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Utsunomiya-shi, Japan

Patent
ESPEC Corporation | Date: 2013-03-06

A hygrometer includes a heat transfer section extending from a measurement space toward an outside space separated from the measurement space, a heat release amount control unit that causes heat to be released to the outside space from the heat transfer section such that an amount of heat released to the outside space is made constant, and a computation device that calculates a humidity of the measurement space. The computation device calculates the humidity from a heat transfer section temperature and a measurement space temperature using a relational expression based on a heat balance in the heat transfer section when condensation is occurring in a portion, of the heat transfer section, located within the measurement space in a state where the amount of heat released to the outside space from the heat transfer section is made constant by the heat release amount control unit.


A method for drying an electrode pair is disclosed. In at least one embodiment, the method includes preparing a positive electrode by applying a positive electrode material to a current collector; preparing a negative electrode by applying a negative electrode material to a current collector; preparing one set of an electrode pair made up of a positive electrode, a separator, and a negative electrode which are laminated in this order or preparing sets of electrode pairs, the sets being laminated, a separator being provided between the respective sets, each of the electrode pairs being made up of a positive electrode, a separator, and a negative electrode which are laminated in this order; accommodating the electrode pair(s) in a container; and drying the container in which the electrode pair(s) has been accommodated by use of the freeze-drying method.


Patent
ESPEC Corporation | Date: 2014-03-31

An apparatus for environmental tests includes a chamber having formed therein a test space for disposing a sample, and a tray that is provided on the upper surface of the chamber and has an open upper surface. A front wall of the tray is configured by an operation unit where switches are provided. A rear wall of the tray is configured by a control unit housing a control substrate. A left wall and a right wall of the tray are configured by hollow bodies connecting the operation unit and the control unit. The tray is covered with a lid.


Patent
ESPEC Corporation | Date: 2014-09-02

A hygrometer and dew-point instrument is provided that is structurally simple while reducing the workload during maintenance. The hygrometer measures relative humidity of a measurement space, and has a main body that encapsulates a working fluid therein and causes a heat-pipe phenomenon. The main body is disposed across the measurement space and an external space spaced from the measurement space by a heat-insulating part and has a temperature lower than the measurement space. A first temperature deriving part derives the temperature of the main body in a section where the working fluid evaporates. A space temperature detecting unit detects the temperature of the measurement space. A computation unit calculate relative humidity of the measurement space based on the temperature of the main body derived by the first temperature deriving part and the temperature of the measurement space detected by the space temperature detecting unit.


Patent
ESPEC Corporation | Date: 2013-07-17

Provided is a power cycle test apparatus that eliminates the need to measure a thermal resistance in a power cycle test and that pursues power saving in the evaluation of IGBT reliability by exactly applying a required thermal stress through the automatic adjustment of a stress current. The power cycle test apparatus performs a power cycle test for an IGBT to be tested by applying a thermal stress to the IGBT to be tested through the intermittent application of a stress current thereto. The apparatus applies the stress current to the IGBT to be tested and thereafter applies a current for measurement to the IGBT to be tested to measure a collector-emitter voltage of the IGBT to be tested. The apparatus further obtains a junction temperature of the IGBT to be tested from the measured collector-emitter voltage and a temperature coefficient of the IGBT to be tested.

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