Ernst Ruska Center C for Microscopy and Spectroscopy with Electrons

Germany

Ernst Ruska Center C for Microscopy and Spectroscopy with Electrons

Germany

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Koehl A.,Jülich Research Center | Wasmund H.,Jülich Research Center | Herpers A.,Jülich Research Center | Guttmann P.,Helmholtz Center Berlin | And 7 more authors.
APL Materials | Year: 2013

Transmission X-ray microscopy is employed to detect nanoscale valence changes in resistive switching SrTiO3 thin film devices. By recording Ti L-edge spectra of samples in different resistive states, we could show that some spots with slightly distorted structure and a small reduction to Ti 3+ are already present in the virgin films. In the ON-state, these spots are further reduced to Ti3+ to different degrees while the remaining film persists in the Ti4+ configuration. These observations are consistent with a self-accelerating reduction within pre-reduced extended growth defects. © 2013 Author(s).


Muenstermann R.,Institute for Electronic Materials | Menke T.,Institute for Electronic Materials | Dittmann R.,Institute for Electronic Materials | Mi S.,Ernst Ruska Center C for Microscopy and Spectroscopy with Electrons | And 3 more authors.
Journal of Applied Physics | Year: 2010

We deliberately fabricated SrTiO3 thin films deviating from ideal stoichiometry and from two-dimensional layer-by-layer growth mode, in order to study the impact of well pronounced defect arrangements on the nanoscale electrical properties. By combining transmission electron microscopy with conductive-tip atomic force microscopy we succeeded to elucidate the microstructure of thin films grown by pulsed laser deposition under kinetically limited growth conditions and to correlate it with the local electrical properties. SrTiO3 thin films, grown in a layer-by-layer growth mode, exhibit a defect structure and conductivity pattern close to single crystals, containing irregularly distributed, resistive switching spots. In contrast to this, Ti-rich films exhibit short-range-ordered, well-conducting resistive switching units. For Ti-rich films grown in a kinetically more restricted island growth mode, we succeeded to identify defective island boundaries with the location of tip-induced resistive switching. The observed nanoscale switching behavior is consistent with a voltage driven oxygen vacancy movement that induces a local redox-based metal-to-insulator transition. Switching occurs preferentially in defect-rich regions, that exhibit a high concentration of oxygen vacancies and might act as easy-diffusion-channels. © 2010 American Institute of Physics.

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