki S.,Japan Synchrotron Radiation Research Institute | And 34 more authors.
Polymer Journal | Year: 2011

Scientific and engineering research on soft materials requires precise structural analysis to understand their hierarchical and fluctuating nature. A new beamline, the BL03XU frontier soft-material beamline, that is dedicated to scattering experiments on soft materials was recently installed at the third-generation synchrotron facility, SPring-8, in Japan. The BL03XU uses an in-vacuum undulator, and the photon flux of the obtained X-ray can reach 10 13 photons sec-1, with an energy resolution of ΔE/E ≈ 2 × 10-4 at 12.4 keV. The BL03XU has two experimental hutches: a front one that is used for grazing-incidence scattering experiments and a second one for transmitting scattering experiments, which enables simultaneous small- and wide-angle X-ray scattering. The present paper introduces details about the instrument and some of the first scattering data measured at BL03XU, which reveals its cutting-edge design and high level of performance. © The Society of Polymer Science, Japan (SPSJ) All rights reserved. Source


Ogawa H.,Japan Synchrotron Radiation Research Institute | Masunaga H.,Japan Synchrotron Radiation Research Institute | Sasaki S.,Japan Synchrotron Radiation Research Institute | Goto S.,Japan Synchrotron Radiation Research Institute | And 30 more authors.
Polymer Journal | Year: 2013

To gain a better understanding of the function of soft-material thin films, one should investigate the multiscale structural information from the surface roughness down to the atomically truncated structures at microarea. To achieve such an integrated investigation, a new experimental system has been launched by coupling with the measurement techniques, which include grazing incidence small/wide-angle X-ray scattering (GISWAXS) and grazing incidence X-ray diffraction (GIXD), as well as X-ray reflectivity (XR), at the BL03XU beamline of SPring-8. The high brilliance and low divergence beam allows the surface and interface structure measurements from the angstrom to the micrometer scale using a soller-slit system for proper optimization of measurement precision. A typical structural analysis of the soft-material film was performed to evaluate the practical performance and specifications of the experimental system. © 2013 The Society of Polymer Science, Japan (SPSJ) All rights reserved. Source

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