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Casablanca, Morocco

Amar S.,Equipe Ingenierie et Energie | Bahich M.,Equipe Ingenierie et Energie | Dalimi H.,Equipe Ingenierie et Energie | Barj E.,Equipe Ingenierie et Energie | Afifi M.,Equipe Ingenierie et Energie
Optical Engineering

Industrial production constraints often require technical tests and controls. Optical metrology methods allow a non destructive test of wide range of parameters, such as defects and displacements, with very good accuracy. The phase retrieval is an effective way that allows three-dimensional profile reconstruction from intensity shearograms. This research work focuses on the extraction of the phase from one uncarrier shearogram using the Hilbert-Huang transform. An algorithm for the phase calculation based on the bidimensional empirical mode decomposition, Hilbert transform (HT), and Fourier transform (FT) is presented. A spatial digital carrier has been superimposed before the application of the FT or HT which uses two π/2 shifted shearograms, to get access to the phase map via a global analysis of intensity images. An evaluation was made through a numerical simulation to validate and confirm the performance of the proposed algorithm. The main advantage of this technique is its ability to provide a metrological solution for fast dynamic analysis. © 2015 Society of Photo-Optical Instrumentation Engineers. Source

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