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Chanteloup-en-Brie, France

Makdessi M.,University Claude Bernard Lyon 1 | Sari A.,University Claude Bernard Lyon 1 | Aubard G.,Exxelia Technologies | Venet P.,University Claude Bernard Lyon 1 | And 2 more authors.
IEEE International Symposium on Industrial Electronics | Year: 2015

Metallized polymer film capacitors, assuming a special position among the various types of capacitors thanks to their capabilities to self-heal, became the components of choice for critical power electronics applications requiring optimized performances such as, avionics, automotive and railways equipment's. However, as a result of the increasingly growing demand for guaranteeing safety and enhancing reliability, a greater interest has been devoted to the health monitoring of power electronics devices. In this paper, an online health monitoring approach for metallized film capacitors is proposed based on the estimation of their precursor parameters. The proposed technique makes use of the already existing current, voltage and temperature sensors for the power drive command/control purposes, and do not need the injection of additional external signals. To demonstrate and validate the effectiveness of such technique, the resulting algorithm was simulated on a set of capacitors at different degradations rates with Matlab/Simulink software. In this paper is also presented a novel 'PEN type' polymer. This high-temperature polymer has great advances over the standard polymers films providing excellent self-healing capability with an enhanced energy density, making it one of the most compact film capacitors on the market. © 2015 IEEE. Source


Makdessi M.,University Claude Bernard Lyon 1 | Sari A.,University Claude Bernard Lyon 1 | Venet P.,University Claude Bernard Lyon 1 | Aubard G.,Exxelia Technologies | And 4 more authors.
Microelectronics Reliability | Year: 2015

Under steady voltage and temperature stresses, capacitance can be considered as a reliable aging indicator since in such conditions, metallized polymer film capacitors suffer from the gradual loss of their electrode surface. Empirical laws are most often considered to predict the operating lifetime of energy storage systems under specific environmental conditions. However, expected lifetimes in this case are not able to track the capacitors degradation with time. In this paper, a special capacitance degradation model is proposed based on several experimental aging tests at different temperatures and voltage stresses. A total of 30 capacitors using a novel high-voltage high-temperature (HVHT) polymer as dielectric have been studied and compared to validate the proposed law. This novel HVHT polymer offers significant improvements upon the standard dielectric materials, providing excellent self-healing capability with an enhanced energy density. © 2015 Elsevier Ltd. Source

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